Jonas Christian Due Buron

Graphene Conductance Uniformity Mapping

We demonstrate a combination of micro four-point probe (M4PP) and non-contact terahertz time-domain spectroscopy (THz-TDS) measurements for centimeter scale quantitative mapping of the sheet conductance of large area chemical vapor deposited graphene films. Dual configuration M4PP measurements, demonstrated on graphene for the first time, provide valuable statistical insight into the influence of microscale defects on the conductance, while THz-TDS has potential as a fast, non-contact metrology method for mapping of the spatially averaged nanoscopic conductance on wafer-scale graphene with scan times of less than a minute for a 4-in. wafer. The combination of M4PP and THz-TDS conductance measurements, supported by micro Raman spectroscopy and optical imaging, reveals that the film is electrically continuous on the nanoscopic scale with microscopic defects likely originating from the transfer process, dominating the microscale conductance of the investigated graphene film.

Graphene mobility mapping

Carrier mobility and chemical doping level are essential figures of merit for graphene, and large-scale characterization of these properties and their uniformity is a prerequisite for commercialization of graphene for electronics and electrodes. However, existing mapping techniques cannot directly assess these vital parameters in a non-destructive way. By deconvoluting carrier mobility and density from non-contact terahertz spectroscopic measurements of conductance in graphene samples with terahertz-transparent backgates, we are able to present maps of the spatial variation of both quantities over large areas. The demonstrated non-contact approach provides a drastically more efficient alternative to measurements in contacted devices, with potential for aggressive scaling towards wafers/minute. The observed linear relation between conductance and carrier density in chemical vapour deposition graphene indicates dominance by charged scatterers. Unexpectedly, significant variations in mobility rather than doping are the cause of large conductance inhomogeneities, highlighting the importance of statistical approaches when assessing large-area graphene transport properties.

Electrically continuous graphene from single crystal copper verified by terahertz conductance spectroscopy and micro four-point probe.

The electrical performance of graphene synthesized by chemical vapor deposition and transferred to insulating surfaces may be compromised by extended defects, including for instance grain boundaries, cracks, wrinkles, and tears. In this study, we experimentally investigate and compare the nano- and microscale electrical continuity of single layer graphene grown on centimeter-sized single crystal copper with that of previously studied graphene films, grown on commercially available copper foil, after transfer to SiO2 surfaces. The electrical continuity of the graphene films is analyzed using two noninvasive conductance characterization methods: ultrabroadband terahertz time-domain spectroscopy and micro four-point probe, which probe the electrical properties of the graphene film on different length scales, 100 nm and 10 μm, respectively. Ultrabroadband terahertz time-domain spectroscopy allows for measurement of the complex conductance response in the frequency range 1-15 terahertz, covering the entire intraband conductance spectrum, and reveals that the conductance response for the graphene grown on single crystalline copper intimately follows the Drude model for a barrier-free conductor. In contrast, the graphene grown on commercial copper foil shows a distinctly non-Drude conductance spectrum that is better described by the Drude-Smith model, which incorporates the effect of preferential carrier backscattering associated with extended, electronic barriers with a typical separation on the order of 100 nm. Micro four-point probe resistance values measured on graphene grown on single crystalline copper in two different voltage-current configurations show close agreement with the expected distributions for a continuous 2D conductor, in contrast with previous observations on graphene grown on commercial copper foil. The terahertz and micro four-point probe conductance values of the graphene grown on single crystalline copper shows a close to unity correlation, in contrast with those of the graphene grown on commercial copper foil, which we explain by the absence of extended defects on the microscale in CVD graphene grown on single crystalline copper. The presented results demonstrate that the graphene grown on single crystal copper is electrically continuous on the nanoscopic, microscopic, as well as intermediate length scales.

All-Optical flip-flop operation using a SOA and DFB laser diode optical feedback combination

We report on the switching of an all-optical flip-flop consisting of a semiconductor optical amplifier (SOA) and a distributed feedback laser diode (DFB), bidirectionally coupled to each other. Both simulation and experimental results are presented. Switching times as low as 50ps, minimal required switch pulse energies below 1pJ and a repetition rate of 1.25GHz have been measured. Contrast ratios over 25dB have been obtained. The dependence on the pulse length and CW input power of the minimal required switch energy is investigated.

All-Optical Flip-Flop Based on an SOA/DFB-Laser Diode Optical Feedback Scheme

We report on the dynamic all-optical flip-flop (AOFF) operation of an optical feedback scheme consisting of a semiconductor optical amplifier (SOA) and a distributed feedback laser diode (DFB-LD), bidirectionally coupled to each other. The operation of the AOFF relies on the interplay between the optical powers in both the DFB-LD and the SOA. Switching times as low as 150ps for switch pulse energies of around 6 pJ and a repetition rate of 500MHz have been measured. The contrast ratio was measured to be above 12 dB

Fabrication of CVD graphene-based devices via laser ablation for wafer-scale characterization

Selective laser ablation of a wafer-scale graphene film is shown to provide flexible, high speed (1 wafer/hour) device fabrication while avoiding the degradation of electrical properties associated with traditional lithographic methods. Picosecond laser pulses with single pulse peak fluences of 140 mJ cm−2 for 1064 nm, 40 mJ cm−2 for 532 nm, and 30 mJ cm−2 for 355 nm are sufficient to ablate the graphene film, while the ablation onset for Si/SiO2 (thicknesses 500 μm/302 nm) did not occur until 240 mJ cm−2, 150 mJ cm−2, and 135 mJ cm−2, respectively, allowing all wavelengths to be used for graphene ablation without detectable substrate damage. Optical microscopy and Raman Spectroscopy were used to assess the ablation of graphene, while stylus profilometery indicated that the SiO2 substrate was undamaged. CVD graphene devices were electrically characterized and showed comparable field-effect mobility, doping level, on–off ratio, and conductance minimum before and after laser ablation fabrication.

Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gate.

We demonstrate wafer-scale, non-contact mapping of essential carrier transport parameters, carrier mobility (µdrift), carrier density (Ns), DC sheet conductance (σdc), and carrier scattering time (τsc) in CVD graphene, using spatially resolved terahertz time-domain conductance spectroscopy. σdc and τsc are directly extracted from Drude model fits to terahertz conductance spectra obtained in each pixel of 10 × 10 cm2 maps with a 400 µm step size. σdc- and τsc-maps are translated into µdrift and Ns maps through Boltzmann transport theory for graphene charge carriers and these parameters are directly compared to van der Pauw device measurements on the same wafer. The technique is compatible with all substrate materials that exhibit a reasonably low absorption coefficient for terahertz radiation. This includes many materials used for transferring CVD graphene in production facilities as well as in envisioned products, such as polymer films, glass substrates, cloth, or paper substrates.

Optical fiber link for transmission of 1-nJ femtosecond laser pulses at 1550 nm

We report on numerical and experimental characterization of the performance of a fiber link optimized for the delivery of sub-100-fs laser pulses at 1550 nm over several meters of fiber. We investigate the power handling capacity of the link, and demonstrate all-fiber delivery of 1-nJ pulses over a distance of 5.3 m. The fiber link consists of dispersion-compensating fiber (DCF) and standard single-mode fiber. The optical pulses at different positions in the fiber link are measured using frequency-resolved optical gating (FROG). The results are compared with numerical simulations of the pulse propagation based on the generalized nonlinear Schrödinger equation. The high input power capacity of the fiber link allows the splitting and distribution of femtosecond pulses to an array of fibers with applications in multi-channel fiber-coupled terahertz time-domain spectroscopy and imaging systems. We demonstrate THz pulse generation and detection using a distributed fiber link with 32 channels and 2.6 nJ input pulse energy.

Quality assessment of graphene: Continuity, uniformity, and accuracy of mobility measurements

With the increasing availability of large-area graphene, the ability to rapidly and accurately assess the quality of the electrical properties has become critically important. For practical applications, spatial variability in carrier density and carrier mobility must be controlled and minimized. We present a simple framework for assessing the quality and homogeneity of large-area graphene devices. The field effect in both exfoliated graphene devices encapsulated in hexagonal boron nitride and chemical vapor-deposited (CVD) devices was measured in dual current–voltage configurations and used to derive a single, gate-dependent effective shape factor, β, for each device. β is a sensitive indicator of spatial homogeneity that can be obtained from samples of arbitrary shape. All 50 devices investigated in this study show a variation (up to tenfold) in β as a function of the gate bias. Finite element simulations suggest that spatial doping inhomogeneity, rather than mobility inhomogeneity, is the primary cause of the gate dependence of β, and that measurable variations of β can be caused by doping variations as small as 1010 cm−2. Our results suggest that local variations in the position of the Dirac point alter the current flow and thus the effective sample shape as a function of the gate bias. We also found that such variations lead to systematic errors in carrier mobility calculations, which can be revealed by inspecting the corresponding β factor.

A Framework for Label Preference in GMPLS Controlled Optical Networks

In GMPLS optical networks, the label (i.e., wavelength) selection process can be accomplished in a dynamic and distributed way by the RSVP-TE signalling protocol. In wavelength-continuous networks, the concurrent selection of the same label by distinct reservation attempts may lead to a connection blocking. In wavelength- convertible networks, the selection of a distinct label on each link may lead to a waste of wavelength converters, and thus to an increase of network cost and blocking probability. This paper presents label preference schemes that aim at improving the wavelength selection process during both provisioning and restoration phases. By exploiting the standard and novel RSVP-TE objects, reservation contentions are reduced in wavelength- continuous networks and converters are saved in wavelength-convertible networks.