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Dive into the research topics where Yang Yu-Sin is active.

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Featured researches published by Yang Yu-Sin.


Archive | 2006

INSPECTION METHOD OF PATTERN FORMED ON SUBSTRATE, AND INSPECTION APPARATUS FOR IMPLEMENTING SAME

Kin Keigen; Jun Chung-Sam; Chung Ki-Suk; Chon Sang-Moon; Kim Seong-Jin; Lee Byung Seok; Yang Yu-Sin


Archive | 2002

METHOD AND DEVICE FOR INSPECTING POLISHING PAD

Jun Chung-Sam; Kim Kye-Weon; Yang Yu-Sin; Kim Hyo-Hoo


Archive | 2016

Surface Inspecting Method

Ko Kang-Woong; Ryu Sung-Yoon; Sohn Younghoon; Song Gil-Woo; Ahn Tae-Heung; Jeon Hyoung-Jo; Han Sang-Kyeong; Horie Masahiro; Ko Woo-Seok; Yang Yu-Sin; Lee Sang-Kil; Jeon Byeong-Hwan


Archive | 2018

METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR PERFORMING THE SAME, AND A METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME

Song Joonseo; Ryu Sung Yoon; Yap Wahseng; Jee Yunjung; Yang Yu-Sin; Jun Chung-Sam; Jeoung Yoo Jin; Ahn Jaehyung; Lee Janghee


Archive | 2018

METHOD OF MEASURING MISALIGNMENT OF CHIPS, A METHOD OF FABRICATING A FAN-OUT PANEL LEVEL PACKAGE USING THE SAME, AND A FAN-OUT PANEL LEVEL PACKAGE FABRICATED THEREBY

Sohn Younghoon; Yang Yu-Sin


Archive | 2017

DATA COLLECTING/PROCESSING SYSTEM AND PRODUCT MANUFACTURING/ANALYZING SYSTEM INCLUDING THE SAME

Kim Yeonjung; Eom Sungeun; Shin Yujin; Yang Yu-Sin


Archive | 2017

APPARATUS AND METHOD FOR MEASURING THICKNESS

Ryu Sung Yoon; Sohn Younghoon; Yang Yu-Sin; Jun Chung-Sam; Jee Yunjung


Archive | 2017

METHOD OF INSPECTING PATTERN DEFECT

Sohn Younghoon; Jun Chung-Sam; Yang Yu-Sin


Archive | 2017

METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METHODS INCORPORATING THE SAME

Yang Yu-Sin; Ko Kang-Woong; Ryu Sung Yoon; Song Gil-Woo; Lee Sang-Kil; Jun Chung-Sam; Jeon Hyoung-Jo; Horie Masahiro


Archive | 2016

Method of Inspecting Wafer Using Electron Beam

Kim Souk; Jun Chung-Sam; Ko Woo-Seok; Lee Sang-Kil; Shin Kwang-Il; Yang Yu-Sin; Yoon Min-Chul

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