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Dive into the research topics where Kyuha Chung is active.

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Featured researches published by Kyuha Chung.


MRS Proceedings | 2000

Ultra Low-K Inorganic Silsesquioxane Films with Tunable Electrical and Mechanical Properties

Thomas A. Deis; Chandan Kumar Saha; Eric Scott Moyer; Kyuha Chung; Youfan Liu; Mike Spaulding; John Albaugh; Wei Chen; Jeff Bremmer

Low-k dielectric films have been developed using a new silsesquioxane based chemistry that allows both the electrical and mechanical properties to be tuned to specific values. By controlling the composition and film processing conditions of spin-on formulations, dielectric constants in the range 1.5 to 3.0 are obtained with modulus values that range from 1 to 30 GPa. The modulus and dielectric constant are tuned by controlling porosity, which varies from 0 to >60%, and final film composition which varies from HSiO 3/2 to SiO 4/2 . The spin-on formulation includes hydrogen silsesquioxane resin and solvents. Adjusting the ratio of solvents to resin in the spin-on formulation controls porosity. As-spun films are treated with ammonia and moisture to oxidize the resin and form a mechanically self-supporting gel. Solvent removal and further conversion to a more “silica-like” composition occur during thermal curing at temperatures of 400 to 450°C. The final film composition was controlled through both room temperature oxidation and thermal processing. Final film properties are optimized for a balance of electrical, mechanical and thermal properties to meet the specific requirements of a wide range of applications. Processed films exhibit no stress corrosion cracking or delamination upon indentation, with indenter penetration exceeding the film thickness, and followed by exposure to water at room temperature. Films also exhibit high adhesive strength (> 60MPa) and low moisture absorption. Processing conditions, composition and properties of thin are discussed.


international interconnect technology conference | 1999

Ultra low dielectric constant silsesquioxane based resin [ILDs]

Eric Scott Moyer; Kyuha Chung; Mike Spaulding; Thomas A. Deis; R. Boisvert; Chandan Kumar Saha; Jeffrey N. Bremmer

Low dielectric constant films have been developed by a new silsesquioxane based chemistry with k values approaching 1.5. A process has been developed which allows the control of the electrical and mechanical properties of the films. In addition, thick, crack-free films can be prepared which are suitable for copper damascene processes.


Archive | 1990

Heat-curable silicone compositions having improved bath life

Kyuha Chung; Anthony Pope Wright; Ming-Hsiung Yeh


Archive | 1992

Silicone pressure sensitive adhesives having enhanced adhesion to low energy substrates

Randall Gene Schmidt; William Patrick Brady; Gary Allen Vincent; Kyuha Chung


Archive | 1998

Method of forming coatings

Kyuha Chung; Eric Scott Moyer; Michael John Spaulding


Archive | 1999

Nanoporous silicone resins having low dielectric constants

Bianxiao Zhong; Russell Keith King; Kyuha Chung; Shizhong Zhang


Archive | 1999

Soluble silicone resin compositions having good solution stability

Bianxiao Zhong; Russell Keith King; Kyuha Chung; Shizhong Zhang


Archive | 1995

Aerosol suppressant compositions for silicone coatings

Kyuha Chung; Gary Rex Homan; Raymond Lee Tabler


Archive | 2000

Soluble silicone resin compositions

Bianxiao Zhong; Russel Keith King; Kyuha Chung; Shizhong Zhang


Archive | 1999

Nanoporous silicone resins having low dielectric constants and method for preparation

Bianxiao Zhong; Russell Keith King; Kyuha Chung; Shizhong Zhang

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