Jeffrey Horlick
National Institute of Standards and Technology
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ACM Standardview | 1997
Lisa J. Carnahan; Gary Carver; M M. Gray; Michael D. Hogan; Theodore Hopp; Jeffrey Horlick; Gordon Lyon; Elena R. Messina
Abstract : In May 1996, NIST management requested a white paper on metrology for information technology (IT). A task group was formed to develop this white paper with representatives from the Manufacturing Engineering Laboratory (MEL), the Information Technology Laboratory (ITL), and Technology Services (TS). The task group members had a wide spectrum of experiences and perspectives on testing and measuring physical and IT quantities. The task group believed that its collective experience and knowledge were probably sufficient to investigate the underlying question of the nature of IT metrology. During the course of its work, the task group did not find any previous work addressing the overall subject of metrology for IT. The task group found it to be both exciting and challenging to possibly be first in what should be a continuing area of study. After some spirited deliberations, the task group was able to reach consensus on its white paper. Also, as a result of its deliberations, the task group decided that this white paper should suggest possible answers rather than assert definitive conclusions. In this spirit, the white paper suggests: a scope and a conceptual basis for IT metrology; a taxonomy for IT methods of testing; status of IT testing and measurement; opportunities to advance IT metrology; overall roles for NIST; and recapitulates the importance of IT metrology to the U.S. The task group is very appreciative of having had the opportunity to produce this white paper. The task group hopes that this white paper will provide food for thought for our intended audience: NIST management and technical staff and our colleagues elsewhere who are involved in various aspects of testing and measuring IT.
Journal of Building Physics | 1985
Jeffrey Horlick; Harvey W Berger
This paper describes the National Voluntary Laboratory Accreditation Pro gram (NVLAP), administered by the National Bureau of Standards, and sum marizes the proficiency testing program for the Thermal Insulation Materials Laboratory Accreditation Program (Insulation LAP). NVLAP and its procedures for assessing, evaluating, and accrediting laboratories are presented briefly. The scope of the Insulation LAP is described. The results of the proficiency testing program over a four year period of testing are given. Eight tables show the sta tistical results of data submitted by participating laboratories for thermal trans mission properties, thermal conductance, surface flammability, settled density, critical radiant flux, and smoldering combustion.
international symposium on microarchitecture | 1985
David K. Kahaner; Jeffrey Horlick; Webb L. Wyman
With this software package, a PC, and a modest grasp of Basic, users can perform and plot integrals over experimental data.
NIST Interagency/Internal Report (NISTIR) - 6025 | 1997
Michael D. Hogan; Gary Carver; Lisa J. Carnahan; M M. Gray; H Theodore; Jeffrey Horlick; Gordon Lyon; Elena R. Messina
IEEE Micro | 1986
David K. Kahaner; Jeffrey Horlick; Debra K Foer
Archive | 2000
Jeffrey Horlick; A. Lee; Lisa J. Carnahan
Archive | 2000
Jeffrey Horlick; Annabelle Lee; Lisa J. Carnahan
ACM | 1997
Lisa J. Carnahan; Gary Carver; M M. Gray; Michael D. Hogan; Ted Hopp; Jeffrey Horlick; Elena R. Messina
Archive | 1995
Jeffrey Horlick; M M. Gray
Archive | 1988
Harvey W Berger; Lawrence S Galowin; Jeffrey Horlick; Eric B. Steel; Jennifer R. Verkouteren