Kenneth MacLean

Electrical Control of Spin Relaxation in a Quantum Dot

We demonstrate electrical control of the spin relaxation time T1 between Zeeman-split spin states of a single electron in a lateral quantum dot. We find that relaxation is mediated by the spin-orbit interaction, and by manipulating the orbital states of the dot using gate voltages we vary the relaxation rate W identical withT1(-1) by over an order of magnitude. The dependence of W on orbital confinement agrees with theoretical predictions, and from these data we extract the spin-orbit length. We also measure the dependence of W on the magnetic field and demonstrate that spin-orbit mediated coupling to phonons is the dominant relaxation mechanism down to 1 T, where T1 exceeds 1 s.

Energy-Dependent Tunneling in a Quantum Dot

We present measurements of the rates for an electron to tunnel on and off a quantum dot, obtained using a quantum point contact charge sensor. The tunnel rates show exponential dependence on drain-source bias and plunger gate voltages. The tunneling process is shown to be elastic, and a model describing tunneling in terms of the dot energy relative to the height of the tunnel barrier quantitatively describes the measurements.

Spin-dependent tunneling of single electrons into an empty quantum dot

Using real-time charge sensing and gate pulsing techniques we measure the ratio of the rates for tunneling into the excited and ground spin states of a single-electron quantum dot at an AlGaAs/GaAs interface in a magnetic field parallel to the interface. We find that the ratio decreases with increasing magnetic field until tunneling into the excited spin state is completely suppressed. However, we find that by adjusting the voltages on the surface gates to change the orbital configuration of the dot, we can restore tunneling into the excited spin state and that the ratio reaches a maximum when the dot is symmetric.

Measuring charge transport in a thin solid film using charge sensing.

We measure charge transport in a hydrogenated amorphous silicon (a-Si:H) thin film using a nanometer scale silicon MOSFET as a charge sensor. This charge detection technique makes possible the measurement of extremely large resistances even in the presence of blocking contacts. At high temperatures, where the resistance of the a-Si:H is not too large, the charge detection measurement agrees with a direct measurement of current. The device geometry allows us to probe both the field effect and dispersive transport in the a-Si:H using charge sensing and to extract the density of states near the Fermi energy.

Contact-Independent Measurement of Electrical Conductance of a Thin Film with a Nanoscale Sensor

Contact effects are a common impediment to electrical measurements throughout the fields of nanoelectronics, organic electronics, and the emerging field of graphene electronics. We demonstrate a novel method of measuring electrical conductance in a thin film of amorphous germanium that is insensitive to contact effects. The measurement is based on the capacitive coupling of a nanoscale metal-oxide-semiconductor field-effect transistor (MOSFET) to the thin film so that the MOSFET senses charge diffusion in the film. We tune the contact resistance between the film and contact electrodes and show that our measurement is unaffected. With the MOSFET, we measure the temperature and field dependence of the conductance of the amorphous germanium, which are fit to a model of variable-range hopping. The device structure enables both a contact-independent and a conventional, contact-dependent measurement, which makes it possible to discern the effect of the contacts in the latter measurement. This measurement method can be used for reliable electrical characterization of new materials and to determine the effect of contacts on conventional electron transport measurements, thus guiding the choice of optimal contact materials.

Toward the manipulation of a single spin in an AlGaAs/GaAs single-electron transistor

Single-electron transistors (SETs) are attractive candidates for spin qubits. An AlGaAs/GaAs SET consists of a confined two-dimensional droplet of electrons, called an artificial atom or quantum dot, coupled by tunnel barriers to two conducting leads. Controlling the voltages on the lithographic gates that define the quantum dot allows us to confine a single electron in the dot, as well as to adjust the tunnel barriers to the leads. By applying a magnetic field, we can split the spin-up and spin-down states of the electron by an energy |g|μBB; the goal is to utilize coherent superpositions of these spin states to construct a qubit. We will discuss our attempts to observe electron spin resonance (ESR) in this system by applying magnetic fields at microwave frequencies. Observation of ESR would demonstrate that we can manipulate a single spin and allow us to measure the decoherence time T2*.

The Effect of Electrostatic Screening on a Nanometer Scale Electrometer

We investigate the effect of electrostatic screening on a nanoscale silicon MOSFET electrometer. We find that screening by the lightly doped p-type substrate, on which the MOSFET is fabricated, significantly affects the sensitivity of the device. We are able to tune the rate and magnitude of the screening effect by varying the temperature and the voltages applied to the device, respectively. We show that despite this screening effect, the electrometer is still very sensitive to its electrostatic environment, even at room temperature.

The effect of surface conductance on lateral gated quantum devices in Si/SiGe heterostructures

Quantum dots in Si/SiGe heterostructures are expected to have relatively long electron spin decoherence times, because of the low density of nuclear spins and the weak coupling between nuclear and electron spins. We provide experimental evidence suggesting that electron motion in a conductive layer parallel to the two-dimensional electron gas, possibly resulting from the donors used to dope the Si quantum well, is responsible for the well-known difficulty in achieving well-controlled dots in this system. Charge motion in the conductive layer can cause depletion on large length scales, making electron confinement in the dot impossible, and can give rise to noise that can overwhelm the single-electron charging signal. Results of capacitance versus gate bias measurements to characterize this conductive layer are presented.