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Featured researches published by Kazumi Koyama.


Microelectronics Reliability | 1985

Field programmable device with circuitry for detecting poor insulation between adjacent word lines

Kouji Ueno; Toshitaka Fukushima; Kazumi Koyama

A field programmable device comprises regular word lines, regular bit lines, regular memory cells connected at the intersections of the regular word lines and the regular bit lines, at least one test word line adjacent to one of the regular bit lines, and alternately arranged conducting and nonconducting test memory cells arranged at the intersections of the test bit lines and the regular word lines. According to the invention, for the purpose of determining poor insulation between the word lines, the test bit line and the regular word line are insulated by an insulating layer in each nonconducting test memory cell.


Archive | 1980

Programmable read-only memory device

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno


Archive | 1980

Programming circuit for permanently storing data in a programmable read only memory

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno; Tamio Miyamura; Yuichi Kawabata


Archive | 1979

Field programmable device having test provisions for fault detection

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno


Archive | 1980

Field programmable device with internal dynamic test circuit

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno


Archive | 1981

Tristate output buffer with high-impedance state responsive to increase in power supply voltage

Kazumi Koyama; Toshitaka Fukushima; Yuichi Kawabata


Archive | 1980

Semiconductor memory device with address signal level setting.

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno; Tamio Miyamura; Yuichi Kawabata


Archive | 1980

A programming circuit for a programmable read only memory

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno; Tamio Miyamura; Yuichi Kawabata


Archive | 1984

PROGRAMMABLE MEMORY DEVICE PROVIDED WITH TEST MEANS

Toshitaka Fukushima; Kazumi Koyama; Kouki Ueno; Tamio Miyamura; Yuichi Kawabata


Archive | 1980

Field programmable device with test-bits

Toshitaka Fukushima; Kazumi Koyama; Kouji Ueno

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