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Dive into the research topics where Kevin Kjoller is active.

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Featured researches published by Kevin Kjoller.


Applied Spectroscopy | 2011

Spatial Differentiation of Sub-Micrometer Domains in a Poly(hydroxyalkanoate) Copolymer Using Instrumentation that Combines Atomic Force Microscopy (AFM) and Infrared (IR) Spectroscopy

Curtis Marcott; Michael Lo; Kevin Kjoller; Craig Prater; Isao Noda

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument (AFM-IR) capable of producing sub-micrometer spatial resolution IR spectra and absorption images. This new capability enables the spectroscopic characterization of micro-domain-forming polymers at levels not previously possible. Films of poly(3-hydroxybutyrate-co-3-hydroxyhexanoate) were solution cast on ZnSe prisms, followed by melting and annealing to generate crystalline microdomains of different sizes. A tunable IR laser generating pulses of the order of 10 ns was used for excitation of the sample films. Short duration thermomechanical waves, due to infrared absorption and resulting thermal expansion, were studied by monitoring the resulting excitation of the contact resonance modes of the AFM cantilever. Dramatic differences in the room-temperature IR spectra are observed in the 1200–1300 cm−1 range as a function of position on a spatial scale of less than one micrometer. This spectral region is particularly sensitive to the polymer backbone conformation. Such dramatic spectral differences have also been observed previously in bulk IR measurements, but only by comparing room-temperature spectra with ones collected at higher temperatures. Less dramatic, but significant, AFM-IR spectral differences are observed in the carbonyl stretching region around 1720 cm−1 as a function of location on the sample. Two overlapping, but relatively sharp, carbonyl bands are observed near 1720 cm−1 in more crystalline regions of the polymer, while a broader carbonyl stretching band appears centered at 1740 cm−1 in the more amorphous regions. Using this spectral region, it is possible to monitor the development of polymer crystalline structures at varying distances from a nucleation site, where the site was generated by bringing a heated AFM tip close to a specific location to locally anneal the sample.


Molecular Pharmaceutics | 2012

Nanoscale Mid-Infrared Evaluation of the Miscibility Behavior of Blends of Dextran or Maltodextrin with Poly(vinylpyrrolidone)

Bernard Van Eerdenbrugh; Michael Lo; Kevin Kjoller; Curtis Marcott; Lynne S. Taylor

Determining the extent of miscibility of amorphous components is of great importance for certain pharmaceutical systems, in particular for polymer-polymer and polymer-small molecule blends. In this study, the application of standard atomic force microscopy (AFM) measurements combined with nanoscale mid-infrared (mid-IR) spectroscopy was explored to evaluate miscibility in binary polymer blends. The miscibility characteristics of a set of 50/50 (w/w) polymer blends comprising of poly(vinylpyrrolidone) (PVP) with dextran or maltodextrin (DEX) of varying molecular weights (MWs) were investigated. Standard AFM characterization results show good agreement with inferences drawn from differential scanning calorimetry (DSC) analysis in terms of forming either single or two phase systems. AFM analysis also provided insight into the microstructure of the two phase systems and how domain sizes varied as a function of polymer MWs. Nanoscale mid-IR evaluation of the blends, performed by collecting local mid-IR spectra or spectral maps, provided an extra dimension of information about the dependence of polymer MWs on chemical composition of the different phases. AFM, combined with nanoscale mid-infrared analysis, thus appears to be a promising technique for the evaluation of miscibility in certain pharmaceutical blends.


Experimental Dermatology | 2013

Nanoscale infrared (IR) spectroscopy and imaging of structural lipids in human stratum corneum using an atomic force microscope to directly detect absorbed light from a tunable IR laser source

Curtis Marcott; Michael Lo; Kevin Kjoller; Guive Balooch; Gustavo S. Luengo

An atomic force microscope (AFM) and a tunable infrared (IR) laser source have been combined in a single instrument (AFM‐IR) capable of producing ~200‐nm spatial resolution IR spectra and absorption images. This new capability enables IR spectroscopic characterization of human stratum corneum at unprecendented levels. Samples of normal and delipidized stratum corneum were embedded, cross‐sectioned and mounted on ZnSe prisms. A pulsed tunable IR laser source produces thermomechanical expansion upon absorption, which is detected through excitation of contact resonance modes in the AFM cantilever. In addition to reducing the total lipid content, the delipidization process damages the stratum corneum morphological structure. The delipidized stratum corneum shows substantially less long‐chain CH2‐stretching IR absorption band intensity than normal skin. AFM‐IR images that compare absorbances at 2930/cm (lipid) and 3290/cm (keratin) suggest that regions of higher lipid concentration are located at the perimeter of corneocytes in the normal stratum corneum.


International Journal of Pharmaceutics | 2015

Resonance enhanced AFM-IR: A new powerful way to characterize blooming on polymers used in medical devices

Alexandre Dazzi; Johanna Saunier; Kevin Kjoller; Najet Yagoubi

In this paper we demonstrated the application of resonance enhanced AFM-IR to the study of the medical device surfaces. Surface state is one of the most important parameter on the biocompatibility of an implantable medical device. By using this new technique, it was possible to obtain with high resolution topographic and chemical maps and to identify the chemical nature of very thin deposit observed on the surface. This was illustrated with the case of lubricant exudation on polyurethane used in the making of implantable catheters.


Applied Spectroscopy | 2014

Localization of Human Hair Structural Lipids Using Nanoscale Infrared Spectroscopy and Imaging

Curtis Marcott; Michael Lo; Kevin Kjoller; Françoise Fiat; Nawel Baghdadli; Guive Balooch; Gustavo Luengo

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument (AFM-IR) capable of producing IR spectra and absorption images at a sub-micrometer spatial resolution. This new device enables human hair to be spectroscopically characterized at levels not previously possible. In particular, it was possible to determine the location of structural lipids in the cuticle and cortex of hair. Samples of human hair were embedded, cross-sectioned, and mounted on ZnSe prisms. A tunable IR laser generating pulses of the order of 10 ns was used to excite sample films. Short duration thermomechanical waves, due to infrared absorption and resulting thermal expansion, were studied by monitoring the resulting excitation of the contact resonance modes of the AFM cantilever. Differences are observed in the IR absorbance intensity of long-chain methylene-containing functional groups between the outer cuticle, middle cortex, and inner medulla of the hair. An accumulation of structural lipids is clearly observed at the individual cuticle layer boundaries. This method should prove useful in the future for understanding the penetration mechanism of substances into hair as well as elucidating the chemical nature of alteration or possible damage according to depth and hair morphology.


Microscopy Today | 2012

Applications of AFM-IR—Diverse Chemical Composition Analyses at Nanoscale Spatial Resolution

Curtis Marcott; Michael Lo; Kevin Kjoller; Craig Prater; David P. Gerrard

The combination of infrared (IR) spectroscopy and atomic force microscopy (AFM) has produced a technique, called AFM-IR, which is becoming one of the most important recent developments in the field of IR spectroscopy and chemical imaging. Conventional Fourier transform infrared (FT-IR) microspectroscopy is well established as a technique for chemical characterization of small samples down to the 3–10 mm size range. This diffraction-imposed size limit has prevented the application of FT-IR microspectroscopy to smaller analysis regions that are relevant to analysis problems in polymer materials and the life sciences. The nanoIR™ instrument (Anasys Instruments, Santa Barbara, CA) described here uses an AFM probe as the IR absorbance sensor and hence breaks through the diffraction limit to attain spatial resolution improvements of between one and two orders of magnitude beyond previous techniques. Thus, the AFM-IR concept provides chemical information from nanoscale regions of polymers and other organic materials. This article describes the physics behind the technique, followed by results from several applications.


Materials Today | 2010

Nanoscale infrared spectroscopy

Craig Prater; Kevin Kjoller; Roshan Shetty

In the early days of scanning probe microscopy, researchers and instrumentation developers were often postulating about the future and, perhaps one day, the advent of the “lab-on-a-tip.” While the technology has seen the development of highly spatially resolved topography imaging coupled to a series of different physical measurements, it is only recently that is has been possible to perform chemical characterization measurements with infrared spectroscopy on the nanoscale. The enabling technique is known as nanoIR™.


Microscopy Today | 2015

Interface Analysis of Composites Using AFM-Based Nanoscale IR and Mechanical Spectroscopy

Curtis Marcott; Michael Lo; Eoghan Dillon; Kevin Kjoller; Craig Prater

Introduction Composite materials are becoming increasingly important in today’s world, where lighter materials with enhanced properties are in high demand. Carbon fibers, carbon black, graphite, graphine, carbon nanotubes, quartz particles, nanocrystalline cellulose, and clays are among the materials being added to bulk polymers in an effort to achieve better properties and performance. It is important not only to determine the size and locations of nanoparticle inclusions in bulk polymers, but also to characterize the important interphase region where the components interact. This article describes how an atomic force microscope (AFM) combined with infrared (IR) spectroscopy and mechanical spectroscopy can be used to not only locate and determine the size of inclusions, but also to characterize them chemically and mechanically. After introducing AFM-IR spectroscopy and Lorentz contact resonance (LCR) methodology for obtaining nanoscale mechanical spectra and images, results from three specific applications will be discussed. These applications include an isotactic poly(propylene) film with added SiO2 particles, a polymer with carbon black particles incorporated under different processing conditions, and a carbon-fiber/epoxy composite material. The first example uses AFM-IR spectroscopy and IR absorbance imaging. The second example employs LCR mechanical property spectroscopy and imaging. The final example includes a combination of AFM-IR and LCR to obtain corroborating information about the important interphase region between carbon fiber and epoxy domains.


Proceedings of SPIE | 2012

Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy

Michael Lo; Craig Prater; Alexandre Dazzi; Roshan Shetty; Kevin Kjoller

Atomic Force Microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument capable of producing sub-micron spatial resolution IR spectra and images. This new capability enables the sprectroscopic characterization of microdomain-forming polymers at levels not previously possible. Films of poly(3-hydroxybutyrate-co-3-hydroxyheanoate) were solution cast on ZnSe prisms. Dramitic differences in the IR spectra are observed in the 1200-1300 cm-1 range as a funstion of position on a spatial scale of less than one micron. This spectral region is particularly sensitive to the polymer crystallinity, enabling the identification of crystalline and amorphous domains within a single spherulite of this polymer.


Beilstein Journal of Nanotechnology | 2017

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

Gheorghe Stan; Richard S. Gates; Qichi Hu; Kevin Kjoller; Craig Prater; Kanwal Jit Singh; Ebony Mays; Sean W. King

The exploitation of nanoscale size effects to create new nanostructured materials necessitates the development of an understanding of relationships between molecular structure, physical properties and material processing at the nanoscale. Numerous metrologies capable of thermal, mechanical, and electrical characterization at the nanoscale have been demonstrated over the past two decades. However, the ability to perform nanoscale molecular/chemical structure characterization has only been recently demonstrated with the advent of atomic-force-microscopy-based infrared spectroscopy (AFM-IR) and related techniques. Therefore, we have combined measurements of chemical structures with AFM-IR and of mechanical properties with contact resonance AFM (CR-AFM) to investigate the fabrication of 20–500 nm wide fin structures in a nanoporous organosilicate material. We show that by combining these two techniques, one can clearly observe variations of chemical structure and mechanical properties that correlate with the fabrication process and the feature size of the organosilicate fins. Specifically, we have observed an inverse correlation between the concentration of terminal organic groups and the stiffness of nanopatterned organosilicate fins. The selective removal of the organic component during etching results in a stiffness increase and reinsertion via chemical silylation results in a stiffness decrease. Examination of this effect as a function of fin width indicates that the loss of terminal organic groups and stiffness increase occur primarily at the exposed surfaces of the fins over a length scale of 10–20 nm. While the observed structure–property relationships are specific to organosilicates, we believe the combined demonstration of AFM-IR with CR-AFM should pave the way for a similar nanoscale characterization of other materials where the understanding of such relationships is essential.

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Bernard Van Eerdenbrugh

Katholieke Universiteit Leuven

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