Takashi Sekino

Ultra hi-speed pin-electronics and test station using GaAs IC

This paper describes the pin-electronics technique applied in a high speed/high pin count test head which targets testing quarter micron high speed CMOS VLSI devices. The pin-electronics operate up to 1 GHz with the following characteristics; timing error<20 ps, rise/fall time<200 ps, minimum pulse width<500 ps, output voltage range -2.0 V to 3.5 V and output voltage amplitude =3.5 V. This was achieved by reducing to 1/5 the GaAs specific problem of changing gain in the low frequency range. The pin-electronics were implemented as a Driver Comparator Multichip Module in order to achieve a high pin count test head (1280 pins max).

An application of photoconductive switch for high-speed testing

This paper describes a high speed test technique for CMOS device with I/O terminals using photoconductive switch (PC-switch). Since the switching speed of the PC-switch is high, it can be utilized by fast test systems. The PC-switch uses indium phosphide (InP), and has an on-resistance 40-60 /spl Omega/, a switching time of 1 ns, a capacitance between terminals of 31 fF, and a break down voltage 9.5 V. The PC-switch can be used with a laser diode (LD) to implement an optical driven line switch (ODLS). The performance of ODLS is suitable for testing devices with high speed I/O pins. The ROUND TRIP DELAY of less than 500 ps is achievable by assembling the I/O switch on a performance board in close proximity to the device pin. The I/O switching characteristics of this PC-switch have been verified by simulation and experimentation.