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Dive into the research topics where Jérôme Meziere is active.

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Featured researches published by Jérôme Meziere.


Journal of Physics: Condensed Matter | 2004

Contribution of numerical simulation to silicon carbide bulk growth and epitaxy

Jérôme Meziere; Michel Pons; Lea Di Cioccio; Elisabeth Blanquet; Pierre Ferret; Jean-Marc Dedulle; Francis Baillet; Etienne Pernot; Michaı̈l Anikin; Roland Madar; Thierry Billon

High temperature epitaxial processes for SiC bulk and thin films by physical vapour transport and chemical vapour deposition are reviewed from an academic point of view using heat and mass transfer modelling and simulation. The objective is to show that this modelling approach could provide information on fabrication and characterization for the improvement of the knowledge of the growth history. Recent results of our integrated research programme on SiC, taking into account the fabrication, process modelling and characterization, will be presented.


Solid State Phenomena | 2007

Direct wafer bonding for nanostructure preparations

Hubert Moriceau; F. Rieutord; Christophe Morales; Anne-Marie Charvet; O. Rayssac; Benoit Bataillou; Frank Fournel; J. Eymery; A. Pascale; Pascal Gentile; Alexis Bavard; Jérôme Meziere; Christophe Maleville; Bernard Aspar

Direct Wafer Bonding has been widely developed and is very attractive for a lot of applications. Using original techniques based on direct bonding enable to carry out specific engineered substrates. Various illustrations are given among which twisted Si-Si bonded substrates, where buried dislocation networks play a key role in the subsequent elaboration of nanostructures.


Materials Science Forum | 2003

Experiment and Modeling of the Large-Area Etching and Growth Rate of Epitaxial SiC

Jérôme Meziere; Michel Pons; Jean Marc Dedulle; Elisabeth Blanquet; Pierre Ferret; Lea Di Cioccio; Thierry Billon

The growth of thick and high quality epitaxial 4H-SiC layers requir es a good control of the CVD process. An horizontal hot-wall reactor commerci alized by the Epigress company is used. The precursors are silane and propane diluted in hy rogen. The typical temperature range is 1700-1900 K and the pressure fixed at 250 mbar. Mode ling and numerical simulation are used to better understand the intricate mi xture of phenomena involving electromagnetics, heat, mass transfer and reactivity in different geometries and experimental conditions [1-4]. 3D modeling and simulation of electromag netics and heat transfer have been previously presented for this reactor [1]. In this paper, a chemistry model including surface deposition and hydrogen etching is first describe d. Finally, experiments and measurements are compared to simulation results to validate the mod l and to reveal the problems related to high temperature technology and large-scale area growt h.


Journal of Crystal Growth | 2004

Modeling and simulation of SiC CVD in the horizontal hot-wall reactor concept

Jérôme Meziere; Magali Ucar; Elisabeth Blanquet; Michel Pons; Pierre Ferret; L. Di Cioccio


Surface Science | 2006

Ge quantum dots growth on nanopatterned Si(0 0 1) surface: Morphology and stress relaxation study

A. Pascale; Pascal Gentile; J. Eymery; Jérôme Meziere; Alexis Bavard; Tobias U. Schülli; Frank Fournel


Journal of Crystal Growth | 2005

Germanium growth on nanopatterned surface studied by STM

Pascal Gentile; J. Eymery; F. Leroy; Frank Fournel; Jérôme Meziere; P. Perreau


Materials Science Forum | 2002

Simulation of the Large-Area Growth of Homoepitaxial 4H-SiC by Chemical Vapor Deposition

Michel Pons; Jérôme Meziere; Stephane Wan Tang Kuan; Elisabeth Blanquet; Pierre Ferret; Lea Di Cioccio; Thierry Billon; Roland Madar


Journal De Physique Iv | 2001

Simulation of the large-area growth of homoepitaxial 4H-Sic by chemical vapor deposition

Michel Pons; Jérôme Meziere; Jean-Marc Dedulle; S. Wan Tang Kuan; Elisabeth Blanquet; Claude Bernard; Pierre Ferret; L. Di Cioccio; Thierry Billon; R. Madar


Archive | 2007

Method for nanostructuring of the surface of a substrate

Frank Fournel; Jérôme Meziere; Alexis Bavard; Florent Pigeon; Florence Garrelie


Materials Science Forum | 2004

Nitrogen Doping of Epitaxial SiC: Experimental Evidence of the Re-Incorporation of Etched Nitrogen during Growth

Jérôme Meziere; Pierre Ferret; Elisabeth Blanquet; Michel Pons; Lea Di Cioccio; Thierry Billon

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Elisabeth Blanquet

Centre national de la recherche scientifique

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Michel Pons

Centre national de la recherche scientifique

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Alexis Bavard

Centre national de la recherche scientifique

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Florence Garrelie

Centre national de la recherche scientifique

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J. Eymery

Centre national de la recherche scientifique

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Jean-Marc Dedulle

Centre national de la recherche scientifique

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Roland Madar

Centre national de la recherche scientifique

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Claude Bernard

Centre national de la recherche scientifique

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Etienne Pernot

Centre national de la recherche scientifique

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