Kazuhiro Hoshino

Electromigration after stress-induced migration test in quarter-micron Al interconnects

A sequential test of stress-induced migration and electromigration was employed to evaluate Al interconnect reliability. We investigated electromigration after storage testing for stress-induced failure and found a deterioration in electromigration lifetime of quarter-micron Al interconnects caused by slit-like voids generated during the storage test.<<ETX>>

Noise Detection and Reduction for Image Sensor by Time Domain Autocorrelation Function Method

The present paper describes noise detection and reduction for an imaging system by a method of autocorrelation of pixel data change as a function of time. The random noise level could be detected for each pixel using the proposed method. An algorithm proposed for determining the noise level, and calculating the pixel value by the autocorrelation function value reduced the calculation cost. The proposed method is effective for reducing noise in real time image processing.

A Model and Verification for Temperature Dependency of the Noise in Large Size CCD Image Sensor

This paper describes the temperature dependence of the noise of a large size CCD image sensor used in a digital single-lens reflex camera. To clarify the temperature dependence of the noise, the CCD was cooled directly with a Peltier device. The change in noise after black correction of the actual experiment result was consistent with the Shockley-Read-Hall (SRH) model, confirming the validity of this model. Moreover, because the residual noise after black correction increased with temperature, the main factor is considered to be random noise. A comparison result of the two dimensional noise simulations as imaging picture and the actual image in the noise based on the SRH model. 2-D image simulations based on the SRH model agreed well with the experiment data, again confirming the model validity