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Jeffrey Clayhold

Miami University

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Publication

Featured researches published by Jeffrey Clayhold.

Review of Scientific Instruments | 2008

Combinatorial measurements of Hall effect and resistivity in oxide films.

Jeffrey Clayhold; B. M. Kerns; M. D. Schroer; D. W. Rench; G. Logvenov; A. T. Bollinger; Ivan Bozovic

A system for the simultaneous measurement of the Hall effect in 31 different locations as well as the measurement of the resistivity in 30 different locations on a single oxide thin film grown with a composition gradient is described. Considerations for designing and operating a high-throughput system for characterizing highly conductive oxides with Hall coefficients as small as 10(-10) m3/C are discussed. Results from measurements on films grown using combinatorial molecular beam epitaxy show the usefulness of characterizing combinatorial libraries via both the resistivity and the Hall effect.

Journal of Superconductivity and Novel Magnetism | 2009

Statistical Characterization and Process Control for Improved Growth of La2−xSrxCuO4 Films

Jeffrey Clayhold; Oshri Pelleg; A. T. Bollinger; G. Logvenov; B. M. Kerns; M. D. Schroer; D. W. Rench; Ivan Bozovic

Journal of Superconductivity and Novel Magnetism | 2010

Constraints on Models of Electrical Transport in Optimally Doped La2−xSrxCuO4 from Measurements of Radiation-Induced Defect Resistance

Jeffrey Clayhold; Oshri Pelleg; David C. Ingram; A. T. Bollinger; G. Logvenov; David Rench; Bryan Kerns; M. D. Schroer; R. J. Sundling; Ivan Bozovic

Bulletin of the American Physical Society | 2010

Constraints on Models of Electrical Transport in Optimally Doped La

Jeffrey Clayhold; Oshri Pelleg; David C. Ingram; A. T. Bollinger; G. Logvenov; David Rench; Bryan Kerns; Michael Schroer; Robert Sundling; Ivan Bozovic

Archive | 2009

_{\rm 2-x}

Jeffrey Clayhold; Oshri Pelleg; A. T. Bollinger; G. Logvenov; Ivan Bozovic

Journal of Superconductivity and Novel Magnetism | 2009

Sr

Jeffrey Clayhold; Oshri Pelleg; A. T. Bollinger; G. Logvenov; Bryan Kerns; M. D. Schroer; David Rench; Ivan Bozovic

Bulletin of the American Physical Society | 2009

_{\rm x}

Jeffrey Clayhold; Oshri Pelleg; A. T. Bollinger; G. Logvenov; Ivan Bozovic

Archive | 2008

CuO

Jeffrey Clayhold; Bryan Kerns; M. D. Schroer; David Rench; G. Logvenov; A. T. Bollinger; Ivan Bozovic

Bulletin of the American Physical Society | 2008

_{\rm 4}

Jeffrey Clayhold; Oshri Pelleg; A. T. Bollinger; G. Logvenov; Ivan Bozovic

Bulletin of the American Physical Society | 2008

from Precise Measurements of Radiation-Induced Defect Resistance

Jeffrey Clayhold; Bryan Kerns; Michael Schroer; David Rench; G. Logvenov; A. T. Bollinger; Ivan Bozovic

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Collaboration

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A. T. Bollinger

Brookhaven National Laboratory

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G. Logvenov

Max Planck Society

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Ivan Bozovic

Brookhaven National Laboratory

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Oshri Pelleg

Brookhaven National Laboratory

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Bryan Kerns

Miami University

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David Rench

Miami University

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M. D. Schroer

Miami University

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Michael Schroer

Princeton University

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B. M. Kerns

Miami University

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D. W. Rench

Miami University

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