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Dive into the research topics where Jeffrey Horlick is active.

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Featured researches published by Jeffrey Horlick.


ACM Standardview | 1997

Metrology for information technology

Lisa J. Carnahan; Gary Carver; M M. Gray; Michael D. Hogan; Theodore Hopp; Jeffrey Horlick; Gordon Lyon; Elena R. Messina

Abstract : In May 1996, NIST management requested a white paper on metrology for information technology (IT). A task group was formed to develop this white paper with representatives from the Manufacturing Engineering Laboratory (MEL), the Information Technology Laboratory (ITL), and Technology Services (TS). The task group members had a wide spectrum of experiences and perspectives on testing and measuring physical and IT quantities. The task group believed that its collective experience and knowledge were probably sufficient to investigate the underlying question of the nature of IT metrology. During the course of its work, the task group did not find any previous work addressing the overall subject of metrology for IT. The task group found it to be both exciting and challenging to possibly be first in what should be a continuing area of study. After some spirited deliberations, the task group was able to reach consensus on its white paper. Also, as a result of its deliberations, the task group decided that this white paper should suggest possible answers rather than assert definitive conclusions. In this spirit, the white paper suggests: a scope and a conceptual basis for IT metrology; a taxonomy for IT methods of testing; status of IT testing and measurement; opportunities to advance IT metrology; overall roles for NIST; and recapitulates the importance of IT metrology to the U.S. The task group is very appreciative of having had the opportunity to produce this white paper. The task group hopes that this white paper will provide food for thought for our intended audience: NIST management and technical staff and our colleagues elsewhere who are involved in various aspects of testing and measuring IT.


Journal of Building Physics | 1985

NVLAP and the Thermal Insulation Proficiency Testing Program

Jeffrey Horlick; Harvey W Berger

This paper describes the National Voluntary Laboratory Accreditation Pro gram (NVLAP), administered by the National Bureau of Standards, and sum marizes the proficiency testing program for the Thermal Insulation Materials Laboratory Accreditation Program (Insulation LAP). NVLAP and its procedures for assessing, evaluating, and accrediting laboratories are presented briefly. The scope of the Insulation LAP is described. The results of the proficiency testing program over a four year period of testing are given. Eight tables show the sta tistical results of data submitted by participating laboratories for thermal trans mission properties, thermal conductance, surface flammability, settled density, critical radiant flux, and smoldering combustion.


international symposium on microarchitecture | 1985

Mathematical Software in Basic Dint: Data Integration

David K. Kahaner; Jeffrey Horlick; Webb L. Wyman

With this software package, a PC, and a modest grasp of Basic, users can perform and plot integrals over experimental data.


NIST Interagency/Internal Report (NISTIR) - 6025 | 1997

Metrology for Information Technology [IT]

Michael D. Hogan; Gary Carver; Lisa J. Carnahan; M M. Gray; H Theodore; Jeffrey Horlick; Gordon Lyon; Elena R. Messina


IEEE Micro | 1986

Mathematical software in basic: RV, generation of uniform and normal random variables

David K. Kahaner; Jeffrey Horlick; Debra K Foer


Archive | 2000

NIST Handbook 150-12

Jeffrey Horlick; A. Lee; Lisa J. Carnahan


Archive | 2000

National voluntary laboratory accreditation program: cryptographic module testing

Jeffrey Horlick; Annabelle Lee; Lisa J. Carnahan


ACM | 1997

Metrology for Information Technology

Lisa J. Carnahan; Gary Carver; M M. Gray; Michael D. Hogan; Ted Hopp; Jeffrey Horlick; Elena R. Messina


Archive | 1995

National voluntary laboratory accreditation program: POSIX Portable Operating System Interface

Jeffrey Horlick; M M. Gray


Archive | 1988

Operational and technical requirements of the laboratory accreditation program for bulk asbestos analysis

Harvey W Berger; Lawrence S Galowin; Jeffrey Horlick; Eric B. Steel; Jennifer R. Verkouteren

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Harvey W Berger

National Institute of Standards and Technology

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Lisa J. Carnahan

National Institute of Standards and Technology

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M M. Gray

National Institute of Standards and Technology

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Elena R. Messina

National Institute of Standards and Technology

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Gary Carver

National Institute of Standards and Technology

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Michael D. Hogan

National Institute of Standards and Technology

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David K. Kahaner

National Institute of Standards and Technology

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Gordon Lyon

National Institute of Standards and Technology

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Eric B. Steel

National Institute of Standards and Technology

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Jennifer R. Verkouteren

National Institute of Standards and Technology

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