Janet M. Cassard
National Institute of Standards and Technology
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Publication
Featured researches published by Janet M. Cassard.
international conference on microelectronic test structures | 2012
Janet M. Cassard; Jon C. Geist; Michael Gaitan; David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with National Institute of Standards and Technology (NIST) measurements, thereby validating their use of the documentary standard test methods. Examples of NIST reference values are given for an RM 8096 monitor chip used at NIST for stability studies.
NIST Interagency/Internal Report (NISTIR) - | 1994
Janet M. Cassard; Michael Gaitan; Mona E. Zaghloul; Donald B. Novotny; V. C. Tyree; J. I. Pi; C. Pina; W. Hansford
NIST Interagency/Internal Report (NISTIR) - | 1992
Janet M. Cassard; M. Parameswaran; Mona E. Zaghloul; Michael Gaitan
ECS Transactions | 2014
Janet M. Cassard; Jon C. Geist; John Kramar
225th ECS Meeting (May 11-15, 2014) | 2014
Janet M. Cassard; Jon C. Geist; John Kramar
Special Publication (NIST SP) - 260-177 | 2013
Janet M. Cassard; Jon C. Geist; Theodore V. Vorburger; David T. Read; Michael Gaitan; David G. Seiler
Archive | 2013
Janet M. Cassard; Jon C. Geist; Theodore V. Vorburger; David T. Read; Michael Gaitan; David G. Seiler
2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics | 2013
Janet M. Cassard; Jon C. Geist; Craig D. McGray; Richard A. Allen; Muhammad Y. Afridi; Brian J. Nablo; Michael Gaitan; David G. Seiler
Special Publication (NIST SP) - 260-179 | 2011
Janet M. Cassard; Jon C. Geist; Theodore V. Vorburger; David T. Read; David G. Seiler
MST News | 2008
Janet M. Cassard; Jon C. Geist; Michael Gaitan
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