Jan Dieleman
Philips
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MRS Proceedings | 1988
Jan Dieleman
Recent results of studies on the mechanism of processes induced by the interaction of beams of (reactive) particles with surfaces in UHV, often combined with concurrent bombardment of the surface with low-energy ion or excimer laser beams, are reviewed. Angular-resolved mass spectrometry combined with time-of-flight studies on the desorbing products is used as a key diagnostic. A more complete picture is obtained using several other diagnostic tools to characterize the surface before, during or after the interaction. Interactions at Si and Cu surfaces will be emphasized. The review will deal successively with data for interaction with a single beam of Cl 2 , low-energy noble gas ions or excimer laser pulses, followed by data on the concurrent interaction of crossed beams of Cl 2 and low-energy noble gas ions or excimer laser pulses with these surfaces. Some conclusions will be drawn.
Archive | 1983
Jan Dieleman; Franciscus Hubertus Marie Sanders
Archive | 1978
Jan Dieleman; Arthur Marie Eugene Hoeberechts
Archive | 1974
Jan Dieleman; Arthur Marie Eugene Hoeberechts
Archive | 1982
Jan Dieleman; Joannes H. J. Van Dommelen; Petrus J. A. M. Derks
Archive | 1979
Petrus J. A. M. Derks; Joannes H. J. Van Dommelen; Jan Dieleman
MRS Proceedings | 1991
Jacques Constant Stefan Kools; Jan Dieleman
Archive | 1983
Jan Dieleman; Franciscus Hubertus Marie Sanders
Archive | 1983
Jan Dieleman; Franciscus Hubertus Marie Sanders
Archive | 1982
Petrus J. A. M. Derks; Joannes H. J. Van Dommelen; Jan Dieleman