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Krause Gunnar

Infineon Technologies

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Publication

Featured researches published by Krause Gunnar.

Archive | 2002

Verfahren und Vorrichtung zum Einlesen und zur Überprüfung der zeitlichen Lage von aus einem zu testenden Speicherbaustein ausgelesenen Datenantwortsignalen

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Luepke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2003

Testschaltung zum Testen einer synchronen Schaltung

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Luepke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2002

System zum Test schneller synchroner Halbleiterschaltungen

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Lupke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2000

Address generator for generating addresses for on-chip trimming circuit, has memory latch stages for operation as counter synchronized to control signal or clock signal or as shift register

Krause Gunnar; Spirkl Wolfgang

Archive | 2000

Dynamische Halbleiter-Speichervorrichtung und Verfahren zur Initialisierung einer dynamischen Halbleiter-Speichervorrichtung

Krause Gunnar

Archive | 2006

System zum Test von schnellen integrierten Digitalschaltungen und BOST-Halbleiterschaltungsbaustein als Testschaltkreis

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Lupke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2002

System zum Test von schnellen integrierten Digitalschaltungen, insbesondere Halbleiterspeicherbausteinen

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Lupke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2001

Adresszähler zur Adressierung von synchronen hochfrequenten Digitalschaltungen, insbesondere Speicherbauelementen

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Luepke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2006

System zum Test integrierter digitaler Halbleiterbauelemente

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Lupke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

Archive | 2002

Integrated digital semiconductor components testing system e.g. for semiconductor memories, has built outside self-test module that adjusts to time requirement of semiconductor to be tested

Ernst Wolfgang; Krause Gunnar; Kuhn Justus; Lupke Jens; Mueller Jochen; Poechmueller Peter; Schittenhelm Michael

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Kuhn Justus

Infineon Technologies

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Mueller Jochen

Infineon Technologies

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Ernst Wolfgang

Infineon Technologies

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Poechmueller Peter

Infineon Technologies

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Schittenhelm Michael

Infineon Technologies

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Luepke Jens

Infineon Technologies

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Lupke Jens

Infineon Technologies

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Klehn Bernd

Infineon Technologies

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Spirkl Wolfgang

Infineon Technologies

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Benedix Alexander

Infineon Technologies

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