Jean-Yves Duboz
Centre national de la recherche scientifique
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Archive | 1992
Jean-Yves Duboz; Philippe Bois; Emmanuel Rosencher
The potential energy profile in semiconductor heterostructures can now be controlled in a fascinating way that could barely be dreamed of twenty years ago 1. When dealing with interband optical transitions, additional features related to electron-hole interactions (see for instance exciton descriptions in this book) are coming into play and the one-electron wavefunctions and energy levels may fail to describe or predict experimental results. Moreover, the quantization energy is usually small compared to the forbidden band gap, so that typical interband transitions always occur in the same energy range for a given materials pair. On the contrary, intersubband transitions (ISBT) are very sensitive to the exact potential profile and transitions have been observed at wavelengths between lμm and 100μm. In addition, they can be quantitatively described by a simple formalism based on one-electron approaches and many-body effects usually appear as small corrections only. Since 19852, many devices have been designed according to this quantum engineering and have shown unsurpassed properties3. Various materials have been successfully used for these quantum well (QW) heterostructures: GaAs/AlGaAs, InP/InGaAs/InAlAs, Si/SiGe, D/VI compounds…We will focus here on the GaAs/AlGaAs system which has been the most widely studied. First, the calculation of the ISBT matrix element will evidence two major characteristic properties: the optical transitions take advantage of giant dipoles but must verify in the same time a rather drastic selection rule. Then, examples will be given in different fields of application: detection, modulation and emission. Some interesting aspects of coupling and propagation in these structures involve a photon mode density alteration. Finally, a detailed study of second order non linearities will exemplify the beauty of quantum engineering for improving optical properties.
Applied Physics Letters | 1996
F. Binet; Jean-Yves Duboz; E. Rosencher; F. Scholz; Volker Härle
Steady‐state and transient responses of a nonintentionally doped GaN photodetector are investigated. The kinetics of the photoresponse demonstrate the existence of deep levels in the gap, acting as recombination centers with an acceptor character. The photoresponse displays two competing processes: a bimolecular recombination, dominating at high optical power range, and a monomolecular recombination involving long response times. The observed persistent photoconductivity and the huge photoconductive gain are due to the small electron capture cross section and a much faster hole capture rate.
Physica E-low-dimensional Systems & Nanostructures | 2003
H. C. Liu; Jean-Yves Duboz; R. Dudek; Z. R. Wasilewski; S. Fafard; Paul Finnie
Abstract We discuss key issues related to quantum dot infrared photodetectors. These are the normal incidence response, the dark current, and the responsivity and detectivity. It is argued that the present devices have not fully demonstrated the potential advantages. The dominant infrared response in devices so far is polarized in the growth direction. The observed dark currents are several orders of magnitude higher than those for quantum well photodetectors; while ideally they should be lower. The areas that need improvements are pointed out.
Journal of Applied Physics | 1997
F. Binet; Jean-Yves Duboz; N. Laurent; E. Rosencher; O. Briot; Roger Aulombard
In this article, we report on the characterization of a photovoltaic detector based on an n-type GaN Schottky barrier. We first present the photovoltaic responsivity above the gap. Its spectrum is explained by the combined effects of absorption and diffusion. The hole diffusion length is estimated to be in the 0.1 μm range with a numerical model. The photoresponse below the gap is also investigated and it is shown that the current generated by the internal photoemission is the major contribution to the photocurrent at reverse biases at 80 K. At room temperature, an additional component to the photocurrent is clearly demonstrated and identified. This extra current stems from the existence of traps. Several spectroscopy techniques are used to characterize those traps. The supplementary current emitted from the traps in the depletion region accounts for the spectral and the temporal behavior of the Schottky photodetector at room temperature.
Journal of Applied Physics | 2003
Jean-Yves Duboz; H. C. Liu; Z. R. Wasilewski; M. Byloss; R. Dudek
Infrared photodetectors have been fabricated based on InAs/GaAs self-assembled quantum dot (QD) layers, with various QD densities and doping levels. Dark currents have been measured as a function of applied bias and temperature. They show a clear activation energy, which decreases as the QD shell filling increases. Its absolute value and dependence on applied bias indicate that electrons tunnel from QD levels into the wetting layer of the next period. Resonant structures in the current–voltage curve and in its first derivative confirm the tunneling through the GaAs barrier. Negative differential resistances are observed in highly doped samples at low temperature.
Applied Physics Letters | 2002
Jean-Yves Duboz; J. A. Gupta; M. Byloss; G. C. Aers; H. C. Liu; Z. R. Wasilewski
Intersubband transitions are observed in InGaNAs/GaAs quantum wells at wavelengths around 10 μm. The transition energies are correlated with interband transition energies measured in the near infrared. Clear selection rules are observed: the transition is TM polarized. The amplitude of the absorption is consistent with an increase of the electron effective mass as the N content increases.
Journal of Applied Physics | 2002
Jean-Yves Duboz; Jean-Luc Reverchon; D. Adam; B. Damilano; N. Grandjean; F. Semond; J. Massies
Solar blind metal–semiconductor–metal detectors have been fabricated based on AlGaN grown on Si by molecular-beam epitaxy. Submicron finger spacings were obtained by electron-beam lithography, and allowed us to demonstrate a significant improvement of the responsivity and the spectral selectivity. These results were explained by numerical two-dimensional calculations of the electric-field distribution. The simulation also explained the dependence of the response on applied bias.
Materials Science and Engineering B-advanced Functional Solid-state Materials | 1997
Jean-Yves Duboz; F Binet; D Dolfi; N Laurent; F. Scholz; J. Off; A. Sohmer; O. Briot; B. Gil
When additional carriers are introduced in a material with a non uniform concentration, they tend to diffuse on a scale given by their diffusion length. This parameter can be measured by different methods. Depending on the conditions, different values can be found as the recombination mechanisms differ. In this paper, we present the situation in GaN with various experiments including the photocarrier grating method, photoluminescence and the spectral response in photoconductors. We show that the diffusion length varies from 0.1 μm to a few μm depending on experimental conditions. The interpretation is given based on the diffusion equations and on the analysis of the recombinations.
Applied Physics Letters | 2012
Diane Sam-Giao; Delphine Néel; Sylvain Sergent; B. Gayral; M.J. Rashid; F. Semond; Jean-Yves Duboz; Meletios Mexis; Thierry Guillet; Christelle Brimont; Sylvain David; X. Checoury; Philippe Boucaud
We present a spectroscopic study of nanocavities obtained by small modifications of a W1 waveguide in an AlN photonic crystal membrane. The AlN film containing GaN quantum dots is grown on silicon. The photonic crystal structure is defined by e-beam lithography and etched by inductively coupled plasma reactive ion etching, while the membrane is released by selective etching of the silicon substrate. The room temperature photoluminescence of the embedded quantum dots reveals the existence of even-symmetry and odd-symmetry confined cavity modes and guided modes. Cavity mode quality factors up to 4400 at 395 nm and 2300 at 358 nm are obtained.
Applied Physics Letters | 1998
F. Binet; Jean-Yves Duboz; N. Laurent; C. Bonnat; P. Collot; F. Hanauer; O. Briot; Roger Aulombard
We report on the realization of etched mirror facets in GaN cavities by chemically assisted ion-beam etching. The etching conditions are adjusted to obtain a high degree of verticality and smoothness. Optical pumping experiments and gain measurements are performed in etched GaN cavities of various geometries. Stimulated emission and lasing are observed. The study of the value of the gain at threshold as a function of the cavity length allows a determination of the reflection coefficient of the etched mirror. The measured value of 15% is in good agreement with the one expected for a perfect air–GaN interface. This demonstrates the high quality of the etched mirror facets.