Katsumi Ochiai | Researchain

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Publication

Featured researches published by Katsumi Ochiai.

Archive | 1997

Variable delay circuit

Yokichi Hayashi; Hiroshi Tsukahara; Katsumi Ochiai; Mashuhiro Yamada; Naoyoshi Watanabe

Archive | 1999

Timing generator for semiconductor test system

Katsumi Ochiai; Toshiaki Misono

Archive | 1999

Semiconductor testing device

Toshiaki Misono; Katsumi Ochiai; 俊明御園; 克己落合

Archive | 1999

Semiconductor test system

Katsumi Ochiai; Noriyuki Masuda

Archive | 2005

High frequency delay circuit and test apparatus

Katsumi Ochiai; Takashi Sekino

Archive | 1991

Variable delay circuit with very small delay

Katsumi Ochiai; Hiroshi Tsukahara; 寛塚原; 克己落合

Archive | 2004

Format control circuit and semiconductor test device

Katsumi Ochiai

Archive | 1999

Clock generator for a system for testing semiconductors

Katsumi Ochiai; Toshiaki Misono

Archive | 2004

Hochfrequenz-Verzögerungsschaltung und Prüfvorrichtung High frequency delay circuit and Tester

Katsumi Ochiai; Takashi Sekino

Archive | 2004

High frequency delay circuit and testing

Katsumi Ochiai; Takashi Sekino

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Collaboration

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Toshiaki Misono

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Takashi Sekino

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Hiroshi Tsukahara

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Mashuhiro Yamada

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Naoyoshi Watanabe

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Noriyuki Masuda

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Yokichi Hayashi

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