Joon-seok Park
Samsung
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Publication
Featured researches published by Joon-seok Park.
IEEE Electron Device Letters | 2010
Kyoung-seok Son; Ji-sim Jung; Kwang-Hee Lee; Tae-Sang Kim; Joon-seok Park; Yun-Hyuk Choi; Kee-Chan Park; Jang-Yeon Kwon; Bonwon Koo; Sangyoon Lee
A Ga-In-Zn-O thin-film transistor with double-gate structure is reported. Enhancement-mode operation that is essential to the constitution of a low-power digital circuitry is easily achieved when the upper and lower gate electrodes are tied together. The saturation mobility and the subthreshold swing are improved from 3.65 cm2/(V·s) and 0.44 V/dec to 18.9 cm2/(V·s) and 0.14 V/dec, respectively, compared with the single-gate structure. We can modulate the threshold voltage of either gate by adjusting the bias on the other gate.
IEEE Electron Device Letters | 2010
Kyoung-seok Son; Ji-sim Jung; Kwang-Hee Lee; Tae-Sang Kim; Joon-seok Park; Kee-Chan Park; Jang-Yeon Kwon; Bonwon Koo; Sangyoon Lee
We report the electrical stability of double-gate (DG) Ga-In-Zn-O thin-film transistors (TFTs). The threshold voltage (<i>VT</i>) shift of the DG TFT after 3 h of positive-bias temperature stress (<i>V</i><sub>GS</sub> = + 20 V, <i>V</i><sub>DS</sub> = + 0.1 V, and Temperature = 60°C) is as small as +2.7 V, while that of a conventional single-gate (SG) TFT is +6.6 V. The results of negative-bias temperature stress [(NBTS); <i>V</i><sub>GS</sub> = - 20 V, <i>V</i><sub>DS</sub> = + 10 V, and Temperature = 60°C] are more dramatic: The <i>VT</i> shift of the DG TFT is only +0.1 V, whereas that of the SG TFT is -9.1 V. With backlight illumination, the <i>VT</i> shift of the SG TFT under the same NBTS becomes severe ( -11.1 V). However, it remains as small as -0.7 V for the DG TFT.
IEEE Transactions on Computers | 2004
Joon-seok Park; Pedro C. Diniz; K. R. Shesha Shayee
Selecting which program transformations to apply when mapping computations to FPGA-based computing architectures can lead to prohibitively long design space exploration cycles. An alternative is to develop fast, yet accurate, performance and area models to quickly understand the Impact and interaction of the transformations. In this paper, we present a combined analytical performance and area modeling approach for complete FPGA designs in the presence of loop transformations. Our approach takes into account the impact of input/output memory bandwidth and memory interface resources, often the limiting factor in the effective implementation of computations. Our preliminary results reveal that our modeling is very accurate, being therefore amenable to be used in a compiler tool to quickly explore very large design spaces.
Archive | 2013
Kyoung-seok Son; Myung-kwan Ryu; Tae-Sang Kim; Hyun-Suk Kim; Joon-seok Park; Jong-Baek Seon; Sangyoon Lee
Archive | 2013
Tae-Sang Kim; Sun-Jae Kim; Hyun-Suk Kim; Myung-kwan Ryu; Joon-seok Park; Seok-Jun Seo; Jong-Baek Seon; Kyoung-seok Son
Archive | 2013
Joon-seok Park; Sun-Jae Kim; Tae-Sang Kim; Hyun-Suk Kim; Myung-kwan Ryu; Seok-Jun Seo; Jong-Baek Seon; Kyoung-seok Son; Sangyoon Lee
Archive | 2012
Hyun-Suk Kim; Sangyoon Lee; Myung-kwan Ryu; Tae-Sang Kim; Jong-Baek Seon; Kyoung-seok Son; Won-mook Choi; Joon-seok Park; Mi-Jeong Song
Archive | 2013
Joon-seok Park; Sun-Jae Kim; Tae-Sang Kim; Hyun-Suk Kim; Myung-kwan Ryu; Seok-Jun Seo; Jong-Baek Seon; Kyoung-seok Son; Sangyoon Lee
Archive | 2012
Jong-Baek Seon; Tae-Sang Kim; Hyun-Suk Kim; Myung-kwan Ryu; Joon-seok Park; Seok-Jun Seo; Kyoung-seok Son; Sangyoon Lee
IEEE Electron Device Letters | 2010
Kyoung-seok Son; Ji-sim Jung; Kwang-Hee Lee; Tae-Sang Kim; Joon-seok Park; Kee-Chan Park; Jang-Yeon Kwon; Bonwon Koo; Sangyoon Lee