K. V. Reich
University of Minnesota
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Publication
Featured researches published by K. V. Reich.
Nature Materials | 2016
Ting Chen; K. V. Reich; Nicolaas J. Kramer; Han Fu; Uwe R. Kortshagen; B. I. Shklovskii
To fully deploy the potential of semiconductor nanocrystal films as low-cost electronic materials, a better understanding of the amount of dopants required to make their conductivity metallic is needed. In bulk semiconductors, the critical concentration of electrons at the metal-insulator transition is described by the Mott criterion. Here, we theoretically derive the critical concentration nc for films of heavily doped nanocrystals devoid of ligands at their surface and in direct contact with each other. In the accompanying experiments, we investigate the conduction mechanism in films of phosphorus-doped, ligand-free silicon nanocrystals. At the largest electron concentration achieved in our samples, which is half the predicted nc, we find that the localization length of hopping electrons is close to three times the nanocrystals diameter, indicating that the film approaches the metal-insulator transition.
Physical Review B | 2015
K. V. Reich; Michael Schecter; B. I. Shklovskii
We study potential and electron density depth profiles in accumulation, inversion, and depletion layers in crystals with a large and nonlinear dielectric response such as
ACS Nano | 2016
K. V. Reich; B. I. Shklovskii
{\mathrm{SrTiO}}_{3}
Applied Physics Letters | 2016
K. V. Reich; B. I. Shklovskii
. We describe the lattice dielectric response using the Landau-Ginzburg free energy expansion. In accumulation and inversion layers we arrive at new nonlinear dependencies of the width
ACS Nano | 2017
Trevor A. Petach; K. V. Reich; Xiao Zhang; Kenji Watanabe; Takashi Taniguchi; B. I. Shklovskii; David Goldhaber-Gordon
d
Physical Review B | 2016
Han Fu; K. V. Reich; B. I. Shklovskii
of the electron gas on an applied electric field
Applied Physics Letters | 2017
Felix Trier; K. V. Reich; Dennis Valbjørn Christensen; Yu Zhang; Harry L. Tuller; Yunzhong Chen; B. I. Shklovskii; Nini Pryds
{D}_{0}
Physical Review B | 2016
Han Fu; K. V. Reich; B. I. Shklovskii
. Particularly important is the predicted electron density profile of accumulation layers (including the
Physical Review B | 2015
Han Fu; K. V. Reich; B. I. Shklovskii
{\mathrm{LaAlO}}_{3}/{\mathrm{SrTiO}}_{3}
Physical Review B | 2013
K. V. Reich; Tianran Chen; Al. L. Efros; B. I. Shklovskii
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