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Featured researches published by K. Shimomura.


IEEE Journal of Quantum Electronics | 1990

Analysis of semiconductor intersectional waveguide optical switch-modulator

K. Shimomura; Yasuharu Suematsu; Shigehisa Arai

Transmission and reflection characteristics and wavelength chirping of a guided mode in a semiconductor intersectional optical switch-modulator are analyzed by considering the electric field-induced refractive index variation along with the absorption loss variation. The refractive index and absorption ratio, alpha /sub p/, is shown to determine the performance of the switch-modulator. A transmission port is suitable for a modulation with a high extinction ratio, low insertion loss, and small wavelength chirping. The insertion loss at the reflection port depends heavily on alpha /sub p/. A low insertion loss and high extinction ratio intersectional optical switch is possible when - alpha /sub p/ is higher than 10, which can be realized with a quantum box structure. >


IEEE Journal of Quantum Electronics | 1992

Operational wavelength range of GaInAs(P)-InP intersectional optical switches using field-induced electrooptic effect in low-dimensional quantum-well structures

K. Shimomura; Shigehisa Arai; Yasuharu Suematsu

Operational wavelength range for low insertion loss and high extinction ratio of GaInAs(P)-InP intersectional optical switches consisting of low-dimensional quantum-well structures, such as quantum-box, quantum-wire, and quantum-film structures, is theoretically analyzed. It is found that superior operation characteristics can be attained with the lower-dimensional quantum-well structure. For instance, an operational wavelength range of around 10 nm for an insertion loss less than 1 dB and an extinction ratio higher than 50 dB can be obtained with the device using a quantum-box structure. >


IEEE Photonics Technology Letters | 1989

Switching operation in OMVPE grown GaInAs/InP MQW intersectional optical switch structures

T. Kikugawa; K. G. Ravikumar; K. Shimomura; A. Izumi; K. Matsubara; Y. Miyamoto; Shigehisa Arai; Yasuharu Suematsu

An intersectional optical switch structure with an intersecting angle of 6 degrees was fabricated on an organometallic vapor-phase epitaxy (OMVPE) grown GaInAs/InP multiple quantum-well (MQW) layered wafer. Switching operation using field-induced refractive index variation was successfully demonstrated at the reverse bias voltage of 8 V for the 1.6 mu m wavelength region. Based on this switching, the field-induced refractive index variation in the QW was estimated as around 1%.<<ETX>>


IEEE Photonics Technology Letters | 1992

A novel integrated-twin-guide (ITG) optical switch with a built-in TIR region

Satoshi Baba; K. Shimomura; Shigehisa Arai

The authors propose a novel integrated-twin-guide (ITG) optical switch with a built-in TIR region to enlarge the spatial separation of output lights, which is suitable for a compact optical switching matrix array. A switching operation was observed in a GaInAsP/InP MQW ITG optical switch utilizing electric-field induced refractive index variation.<<ETX>>


IEEE Photonics Technology Letters | 1992

Low-drive voltage intersectional waveguide optical switch using GaInAs/InP MQW structure

K. Shimomura; T. Aizawa; N. Tanaka; Shigehisa Arai

A low-drive voltage intersectional waveguide optical switch using 1.6 mu m GaInAs/InP MQW (multiple quantum well) structure, which was fabricated by only one-step epitaxial growth of MQW structure followed by a one-step pattern etching of the waveguide is demonstrated. Extinction ratio at the straight port of 9.9 dB and that at the reflection port of 4.4 dB were obtained at an applied voltage of -4 V.<<ETX>>


IEEE Transactions on Electron Devices | 1991

Observation of field-induced refractive index variation in quantum box structure

T. Aizawa; K. Shimomura; Shigehisa Arai; Yasuharu Suematsu

An electric-field-induced refractive index variation in a GaInAs/InP five-layered quantum box structure was observed for the first time. The wavelength dependence of the refractive index variation was measured to confirm the quantum box effect. The size of the GaInAs/InP quantum box was estimated to be (22-30 nm)/sup 2/ with the thickness of 7.5 nm. from the spectral property of the field-induced refractive index variation. The maximum value of the refractive index variation in the quantum box was evaluated to be 7% around 1.52 mu m wavelength at an applied electric field of 8*10/sup 4/ V/Cm.<<ETX>>


Quantum Wells and Superlattices in Optoelectronic Devices and Integrated Optics | 1988

Electric-Field-Induced Refractive Index Change In Gainasp/Inp Mqw Structures

K. Shimomura; K. G. Ravikumar; T. Kikugawa; Shigehisa Arai; Yasuharu Suematsu

Large change in the field induced refractive index is achievable by the use of the MQW structures. The property of which can be advantageously utilized to realize high speed external modulators and switches. The GalnAsP/InP MQW structures was prepared by LPE method and the electric field induced absorption was measured. Reflection of light due to refractive index change as well as absorption coefficient change was observed for the first time. Intersectional optical switch based on this change was also fabricated.


Electronics Letters | 1988

Switching operation in intersectional type field effect MQW optical switch

K. G. Ravikumar; K. Shimomura; T. Kikugawa; A. Izumi; Shigehisa Arai; Yasuharu Suematsu; K. Matsubara


Electronics Letters | 1992

2V drive-voltage switching operation in 1.55 mu m GaInAs/InP MQW intersectional waveguide optical switch

K. Shimomura; N. Tanaka; T. Aizawa; Shigehisa Arai


Optical Communication, 1988. (ECOC 88). Fourteenth European Conference on (Conf. Publ. No.292) | 1988

Optical switching operation due to field induced refractive-index variation in 1.3 mu m GaInAsP/InP MQW structures

T. Kikugawa; K. Shimomura; K. G. Ravikumar; A. Izumi; K. Matsubara; Shigehisa Arai; Yasuharu Suematsu

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Shigehisa Arai

Tokyo Institute of Technology

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Yasuharu Suematsu

Tokyo Institute of Technology

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K. G. Ravikumar

Tokyo Institute of Technology

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T. Kikugawa

Tokyo Institute of Technology

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A. Izumi

Tokyo Institute of Technology

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K. Matsubara

Tokyo Institute of Technology

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T. Aizawa

Tokyo Institute of Technology

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N. Tanaka

Tokyo Institute of Technology

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Satoshi Baba

Tokyo Institute of Technology

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Y. Miyamoto

Tokyo Institute of Technology

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