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Advances in Resist Technology and Processing IV | 1987

Highly Sensitized Electron-Beam Resist By Means Of A Quenching Process

Fumiaki Shigemitsu; Kinya Usuda; Takashi Tsuchiya; T. Nomaki; Y. Kato; K. Kirita; T. Shinozaki

It was found that the sensitivity of poly(2,2,2-trifluoroethyl-a-chloroacrylate) (EBR-9) is greatly enhanced to around 0.1μC/ci when EBR-9 is quenched at 160°C/sec after baking. This sensitivity is about 27 times higher than that obtained by cooling at 65t/min in an atmosphere of still air. This result indicates that the sensitivity of an electron-beam resist depends on the cooling rate. In particular, a change in the cooling rate within the glass-transition region of EBR-9 leads to a drastic change in sensitivity. One method of thermal analysis, differential scanning calorimetry(DSC), made it clear that the slower the resist is cooled through the glass-transition region, the more enthalpy relaxation is produced. Furthermore, it was proved that a resist with much reduced enthalpy indicates a lower solubility rate, and that the annealing method was valid to estimate the reduced enthalpy using DSC. It is concluded that the quenched resist becomes more sensitive as a result of the enhanced solubility because of little enthalpy relaxation.


Archive | 1986

Automatic developing apparatus

Yasuo Matsuoka; Kinya Usuda; Michiro Takano


Archive | 1984

Method and apparatus for forming resist pattern

Yoshihide Kato; Kei Kirita; Toshiaki Shinozaki; Fumiaki Shigemitsu; Kinya Usuda; Takashi Tsuchiya


Archive | 1986

Pattern developing process and apparatus therefor

Hiroyuki Hasebe; Masayuki Suzuki; Yasuo Matsuoka; Takashi Tsuchiya; Kinya Usuda


Archive | 1990

Method of forming pattern and apparatus for implementing the same

Satoshi Masuda; Fumiaki Shigemitsu; Kinya Usuda


Archive | 1986

Verfahren und vorrichtung zum entwickeln eines musters Method and device for developing a pattern

Hiroyuki Hasebe; Masayuki Suzuki; Yasuo Matsuoka; Takashi Tsuchiya; Kinya Usuda


Archive | 1986

Automatic developing means.

Yasuo Matsuoka; Kinya Usuda; Michiro Takano


Archive | 1986

Method and apparatus for developing a pattern

Hiroyuki Hasebe; Masayuki Suzuki; Yasuo Matsuoka; Takashi Tsuchiya; Kinya Usuda


Archive | 1986

Automatische entwickelvorrichtung. Automatic developing means.

Yasuo Matsuoka; Kinya Usuda; Michiro Takano


Archive | 1984

Verfahren und Vorrichtung zur Herstellung von Schutzlackbildern. Method and apparatus for the production of resist images.

Yoshihide Kato; Kei Kirita; Toshiaki Shinozaki; Fumiaki Shigemitsu; Kinya Usuda; Takashi Tsuchiya

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