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Featured researches published by Keith R. Lykke.


The Astrophysical Journal | 2012

The Pan-STARRS1 Photometric System

John L. Tonry; Christopher W. Stubbs; Keith R. Lykke; Peter Doherty; I. S. Shivvers; W. S. Burgett; Ken Chambers; Klaus-Werner Hodapp; Nick Kaiser; R. P. Kudritzki; E. A. Magnier; Jeffrey S. Morgan; P. A. Price; R. J. Wainscoat

The Pan-STARRS1 survey is collecting multi-epoch, multi-color observations of the sky north of declination –30° to unprecedented depths. These data are being photometrically and astrometrically calibrated and will serve as a reference for many other purposes. In this paper, we present our determination of the Pan-STARRS1 photometric system: g P1, r P1, i P1, z P1, y P1, and w P1. The Pan-STARRS1 photometric system is fundamentally based on the Hubble Space Telescope Calspec spectrophotometric observations, which in turn are fundamentally based on models of white dwarf atmospheres. We define the Pan-STARRS1 magnitude system and describe in detail our measurement of the system passbands, including both the instrumental sensitivity and atmospheric transmission functions. By-products, including transformations to other photometric systems, Galactic extinction, and stellar locus, are also provided. We close with a discussion of remaining systematic errors.


Photochemistry and Photobiology | 2003

Quantum Yield of the Iodide–Iodate Chemical Actinometer: Dependence on Wavelength and Concentration¶

Ronald O. Rahn; Mihaela I. Stefan; James R. Bolton; Evan Goren; Ping-Shine Shaw; Keith R. Lykke

Abstract The quantum yield (QY) of the iodide–iodate chemical actinometer (0.6 M KI–0.1 M KIO3) was determined for irradiation between 214 and 330 nm. The photoproduct, triiodide, was determined from the increase in absorbance at 352 nm, which together with a concomitant measurement of the UV fluence enabled the QY to be calculated. The QY at 254 nm was determined to be 0.73 ± 0.02 when calibration was carried out against a National Institute of Standards and Technology traceable radiometer or photometric device. At wavelengths below 254 nm the QY increased slightly, leveling off at ∼0.80 ± 0.05, whereas above 254 nm the QY decreases linearly with wavelength, reaching a value of 0.30 at 284 nm. In addition, the QY was measured at different iodide concentrations. There is a slight decrease in QY going from 0.6 to 0.15 M KI, whereas below 0.15 M KI the QY drops off sharply, decreasing to 0.23 by 0.006 M KI. Calibration of the QY was also done using potassium ferrioxalate actinometry to measure the irradiance. These results showed a 20% reduction in QY between 240 and 280 nm as compared with radiometry. This discrepancy suggests that the QY of the ferrioxalate actinometer in this region of the spectrum needs reexamination.


Applied Optics | 2006

Simple Spectral Stray Light Correction Method for Array Spectroradiometers

Yuqin Zong; Steven W. Brown; B. Carol Johnson; Keith R. Lykke; Yoshi Ohno

A simple, practical method has been developed to correct a spectroradiometers response for measurement errors arising from the instruments spectral stray light. By characterizing the instruments response to a set of monochromatic laser sources that cover the instruments spectral range, one obtains a spectral stray light signal distribution matrix that quantifies the magnitude of the spectral stray light signal within the instrument. By use of these data, a spectral stray light correction matrix is derived and the instruments response can be corrected with a simple matrix multiplication. The method has been implemented and validated with a commercial CCD-array spectrograph. Spectral stray light errors after the correction was applied were reduced by 1-2 orders of magnitude to a level of approximately 10(-5) for a broadband source measurement, equivalent to less than one count of the 15-bit-resolution instrument. This method is fast enough to be integrated into an instruments software to perform real-time corrections with minimal effect on acquisition speed. Using instruments that have been corrected for spectral stray light, we expect significant reductions in overall measurement uncertainties in many applications in which spectrometers are commonly used, including radiometry, colorimetry, photometry, and biotechnology.


Applied Optics | 2006

Facility for spectral irradiance and radiance responsivity calibrations using uniform sources

Steven W. Brown; George P. Eppeldauer; Keith R. Lykke

Detectors have historically been calibrated for spectral power responsivity at the National Institute of Standards and Technology by using a lamp-monochromator system to tune the wavelength of the excitation source. Silicon detectors can be calibrated in the visible spectral region with combined standard uncertainties at the 0.1% level. However, uncertainties increase dramatically when measuring an instruments spectral irradiance or radiance responsivity. We describe what we believe to be a new laser-based facility for spectral irradiance and radiance responsivity calibrations using uniform sources (SIRCUS) that was developed to calibrate instruments directly in irradiance or radiance mode with uncertainties approaching or exceeding those available for spectral power responsivity calibrations. In SIRCUS, the emission from high-power, tunable lasers is introduced into an integrating sphere using optical fibers, producing uniform, quasi-Lambertian, high-radiant-flux sources. Reference standard irradiance detectors, calibrated directly against national primary standards for spectral power responsivity and aperture area measurement, are used to determine the irradiance at a reference plane. Knowing the measurement geometry, the source radiance can be readily determined as well. The radiometric properties of the SIRCUS source coupled with state-of-the-art transfer standard radiometers whose responses are directly traceable to primary national radiometric scales result in typical combined standard uncertainties in irradiance and radiance responsivity calibrations of less than 0.1%. The details of the facility and its effect on primary national radiometric scales are discussed.


Journal of Chemical Physics | 1984

Spectroscopy and dynamics of the dipole-bound state of acetaldehyde enolate

Roy D. Mead; Keith R. Lykke; W. C. Lineberger; Jeffrey Marks; John I. Brauman

Ultrahigh‐resolution photodetachment spectroscopy of acetaldehyde enolate negative ion has revealed ∼50 narrow resonances near threshold, corresponding to excitation to a diffuse state in which the electron is weakly bound by the field of the molecular dipole. A complete analysis of rotational transitions between the ground valence state and the excited dipole‐bound state has been carried out, yielding spectroscopic constants and geometries for both states. In analogy to Rydberg states, the structure of the ‘‘neutral core’’ of the dipole‐bound state is like that of the neutral radical. The dependence of autodetachment lifetimes upon the rotational quantum numbers of the dipole‐bound state has been measured. Bound levels of the dipole‐bound anion state are readily electric‐field detached. The selection rules and dynamics of autodetachment from the dipole‐bound state are discussed.


Astrophysical Journal Supplement Series | 2010

PRECISE THROUGHPUT DETERMINATION OF THE PanSTARRS TELESCOPE AND THE GIGAPIXEL IMAGER USING A CALIBRATED SILICON PHOTODIODE AND A TUNABLE LASER: INITIAL RESULTS

Christopher W. Stubbs; Peter Doherty; Claire E. Cramer; Gautham S. Narayan; Yorke J. Brown; Keith R. Lykke; John T. Woodward; John L. Tonry

We have used a precision-calibrated photodiode as the fundamental metrology reference in order to determine the relative throughput of the PanSTARRS telescope and the Gigapixel imager, from 400 nm to 1050 nm. Our technique uses a tunable laser as a source of illumination on a transmissive flat-field screen. We determine the full-aperture system throughput as a function of wavelength, including (in a single integral measurement) the mirror reflectivity, the transmission functions of the filters and the corrector optics, and the detector quantum efficiency, by comparing the light seen by each pixel in the CCD array to that measured by a precision-calibrated silicon photodiode. This method allows us to determine the relative throughput of the entire system as a function of wavelength, for each pixel in the instrument, without observations of celestial standards. We present promising initial results from this characterization of the PanSTARRS system, and we use synthetic photometry to assess the photometric perturbations due to throughput variation across the field of view.


Metrologia | 2000

NIST facility for Spectral Irradiance and Radiance Responsivity Calibrations with Uniform Sources

Steven W. Brown; George P. Eppeldauer; Keith R. Lykke

A laser-based facility has been developed to provide high-flux, monochromatic, Lambertian radiation over the spectral range 0.2 µm to 18 µm. The facility was designed to reduce the uncertainties in a variety of radiometric applications, including irradiance and radiance responsivity calibrations. The operational characteristics of the facility are discussed and the results of detector responsivity calibrations over the spectral range 0.406 µm to 0.920 µm are presented.


Journal of Chemical Physics | 1991

Delayed electron emission from photoexcited C60

Peter Wurz; Keith R. Lykke

Delayed emission of electrons is observed after absorption of several photons in the wavelength range from 212.8 to 532 nm. This phenomenon is explained by thermionic emission of electrons from hot C60 molecules. Photoelectrons and photoions are recorded under the same experimental conditions for further evidence.


Carbon | 1992

Fullerenes and giant fullerenes: Synthesis, separation, and mass spectrometric characterization☆

Deborah Holmes Parker; Kuntal Chatterjee; Peter Wurz; Keith R. Lykke; Michael J. Pellin; Leon M. Stock; John C. Hemminger

Abstract We report a detailed procedure for the production of fullerenes and giant fullerenes in very high yield. Our high yields are obtained by a combination of fine control of the arc gap distance, optimal convection in the apparatus and careful Soxhlet extraction with selected solvents. Our extraction and mass spectrometry results confirm the existence of giant fullerenes with masses in excess of 3000 amu. We find that 94% of the soot can be extracted in N-methyl-2-pyrrolidinone, indicating that a large portion of the soot has a molecular fullerene-type structure. We also present a new one-step method for the rapid separation of pure C 60 directly from raw soot. An overview of recent results in the area of synthesis and purification of fullerenes and giant fullerenes is also presented.


Review of Scientific Instruments | 1995

New instrument for microbeam analysis incorporating submicron imaging and resonance ionization mass spectrometry

Z. Ma; R. N. Thompson; Keith R. Lykke; Michael J. Pellin; Andrew M. Davis

A new reflectron time‐of‐flight mass spectrometer for surface analysis has been developed that incorporates a Schwarzschild all‐reflecting microscope. The instrument is configured for secondary ion mass spectrometry and secondary neutral mass spectrometry using either ion beam bombardment or laser ablation for sample atomization. The sample viewing and imaging system of this instrument enables in situ laser microanalysis with a lateral resolution below 1 μm. The major advantages of using a Schwarzschild objective include good lateral resolution, easy design, low cost, complete achromatism, and both viewing the sample and extracting secondary or photoions normal to its surface. The instrument has a mass resolution of m/Δm≥2000 and is capable of measuring elemental and isotopic compositions at trace levels using resonance ionization. The isotopic ratios of trace concentrations of Ti in μm size SiC grains separated from meteorites were measured. The extremely low ablation laser power used in the above experi...

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Steven W. Brown

National Institute of Standards and Technology

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Ping-Shine Shaw

National Institute of Standards and Technology

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John T. Woodward

National Institute of Standards and Technology

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George P. Eppeldauer

National Institute of Standards and Technology

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Howard W. Yoon

National Institute of Standards and Technology

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Bettye C. Johnson

National Institute of Standards and Technology

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Uwe Arp

National Institute of Standards and Technology

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Allan W. Smith

National Institute of Standards and Technology

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