Karl D Hobart
Cree Inc.
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Featured researches published by Karl D Hobart.
IEEE Transactions on Electron Devices | 2008
Brett Hull; Joseph J. Sumakeris; Michael J. O'Loughlin; Qingchun Zhang; Jim Richmond; Adrian Powell; Eugene A. Imhoff; Karl D Hobart; Angel Rivera-Lopez; Allen Hefner
The forward and reverse bias dc characteristics, the long-term stability under forward and reverse bias, and the reverse recovery performance of 4H-SiC junction barrier Schottky (JBS) diodes that are capable of blocking in excess of 10 kV with forward conduction of up to 10 A at a forward voltage of less than 3.5 V (at 25degC) are described. The diodes show a positive temperature coefficient of resistance and a stable Schottky barrier height of up to 200degC. The diodes show stable operation under continuous forward current injection at 20 A/cm2 and under continuous reverse bias of 8 kV at 125degC. When switched from a 10-A forward current to a blocking voltage of 3 kV at a current rate-of-fall of 30 A/mus, the reverse recovery time and the reverse recovery charge are nearly constant at 300 ns and 425 nC, respectively, over the entire temperature range of 25degC-175degC.
Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT) | 2014
Andrew D. Koehler; Travis J. Anderson; Marko J. Tadjer; Tatyana I. Feygelson; Jennifer K. Hite; Karl D Hobart; Bradford B. Pate; Francis J. Kub; Charles R. Eddy
GaN high electron mobility transistors (HEMTs) performance is limited by increased channel temperature, particularly resulting from self-heating during high power operation. Topside nanocrystalline diamond (NCD) layers have been integrated on AlGaN/GaN (HEMTs) to improve thermal management. HEMTs with NCD heat-spreading layers exhibit a 20% decrease in peak channel temperature compared to reference HEMTs, measured by Raman thermography, as well as improved sheet carrier density, transconductance, sheet resistance, Hall mobility, on-state resistance, and breakdown voltage. A “gate after diamond” approach is implemented to improve the thermal budget of the deposition process while maintaining the integrity of the Schottky gate electrode in a scalable process. Processing improvements for integrating NCD-capping with the HEMT are being pursued, such as eliminating the SiNx passivation interlayer, such that the NCD film is directly on the AlGaN barrier, as well as a sacrificial gate process. Also, boron doped ...
Archive | 2010
Joshua D. Caldwell; Karl D Hobart; Travis J. Anderson; Francis J. Kub
Archive | 2010
Francis J. Kub; Karl D Hobart; Charles R. Eddy; Michael A. Mastro; Travis J. Anderson
Archive | 2014
Francis J. Kub; Travis J. Anderson; Karl D Hobart
Archive | 2009
Eugene A. Imhoff; Francis J. Kub; Karl D Hobart
Archive | 2013
Rajinder Sandhu; Vincent Gambin; Benjamin Poust; Ioulia Smorchkova; Gregg Lewis; Raffi Elmadjian; Danny Li; Craig Geiger; Ben Heying; Mike Wojtowicz; Aaron Oki; Tatyana I. Feygelson; Karl D Hobart; Bradford B. Pate; Joe Tabeling; Elah Bozorg-Grayeli; Kenneth E. Goodson
2014 ECS and SMEQ Joint International Meeting (October 5-9, 2014) | 2014
Travis J. Anderson; Karl D Hobart; Marko J. Tadjer; Andrew D. Koehler; Tatyana I. Feygelson; Bradford B. Pate; Jennifer K. Hite; Fritz J. Kub; Charles R. Eddy
PRiME 2016/230th ECS Meeting (October 2-7, 2016) | 2016
Andrew D. Koehler; Marko J. Tadjer; Travis J. Anderson; P. Chojecki; Karl D Hobart; Francis J. Kub
PRiME 2016/230th ECS Meeting (October 2-7, 2016) | 2016
Travis J. Anderson; Andrew D. Koehler; Boris N. Feigelson; Karl D Hobart; Francis J. Kub