Jay Ghatak

Ultrahigh Average Thermoelectric Figure of Merit, Low Lattice Thermal Conductivity and Enhanced Microhardness in Nanostructured (GeTe)x(AgSbSe2)100-x

Waste heat sources are generally diffused and provide a range of temperatures rather than a particular temperature. Thus, thermoelectric waste heat to electricity conversion requires a high average thermoelectric figure of merit (ZTavg ) of materials over the entire working temperature along with a high peak thermoelectric figure of merit (ZTmax ). Herein an ultrahigh ZTavg of 1.4 for (GeTe)80 (AgSbSe2 )20 [TAGSSe-80, T=tellurium, A=antimony, G=germanium, S=silver, Se=selenium] is reported in the temperature range of 300-700 K, which is one of the highest values measured amongst the state-of-the-art Pb-free polycrystalline thermoelectric materials. Moreover, TAGSSe-80 exhibits a high ZTmax of 1.9 at 660 K, which is reversible and reproducible with respect to several heating-cooling cycles. The high thermoelectric performance of TAGSSe-x is attributed to extremely low lattice thermal conductivity (κlat ), which mainly arises due to extensive phonon scattering by hierarchical nano/meso-structures in the TAGSSe-x matrix. Addition of AgSbSe2 in GeTe results in κlat of ≈0.4 W mK-1 in the 300-700 K range, approaching to the theoretical minimum limit of lattice thermal conductivity (κmin ) of GeTe. Additionally, (GeTe)80 (AgSbSe2 )20 exhibits a higher Vickers microhardness (mechanical stability) value of ≈209 kgf mm-2 compared to the other state-of-the-art metal chalcogenides, making it an important material for thermoelectrics.

Electron mobility of self-assembled and dislocation free InN nanorods grown on GaN nano wall network template

A kinetically controlled two-step growth process for the formation of an array of dislocation free high mobility InN nanorods (NRs) on GaN nanowall network (NWN) by Molecular Beam Epitaxy is demonstrated here. The epitaxial GaN NWN is formed on c-sapphire under nitrogen rich conditions, and then changing the source from Ga to In at appropriate substrate temperature yields the nucleation of a self assembled spontaneous m-plane side faceted-InN NR. By HRTEM, the NRs are shown to be dislocation-free and have a low band gap value of 0.65 eV. Hall measurements are carried out on a single InN NR along with J-V measurements that yield mobility values as high as ≈4453 cm2/V s and the carrier concentration of ≈1.1 × 1017 cm−3, which are unprecedented in the literature for comparable InN NR diameters.

Role of AlN intermediate layer in the morphological evolution of GaN nanorods grown on c-plane sapphire

The difference in the evolution of dislocation mediated low-dimensional GaN nanostructures on differently pre-nitrided c-plane sapphire surfaces is demonstrated. We show that GaN growth on c-plane sapphire, after forming an AlN layer by exposure to N*2 plasma, leads to the formation of nano-petal-like morphologies of the GaN nanostructures. When an AlN intermediate layer is grown on the nitrided surface, under nitrogen rich conditions, AlN grows with a bimodal distribution of nanocolumns. We observe that GaN grown on this AlN intermediate layer prefers to grow only on single crystalline AlN nanocolumns with sizes in the range 80–120 nm. We observe that these nano-features are epitaxial with high crystallinity and demonstrate a thirty times increase in band edge emission compared to GaN film grown on bare sapphire. The threading screw dislocation is seen to propagate through both the AlN layer and GaN nanorods with their morphologies depending on the proximity of the dislocations. Our results show that the shape, structure and mosaicity of GaN nano-features are dependent on the morphology of the AlN intermediate layer.

Native defect-assisted enhanced response to CH4 near room temperature by Al0.07Ga0.93N nanowires

Gas sensors at low operating temperature with high sensitivity require group III nitrides owing to their high chemical and thermal stabilities. For the first time, Al0.07Ga0.93N nanowires (NWs) have been utilized in CH4 sensing, and it has been demonstrated that they exhibit an improved response compared to GaN NWs at the low operating temperature of 50 °C. Al0.07Ga0.93N NWs have been synthesized via the ion beam mixing process using inert gas ion irradiation on the bilayer of Al/GaN NWs. The sensing mechanism is explained with the help of native defects present in the system. The number of shallow acceptors created by Ga vacancies (VGa) is found to be higher in Al0.07Ga0.93N NWs than in as-grown GaN NWs. The role of the O antisite defect (ON) for the formation of shallow VGa is inferred from photoluminescence spectroscopic analysis. These native defects strongly influence the gas sensing behaviour, which results in enhanced and low-temperature CH4 sensing.

CdSe–CdTe Heterojunction Nanorods: Role of CdTe Segment in Modulating the Charge Transfer Processes

Heterojunction nanorods having dissimilar semiconductors possess charge transfer (CT) properties and are proposed as active elements in optoelectronic systems. Herein, we describe the synthetic methodologies for controlling the charge carrier recombination dynamics in CdSe–CdTe heterojunction nanorods through the precise growth of CdTe segment from one of the tips of CdSe nanorods. The location of heterojunction was established through a point-by-point collection of the energy-dispersive X-ray spectra using scanning transmission electron microscopy. The possibilities of the growth of CdTe from both the tips of CdSe nanorods and the overcoating of CdTe over CdSe segment were also ruled out. The CT emission in the heterojunction nanorods originates through an interfacial excitonic recombination and was further tuned to the near-infrared region by varying the two parameters: the aspect ratio of CdSe and the length of CdTe segment. These aspects are evidenced from the emission lifetime and the femtosecond transient absorption studies.