Lisa J. Carnahan
National Institute of Standards and Technology
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Telemedicine Journal and E-health | 2011
Brian Grady; Kathleen Myers; Eve-Lynn Nelson; Norbert Belz; Leslie Bennett; Lisa J. Carnahan; Veronica Decker; Dwight Holden; Gregg Perry; Lynne S. Rosenthal; Nancy Rowe; Ryan Spaulding; Carolyn Turvey; Robert J. White; Debbie Voyles
Telemental Health Standards and Guidelines Working Group Co-Chairs: Brian Grady, MD Kathleen Myers, MD, MPH Eve-Lynn Nelson, PhD Writing Committees: Evidence-Based Practice for Telemental Health Norbert Belz, MHSA RHIA, Leslie Bennett, LCSW, Lisa Carnahan, PhD, Veronica Decker, APRN, BC, MBA, Brian Grady, MD, Dwight Holden, MD, Kathleen Myers, MD, MPH, Eve-Lynn Nelson, PhD, Gregg Perry, MD, Lynne S. Rosenthal, PhD, Nancy Rowe, Ryan Spaulding, PhD, Carolyn Turvey, PhD, Debbie Voyles, Robert White, MA, LCPC Practice Guidelines for Videoconferencing-Based Telemental Health Peter Yellowlees, MD, Jay Shore, MD, Lisa Roberts, PhD Contributors: Working Group Members [WG], Consultants [C], Reviewers [R], Telemental Health Special Interest Group Chairs [MH], ATA Standards and Guidelines Committee Member [SG], ATA Staff [S] Nina Antoniotti, RN, MBA, PhD [Chair, SG] Richard S. Bakalar, MD [SG] Norbert Belz, MHSA RHIA [WG] Leslie Bennett, LCSW [WG] Jordana Bernard, MBA [S] Anne Burdick, MD, MPH [Vice Chair, SG] David...
Telemedicine Journal and E-health | 2008
Elizabeth A. Krupinski; Anne E. Burdick; Hon S. Pak; John H. Bocachica; Lucius Earles; Karen E. Edison; Marc E. Goldyne; Tom Hirota; Joseph C. Kvedar; Karen C. McKoy; Dennis H. Oh; Dan Siegel; Nina Antoniotti; Ivan D. Camacho; Lisa J. Carnahan; Paul A. Boynton; Richard S. Bakalar; Richard P. Evans; Al Kinel; Peter Kuzmak; Brian C. Madden; Sandra Peters; Lynne S. Rosenthal; Scott Simmons; Jordana Bernard; Jonathan D. Linkous
The ATA assembled a group of experts to develop practice guidelines for teledermatology. This document represents the body of work that this distinguished group assembled. It was approved by the ATA Board of Directors and is presented here in its entirety.
ACM Standardview | 1997
Lisa J. Carnahan; Gary Carver; M M. Gray; Michael D. Hogan; Theodore Hopp; Jeffrey Horlick; Gordon Lyon; Elena R. Messina
Abstract : In May 1996, NIST management requested a white paper on metrology for information technology (IT). A task group was formed to develop this white paper with representatives from the Manufacturing Engineering Laboratory (MEL), the Information Technology Laboratory (ITL), and Technology Services (TS). The task group members had a wide spectrum of experiences and perspectives on testing and measuring physical and IT quantities. The task group believed that its collective experience and knowledge were probably sufficient to investigate the underlying question of the nature of IT metrology. During the course of its work, the task group did not find any previous work addressing the overall subject of metrology for IT. The task group found it to be both exciting and challenging to possibly be first in what should be a continuing area of study. After some spirited deliberations, the task group was able to reach consensus on its white paper. Also, as a result of its deliberations, the task group decided that this white paper should suggest possible answers rather than assert definitive conclusions. In this spirit, the white paper suggests: a scope and a conceptual basis for IT metrology; a taxonomy for IT methods of testing; status of IT testing and measurement; opportunities to advance IT metrology; overall roles for NIST; and recapitulates the importance of IT metrology to the U.S. The task group is very appreciative of having had the opportunity to produce this white paper. The task group hopes that this white paper will provide food for thought for our intended audience: NIST management and technical staff and our colleagues elsewhere who are involved in various aspects of testing and measuring IT.
Journal of Research of the National Institute of Standards and Technology | 2001
Michael D. Hogan; Lisa J. Carnahan; Robert J. Carpenter; David W. Flater; James E. Fowler; Simon P. Frechette; M M. Gray; L A. Johnson; R. McCabe; Douglas C. Montgomery; Shirley M. Radack; R Rosenthal; Craig M. Shakarji
Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society of the 21st century. Over the last half of the 20th century, information technology (IT) has been a powerful agent of change in almost every sector of the economy. The complexity and rapidly changing nature of IT have presented unique technical challenges to the National Institute of Standards and Technology (NIST) and to the scientific measurement community in developing a sound measurement and testing infrastructure for IT. This measurement and testing infrastructure for the important non-physical and non-chemical properties associated with complex IT systems is still in an early stage of development. This paper explains key terms and concepts of IT metrology, briefly reviews the history of the National Bureau of Standards/National Institute of Standards and Technology (NBS/NIST) in the field of IT, and reviews NIST’s current capabilities and work in measurement and testing for IT. It concludes with a look at what is likely to occur in the field of IT over the next ten years and what metrology roles NIST is likely to play.
Edpacs | 2001
Mary Brady; Carmelo Montanez-Rivera; Richard M. Rivello; Lisa J. Carnahan
Abstract A n Internet language called the Extensible Markup Language (XML)is rapidly becoming one of the most popular languages in the world. XML is being incorporated into the design and structure of many Internet Web pages and applications. It is particularly useful for those involving structured information exchanges, such as electronic commerce (E-commerce). XML is a language that describes information in a way that allows computers to exchange information and to act on the information automatically. Consequently, its use can speed up the automation of certain processes. Surrounding XML is a family of technologies that either augment the language or build upon it further. Sometimes it is difficult to sift through the various XML technologies and determine which ones best fit the needs of an organization.
Edpacs | 1998
Lisa J. Carnahan; Barbara Guttman
Abstract Telecommuting is the use of telecommunication to create an office that is situated away from the established office, that is, the fixed physical office location. This article discusses the IS security issues related to telecommuting. It also proposes solutions that may help organizations manage the telecommuting environment more effectively.
Proceedings of SPIE | 1996
Lisa J. Carnahan
Security standards help users implement adequate protection in their systems. Independent, third-party conformance testing to security standards provides those users with a metric beyond vendor affirmation in determining conformance. Independent third-party conformance testing gives manufacturers the opportunity to claim conformance to a standard using a strong metric. However neither standards nor testing programs can be successful without the support of the manufacturers and users they are intended to serve. This paper discusses a standard that was developed by NIST in conjunction with industry, federal and private sector users, and the validation program that provides users the necessary metric to determine conformance.
Telemedicine Journal and E-health | 2004
Jonathan D. Linkous; Richard S. Bakalar; Adam Darkins; Ronald K. Poropatich; Jerry D. Cavallerano; Mary G. Lawrence; Helen K. Li; Matthew Tennant; Sven Erik Bursell; Mark Horton; Ingrid Zimmer-Galler; Wendall Bauman; W. Kelly Gardner; Lloyd Hildebrand; Jay Federman; Lisa J. Carnahan; Peter Kuzmak; John Peters; Jehanara Ahmed; Lloyd M. Aiello; Lloyd Paul Aiello; Gary Buck; Ying-Ling Chen; Denise Cunningham; Eric Goodall; Ned Hope; Eugene Huang; Larry D. Hubbard; Mark Janczewski; James W. L. Lewis
Special Publication (NIST SP) - 800-10 | 1994
John P. Wack; Lisa J. Carnahan
Special Publication (NIST SP) - 800-7 | 1994
Robert H. Bagwill; John Barkley; Lisa J. Carnahan; Shu-jen H. Chang; David R. Kuhn; Paul Markovitz; Anastase Nakassis; Karen Olsen; Michael L. Ransom; John P. Wack