Keizo Aoyama
Fujitsu
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Publication
Featured researches published by Keizo Aoyama.
Microelectronics Reliability | 1987
Keizo Aoyama; Teruo Seki; Takahik Yamauchi
In a static semiconductor memory device incorporating redundancy memory cells (CR0, CR1, . . . ), a connecting/disconnecting circuit is linked between a power supply terminal (VCC) and one of bit lines (B0, B0, . . . ), thereby reducing or cutting off a current flowing through a defective memory cell.
Archive | 1989
Keizo Aoyama
Archive | 1983
Eiji Noguchi; Keizo Aoyama
Archive | 1986
Keizo Aoyama
Archive | 1984
Keizo Aoyama; Teruo Seki; Takahiko Yamauchi
Archive | 1983
Takeshi Sampei; Norio Miyahara; Tadanobu Nikaido; Hiroaki Sato; Keizo Aoyama
Archive | 1987
Keizo Aoyama
Archive | 1982
Takahiko Yamauchi; Teruo Seki; Keizo Aoyama
Archive | 1983
Keizo Aoyama; Takahiko Yamauchi; Teruo Seki
Archive | 1988
Keizo Aoyama
