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Dive into the research topics where Jeremy Smallwood is active.

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Featured researches published by Jeremy Smallwood.


electrical overstress/electrostatic discharge symposium | 2004

Electrostatic field limits and charge threshold for field induced damage to voltage susceptible devices

Jaakko Paasi; Hannu Salmela; Jeremy Smallwood

We have studied electrostatic field and charge threshold limits for damage to MOSFET devices in order to understand the ESD damage risks during handling in electronics production and assembly processes. The study covers both field induced charged device model (CDM) and charged board model (CBM) cases. The charging electrostatic field for failure can be even two orders of magnitude lower for a device on a board than at component level. The charge level for failure remains approximately constant. Our results show that charge threshold for failure would serve as a good guide for ESD risks of voltage susceptible MOSFETs as discrete components and when assembled to PWBs.


electrical overstress electrostatic discharge symposium | 2017

Charged device discharge measurement methods in electronics manufacturing

Pasi Tamminen; Jeremy Smallwood; Wolfgang Stadler

Electrical components with a lower CDM ESD immunity can require additional protection methods in manufacturing. Discharge current measurements and electromagnetic pulse detection gives valuable data for more detailed ESD risk assessments. However, both methods require sophisticated tools and trained personnel to get accurate data for control purposes.


electrical overstress electrostatic discharge symposium | 2017

The main parameters affecting charged device discharge waveforms in a CDM qualification and manufacturing

Pasi Tamminen; Jeremy Smallwood; Wolfgang Stadler

Charged device model (CDM) discharges in a CDM qualification and charged device discharges in electronics manufacturing are compared to evaluate the main discharge parameters. Accurate charged device ESD risk assessments would require to use discharge current waveform information and tailored measurement methods.


electrical overstress electrostatic discharge symposium | 2017

Qualification challenges of footwear and flooring systems

Toni Viheriäkoski; Vesa Jokinen; Jeremy Smallwood; Ari Korpipaa; Pasi Tamminen

Measurement of body voltage alone can result in erroneous conclusions in qualification of footwear and flooring systems in combination with a person. Measurement uncertainties should be taken into account. We have studied the time dependency and charge generation of some footwear and flooring systems. The most significant inconsistencies of the voltage measurement are discussed in this technical paper.


electrical overstress electrostatic discharge symposium | 2016

Electrostatic shock risks in assembly of large wind turbine blades

Jorg Thurmer; Jeremy Smallwood

Electrostatic shocks were reported by personnel manufacturing large fiber reinforced plastic wind turbine blades. Inspection and measurements confirmed these reports. We have estimated the possible discharge energy and likelihood of hazardous ESD in some production steps. Administrative and technical recommendations are given to control static to an acceptable level.


electrical overstress/electrostatic discharge symposium | 2003

New methods for the assessment of ESD threats to electronic components

Jaakko Paasi; Jeremy Smallwood; Hannu Salmela


electrical overstress/electrostatic discharge symposium | 2003

ESD sensitivity of devices on a charged printed wiring board

Jaakko Paasi; Hannu Salmela; Pasi Tamminen; Jeremy Smallwood


electrical overstress electrostatic discharge symposium | 2010

CDM damage due to Automated Handling Equipment

Sean Millar; Jeremy Smallwood


electrical overstress electrostatic discharge symposium | 2014

Electrostatic threats in hospital environment

Toni Viheriäkoski; Mika Kokkonen; Pasi Tamminen; Eira Kärjä; Jukka Hillberg; Jeremy Smallwood


electrical overstress electrostatic discharge symposium | 2014

Optimizing investment in ESD control

Jeremy Smallwood; Pasi Tamminen; Toni Viheriaekoski

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Pasi Tamminen

Tampere University of Technology

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Hannu Salmela

VTT Technical Research Centre of Finland

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Jaakko Paasi

VTT Technical Research Centre of Finland

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