Javad R. Gatabi

Integration of BiFeO3/La0.7Sr0.3MnO3 heterostructures with III–V semiconductors for low-power non-volatile memory and multiferroic field effect transistors

We report on the use of SrTiO3 films on GaAs(001) substrates grown by molecular beam epitaxy (MBE) as intermediate buffer layers for the heteroepitaxial growth of ferromagnetic La0.7Sr0.3MnO3 (LSMO) and room temperature multiferroic (ferroelectric/antiferromagnetic) BiFeO3 (BFO) thin films using the pulsed laser deposition technique. The exchange bias coupling effect in the BFO/LSMO heterostructure has been investigated. The magnetization measurements with field cooling exhibit a surprising increment in the magnetic moment with enhanced magnetic hysteresis squareness. This we believe is the consequence of exchange interactions between the antiferromagnetic BFO and the ferromagnetic LSMO at the interface. The integration of BFO materials with LSMO on GaAs substrates facilitated the demonstration of resistive switching based non-volatile memory (NVM) devices which can be faster with lower energy consumption compared to present commercial technologies. Ferroelectric switching observations using piezoresponse force microscopy show polarization switching demonstrating its potential for read–write operation in NVM devices. The ferroelectric and electrical characterization exhibits strong resistive switching with low set/reset voltages. Furthermore, we demonstrate a prototypical epitaxial field effect transistor based on multiferroic BFO as the gate dielectric and ferromagnetic LSMO as the conducting channel. The device exhibits a modulation in channel conductance with a high ON/OFF ratio. This work also demonstrates the first step towards the development of magneto-electronic devices integrated with a compound semiconductor.

The Effect of Amplitude Modulation on the Axial Resolution of Doppler-Based Ultrasonic Topography Measurement

Ultrasonic Doppler-based systems for surface topography measurements are attractive alternatives to the transit-time-based methods. Sensors used in Doppler systems are less dependent on the speed of the sound in air, although contemporary Doppler measurement systems are sensitive to the amplitude variation of the received signal. Amplitude variation significantly affects the measurement accuracy when the surface axial displacement range is comparable with the ultrasonic wavelength. This paper presents a theoretical and experimental study of the effect of amplitude modulation on the performance of the Doppler measurement techniques. A modified Doppler measurement system that significantly improves the measurement accuracy is also presented. The fabricated sensor has 72-μm measurement accuracy using 40-kHz transducers. This technique can also be employed in cost-effective displacement measurement applications that require high axial resolution.

Heteroepitaxial growth and characterization of BiFeO3 thin films on GaAs

The paper deals with the integration of well-known bismuth ferrite (BiFeO3) multiferroic oxide with GaAs semiconductor. First 5 nm ultrathin SrTiO3 films were grown on GaAs (001) substrates as an intermediate buffer layer by molecular beam epitaxy. Then, room temperature multiferroic BiFeO3 (BFO) thin films were deposited by pulsed laser deposition. X-ray diffraction measurement showed high quality epitaxial BFO films with pure (00l) orientation. The dielectric loss has been effectively suppressed and the saturated polarization–voltage (P–V) hysteresis loops were obtained. The ferroelectric domains switching was affirmed by piezo-response force microscopic studies. A large remnant polarization P r (~80 μC cm−2) combined with the enhanced magnetization (72 emu cm–3) at 300 K was achieved for the optimal growth conditions. The optical properties were measured using the ellipsometry technique for the BFO thin films. The thickness and optical constants of the BFO films were obtained by taking into consideration the dielectric parameters as described by the Tauc-Lorentz model. Finally, direct bandgap was estimated at 2.70 eV which is highly comparable to BFO films grown on different substrates.