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Dive into the research topics where Kentarou Matsuura is active.

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Featured researches published by Kentarou Matsuura.


Japanese Journal of Applied Physics | 2016

Improving crystalline quality of sputtering-deposited MoS2 thin film by postdeposition sulfurization annealing using (t-C4H9)2S2

Seiya Ishihara; Yusuke Hibino; Naomi Sawamoto; Kohei Suda; Takumi Ohashi; Kentarou Matsuura; Hideaki Machida; Masato Ishikawa; Hiroshi Sudoh; Hitoshi Wakabayashi; Atsushi Ogura

A sputtered MoS2 thin film is a candidate for realizing enhancement-mode MoS2 metal–oxide–semiconductor field-effect transistors (MOSFETs). However, there are some sulfur vacancies in the film, which degrade the device performance. In this study, we performed postdeposition sulfurization annealing (PSA) on a sputtered MoS2 thin film in order to complement sulfur vacancies, and we investigated the fundamental properties of the MoS2 film. As a result, a high-quality crystalline 10-layer MoS2 film with an ideal stoichiometric composition was obtained at a relatively low process temperature (500 °C). The MoS2 film had an indirect bandgap of 1.36 eV and a high Hall mobility compared with the as-deposited sputtered MoS2 film.


Japanese Journal of Applied Physics | 2016

Properties of single-layer MoS2 film fabricated by combination of sputtering deposition and post deposition sulfurization annealing using (t-C4H9)2S2

Seiya Ishihara; Yusuke Hibino; Naomi Sawamoto; Kohei Suda; Takumi Ohashi; Kentarou Matsuura; Hideaki Machida; Masato Ishikawa; Hiroshi Sudoh; Hitoshi Wakabayashi; Atsushi Ogura

The fabrication of a high-quality single-layer MoS2 film was achieved at a sufficiently low temperature of 500 °C by the combination of sputtering deposition and post deposition sulfurization annealing. Fabrication only by sputtering produces unintentionally sulfur-deficient nonstoichiometric films with poor crystalline quality in nature, making it difficult to fabricate atomically thin sputtered MoS2 films, especially with a single layer. From the results of the sulfurization annealing, sulfur deficiencies in the film were fully complemented and the crystalline quality, especially in-plane symmetry, was dramatically improved. The quasi-layered structure of the sputtered-MoS2 film led to the success in achieving low-temperature sulfurization annealing. Moreover, the film had large area uniformity, accurate thickness controllability, a direct bandgap of 1.86 eV, and an extremely high visible transmittance of more than 97%. Therefore, we consider that the fabrication technique will contribute to realizing MoS2 display applications such as a low-power-consumption thin-film-transistor liquid crystal display.


ECS Journal of Solid State Science and Technology | 2016

Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS2 Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast

Seiya Ishihara; Yusuke Hibino; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hideaki Machida; Masato Ishikawa; Hitoshi Wakabayashi; Atsushi Ogura


The Japan Society of Applied Physics | 2018

MoS 2(1-x) Te 2x Deposition by co-Sputtering and Post-Deposition Sulfurization using (t-C 4 H 9 ) 2 S 2

Yusuke Hibino; Seiya Ishihara; Yuya Oyanagi; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hideaki Machida; Masato Ishikawa; Hiroshi Sudoh; Hitoshi Wakabayashi; Atsushi Ogura


Japanese Journal of Applied Physics | 2018

Investigation on Mo1− x W x S2 fabricated by co-sputtering and post-deposition sulfurization with (t-C4H9)2S2

Yusuke Hibino; Seiya Ishihara; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hideaki Machida; Masato Ishikawa; Hiroshi Sudoh; Hitoshi Wakabayashi; Atsushi Ogura


233rd ECS Meeting (May 13-17, 2018) | 2018

Suppression of Sulfur Desorption of High-Temperature Sputtered MoS 2 Film By Applying DC Bias

Yusuke Hibino; Seiya Ishihara; Yuya Oyanagi; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hitoshi Wakabayashi; Atsushi Ogura


The Japan Society of Applied Physics | 2017

Investigation of Mo 1-x W x S 2 Fabricated by Co-Sputtering and Post-Deposition Sulfurization with (t-C 4 H 9 ) 2 S 2

Yusuke Hibino; Seiya Ishihara; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hideaki Machida; Hiroshi Sudoh; Hitoshi Wakabayashi; Atsushi Ogura


The Japan Society of Applied Physics | 2017

Barrier thickness dependence of current in sputtering MoS 2 film with tunnel contacts

Naoki Hayakawa; Iriya Muneta; Takumi Ohashi; Kentarou Matsuura; Jun'ichi Shimizu; Kuniyuki Kakushima; Kazuo Tsutsui; Hitoshi Wakabayashi


The Japan Society of Applied Physics | 2017

Investigating Crystal Orientation of Sputtering Deposited MoS 2 Thin Film by Analyzing Scaling Behavior of The Surface Roughness

Seiya Ishihara; Bunta Ohno; Yusuke Hibino; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hitoshi Wakabayashi; Atsushi Ogura


The Japan Society of Applied Physics | 2017

Suppression of sulfur desorption of high-temperature sputtered MoS 2 film by applying DC bias

Seiya Ishihara; Yusuke Hibino; Naomi Sawamoto; Takumi Ohashi; Kentarou Matsuura; Hitoshi Wakabayashi; Atsushi Ogura

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Takumi Ohashi

Tokyo Institute of Technology

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Hitoshi Wakabayashi

Tokyo Institute of Technology

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