Kyuha Chung
Dow Corning
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MRS Proceedings | 2000
Thomas A. Deis; Chandan Kumar Saha; Eric Scott Moyer; Kyuha Chung; Youfan Liu; Mike Spaulding; John Albaugh; Wei Chen; Jeff Bremmer
Low-k dielectric films have been developed using a new silsesquioxane based chemistry that allows both the electrical and mechanical properties to be tuned to specific values. By controlling the composition and film processing conditions of spin-on formulations, dielectric constants in the range 1.5 to 3.0 are obtained with modulus values that range from 1 to 30 GPa. The modulus and dielectric constant are tuned by controlling porosity, which varies from 0 to >60%, and final film composition which varies from HSiO 3/2 to SiO 4/2 . The spin-on formulation includes hydrogen silsesquioxane resin and solvents. Adjusting the ratio of solvents to resin in the spin-on formulation controls porosity. As-spun films are treated with ammonia and moisture to oxidize the resin and form a mechanically self-supporting gel. Solvent removal and further conversion to a more “silica-like” composition occur during thermal curing at temperatures of 400 to 450°C. The final film composition was controlled through both room temperature oxidation and thermal processing. Final film properties are optimized for a balance of electrical, mechanical and thermal properties to meet the specific requirements of a wide range of applications. Processed films exhibit no stress corrosion cracking or delamination upon indentation, with indenter penetration exceeding the film thickness, and followed by exposure to water at room temperature. Films also exhibit high adhesive strength (> 60MPa) and low moisture absorption. Processing conditions, composition and properties of thin are discussed.
international interconnect technology conference | 1999
Eric Scott Moyer; Kyuha Chung; Mike Spaulding; Thomas A. Deis; R. Boisvert; Chandan Kumar Saha; Jeffrey N. Bremmer
Low dielectric constant films have been developed by a new silsesquioxane based chemistry with k values approaching 1.5. A process has been developed which allows the control of the electrical and mechanical properties of the films. In addition, thick, crack-free films can be prepared which are suitable for copper damascene processes.
Archive | 1990
Kyuha Chung; Anthony Pope Wright; Ming-Hsiung Yeh
Archive | 1992
Randall Gene Schmidt; William Patrick Brady; Gary Allen Vincent; Kyuha Chung
Archive | 1998
Kyuha Chung; Eric Scott Moyer; Michael John Spaulding
Archive | 1999
Bianxiao Zhong; Russell Keith King; Kyuha Chung; Shizhong Zhang
Archive | 1999
Bianxiao Zhong; Russell Keith King; Kyuha Chung; Shizhong Zhang
Archive | 1995
Kyuha Chung; Gary Rex Homan; Raymond Lee Tabler
Archive | 2000
Bianxiao Zhong; Russel Keith King; Kyuha Chung; Shizhong Zhang
Archive | 1999
Bianxiao Zhong; Russell Keith King; Kyuha Chung; Shizhong Zhang