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Dive into the research topics where Jun-Feng Song is active.

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Featured researches published by Jun-Feng Song.


Applied Optics | 1991

Stylus profiling at high resolution and low force

Jun-Feng Song; Theodore V. Vorburger

This paper describes experimental work to improve the lateral resolution of stylus instruments. Our efforts involve (1) use of a fine stylus, (2) low stylus load, (3) high magnification in the lateral direction, and (4) specimens with fine surface structure by which the lateral resolution of stylus instruments could be detected. By using styli with tip widths between 0.05 and 0.15-microm, a stylus load of 0.6-1.2 x 10(-6)-N (0.06-0.12-mgf), and a piezostage for lateral displacement, we detected 0.05-0.15-microm lateral resolution on the surfaces of different kinds of specimens. To get a high lateral resolution, the most important consideration is a fine stylus with small tip size.


Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology | 2000

A fast algorithm for determining the Gaussian filtered mean line in surface metrology

Y B. Yuan; X F. Qiang; Jun-Feng Song; Theodore V. Vorburger

Abstract A fast recursive algorithm for determining the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This recursive algorithm uses a small number of multiplications per loop and otherwise such simple computer operations as addition and subtraction, and therefore, can achieve a very high computational speed. Special cases are also presented in which the relatively inefficient multiplication operation in the computer can be replaced by the efficient digit shifting operation, and the filtering computational efficiency is enhanced further. High-order algorithms are proposed for practical use to improve filtering accuracy. The “forward filtering” and “backward filtering” implementation of the recursive algorithm results in zero phase distortion of the filtered mean line. A new relationship between the Gaussian filtering method and the classical 2RC filtering method is also established using this algorithm.


Measurement Science and Technology | 2006

Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques

Jun-Feng Song; Theodore V. Vorburger; Thomas B. Renegar; Hyug-Gyo Rhee; A Zheng; L Ma; John M. Libert; Susan M. Ballou; Benjamin Bachrach; K Bogart

Three optical instruments including an interferometric microscope, a Nipkow disc confocal microscope and a laser scanning confocal microscope and a stylus instrument are used for the measurements of bullet profile signatures of a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 2460 standard bullet. The two-dimensional profile signatures are compared with the virtual bullet standard signature established by the same stylus instrument. The bullet signature differences are quantified by the maximum cross-correlation function CCFmax. If the compared signatures were exactly the same, CCFmax would be 100%. Comparison results show close agreement among the four techniques for bullet profile signature measurements. The average CCFmax values are higher than 90%. This supports the possibility of using surface topography techniques for ballistic identifications as an alternative to the current technology based on image comparisons.


Applied Optics | 1991

Light scattering from glossy coatings on paper.

Thomas R. Lettieri; Egon Marx; Jun-Feng Song; Theodore V. Vorburger

The application of angle-resolved light scattering (ARLS) to the measurement of the surface roughness of glossy coatings on paper was investigated. To this end, ARLS patterns were measured for laser light scattered from several glossy paper samples, and these patterns were compared with those calculated using a theoretical model based on plane-wave scattering from an isotropic rough surface. Mechanical stylus profilometry data for the rms roughnesses and the autocorrelation functions of the coatings were used as input to calculate the patterns. For all the paper samples measured, as well as for all the incidence angles used, there was good agreement between the experimental and the calculated patterns when all the rms roughnesses measured by profilometry were reduced by 30%. The indication from these experiments is that ARLS may be used to determine the roughness parameters of the coatings. As a check on these results, measurements were also performed with a commercial optical surface probe; these data agreed well with both the ARLS and the stylus profilometry results.


Journal of Research of the National Institute of Standards and Technology | 2004

SRM 2460/2461 Standard Bullets and Casings Project

Jun-Feng Song; Eric P. Whitenton; David R. Kelley; Robert A. Clary; Li Ma; Susan M. Ballou; M Ols

The National Institute of Standards and Technology Standard Reference Material (SRM) 2460/2461 standard bullets and casings project will provide support to firearms examiners and to the National Integrated Ballistics Information Network (NIBIN) in the United States. The SRM bullet is designed as both a virtual and a physical bullet profile signature standard. The virtual standard is a set of six digitized bullet profile signatures originally traced from six master bullets fired at the Bureau of Alcohol, Tobacco and Firearms (ATF) and the Federal Bureau of Investigation (FBI). By using the virtual signature standard to control the tool path on a numerically controlled diamond turning machine, 40 SRM bullets were produced. A profile signature measurement system was established for the SRM bullets. The profile signature differences are quantified by the maximum of the cross correlation function and by the signature difference between pairs of compared profile signatures measured on different SRM bullets. Initial measurement results showed high reproducibility for both the measurement system and production process of the SRM bullets. A traceability scheme has been proposed to establish the measurement traceability for nationwide bullet signature measurements to NIST, ATF and FBI. Prototype SRM casings have also been developed.


Journal of Forensic Sciences | 2010

Pilot study of automated bullet signature identification based on topography measurements and correlations.

Wei Chu; Jun-Feng Song; Theodore V. Vorburger; James H. Yen; Susan M. Ballou; Benjamin Bachrach

Abstract:  A procedure for automated bullet signature identification is described based on topography measurements using confocal microscopy and correlation calculation. Automated search and retrieval systems are widely used for comparison of firearms evidence. In this study, 48 bullets fired from six different barrel manufacturers are classified into different groups based on the width class characteristic for each land engraved area of the bullets. Then the cross‐correlation function is applied both for automatic selection of the effective correlation area, and for the extraction of a 2D bullet profile signature. Based on the cross‐correlation maximum values, a list of top ranking candidates against a ballistics signature database of bullets fired from the same model firearm is developed. The correlation results show a 9.3% higher accuracy rate compared with a currently used commercial system based on optical reflection. This suggests that correlation results can be improved using the sequence of methods described here.


Journal of Research of the National Institute of Standards and Technology | 2011

Selecting Valid Correlation Areas for Automated Bullet Identification System Based on Striation Detection

Wei Chu; Jun-Feng Song; Theodore V. Vorburger; Robert M. Thompson; Richard M. Silver

Some automated bullet identification systems calculate a correlation score between two land impressions to measure their similarity. When extracting a compressed profile from the land impression of a fired bullet, inclusion of areas that do not contain valid individual striation information may lead to sub-optimal extraction and therefore may deteriorate the correlation result. In this paper, an edge detection algorithm and selection process are used together to locate the edge points of all tool-mark features and filter out those not corresponding to striation marks. Edge points of the resulting striation marks are reserved and expanded to generate a mask image. By imposing the mask image on the topography image, the weakly striated area(s) are removed from the expressed profile extraction. Using this method, 48 bullets fired from 12 gun barrels of six manufacturers resulted in a higher matching rate than previous studies.


Measurement Science and Technology | 2008

Topography measurements for determining the decay factors in surface replication

Jun-Feng Song; P Rubert; A Zheng; Theodore V. Vorburger

The electro-forming technique is used at National Institute of Standards and Technology (NIST) for the production of standard reference material (SRM) 2461 standard casings to support nationwide ballistics measurement traceability and measurement quality control in the US. In order to ensure that the SRM casings are produced with virtually the same surface topography, it is necessary to test the decay factors of the replication process. Twenty-six replica casings are replicated from the same master casing for the decay factor tests. The NIST topography measurement system is used for measurements and correlations of surface topography. The topography decays are quantified by the cross-correlation function maximum CCFmax. Based on the test, it is expected that 256 SRM casings can be replicated from the same master with CCFmax values higher than 95%.


Journal of Research of the National Institute of Standards and Technology | 1995

MICROFORM CALIBRATION UNCERTAINTIES OF ROCKWELL DIAMOND INDENTERS

Jun-Feng Song; F Rudder; Theodore V. Vorburger; J Smith

National and international comparisons in Rockwell hardness tests show significant differences. Uncertainties in the geometry of the Rockwell diamond indenters are largely responsible for these differences. By using a stylus instrument, with a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated the microform geometric parameters of Rockwell diamond indenters. These calibrations are traceable to fundamental standards. The expanded uncertainties (95 % level of confidence) are ±0.3 μm for the least-squares radius; ±0.01° for the cone angle; and ±0.025° for the holder axis alignment calibrations. Under ISO and NIST guidelines for expressing measurement uncertainties, the calibration and uncertainty calculation procedure, error sources, and uncertainty components are described, and the expanded uncertainties are calculated. The instrumentation and calibration procedure also allows the measurement of profile deviation from the least-squares radius and cone flank straightness. The surface roughness and the shape of the spherical tip of the diamond indenter can also be explored and quantified. Our calibration approach makes it possible to quantify the uncertainty, uniformity, and reproducibility of Rockwell diamond indenter microform geometry, as well as to unify the Rockwell hardness standards, through fundamental measurements rather than by performance comparisons.


Applied Optics | 1993

Autocorrelation functions from optical scattering for one-dimensionally rough surfaces

Egon Marx; Brigitte Leridon; Thomas R. Lettieri; Jun-Feng Song; Theodore V. Vorburger

The relationship between the height autocorrelation function of a one-dimensionally rough surface and the Fourier transform of the intensity distribution of the light scattered by that surface is tested experimentally. The theory is derived by using the Fraunhofer approximation, without recourse to the inconsistent Kirchhoff boundary conditions. In spite of the limitations imposed by the approximations used, the results obtained from optical data agree well with those obtained from stylus data, even for an autocorrelation length as small as the optical wavelength. However, this method should be limited to surfaces with rms roughness smaller than approximately 0.14 times the wavelength of light.

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Theodore V. Vorburger

National Institute of Standards and Technology

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Thomas B. Renegar

National Institute of Standards and Technology

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Li Ma

National Institute of Standards and Technology

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Eric P. Whitenton

National Institute of Standards and Technology

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Robert M. Thompson

National Institute of Standards and Technology

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Susan M. Ballou

National Institute of Standards and Technology

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Wei Chu

National Institute of Standards and Technology

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A Zheng

National Institute of Standards and Technology

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Samuel R. Low

National Institute of Standards and Technology

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