John Albaugh
Dow Corning
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Featured researches published by John Albaugh.
SID Symposium Digest of Technical Papers | 2003
S. Maghsoodi; Sheng Wang; Gregory Becker; John Albaugh; Craig Rollin Yeakle; D. K. Choi; R. R. Warner; G. A. Cerny; J. E. Hamon; D. Ha; Eric Scott Moyer
Silsesquioxane resins are of particular interest for use as insulator materials in flat panel display applications due to their balance of electrical, optical, and mechanical properties. In this study, a series of HSQ and MSQ resins were synthesized and characterized in terms of their structures and thin film properties. These resin systems yielded high quality thin films with high modulus, good adhesion to silicon and glass substrates, high optical transparency (>98 % @ 300 − 800 nm), good planarization properties, excellent gap fill capability, good thermal and chemical stability to various photoresist and ITO etch chemicals necessary for the fabrication of flat panel displays.
MRS Proceedings | 2000
Thomas A. Deis; Chandan Kumar Saha; Eric Scott Moyer; Kyuha Chung; Youfan Liu; Mike Spaulding; John Albaugh; Wei Chen; Jeff Bremmer
Low-k dielectric films have been developed using a new silsesquioxane based chemistry that allows both the electrical and mechanical properties to be tuned to specific values. By controlling the composition and film processing conditions of spin-on formulations, dielectric constants in the range 1.5 to 3.0 are obtained with modulus values that range from 1 to 30 GPa. The modulus and dielectric constant are tuned by controlling porosity, which varies from 0 to >60%, and final film composition which varies from HSiO 3/2 to SiO 4/2 . The spin-on formulation includes hydrogen silsesquioxane resin and solvents. Adjusting the ratio of solvents to resin in the spin-on formulation controls porosity. As-spun films are treated with ammonia and moisture to oxidize the resin and form a mechanically self-supporting gel. Solvent removal and further conversion to a more “silica-like” composition occur during thermal curing at temperatures of 400 to 450°C. The final film composition was controlled through both room temperature oxidation and thermal processing. Final film properties are optimized for a balance of electrical, mechanical and thermal properties to meet the specific requirements of a wide range of applications. Processed films exhibit no stress corrosion cracking or delamination upon indentation, with indenter penetration exceeding the film thickness, and followed by exposure to water at room temperature. Films also exhibit high adhesive strength (> 60MPa) and low moisture absorption. Processing conditions, composition and properties of thin are discussed.
Surface & Coatings Technology | 2008
John Albaugh; Caroline O'Sullivan; Liam O'Neill
Archive | 2005
Maneesh Bahadur; Wei Chen; John Albaugh; Brian R. Harkness; James Tonge
Archive | 2005
John Albaugh; Gregory Becker; Sina Magshoodi; Eric Scott Moyer; Sheng Wang; Craig Rollin Yeakle
Archive | 2007
John Albaugh; Robert Charles Camilletti
Archive | 2014
John Albaugh; Brian Chislea; Adriana Zambova
Archive | 2012
John Albaugh; Tiffany Menjoulet; Timothy Paul Mitchell; Nicholas E. Powell
Energy Procedia | 2013
Guy Beaucarne; Adriana Zambova; Kees Broek; John Albaugh; Brian Chislea; Jason Wei; Thibault Kervyn De Meerendre; Mario Kloos; Ian Bennett
Archive | 2014
John Albaugh; Brian Chislea; Adriana Zambova