L. Fraiwan
University of Akron
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Publication
Featured researches published by L. Fraiwan.
IEEE Transactions on Instrumentation and Measurement | 2004
George C. Giakos; L. Fraiwan; N. Patnekar; S. Sumrain; George B. Mertzios; S. Periyathamby
The design of an optical polarimetric imaging system, aimed at detecting cracks or structural defects on the surface of rotating aircraft engine shafts, is presented. The experimental results clearly indicate that high signal-to-noise ratio signals can be obtained, so that it minimizes the use of processing techniques.
instrumentation and measurement technology conference | 2001
George C. Giakos; Samir Chowdhury; N. Shah; K. Mehta; S. Sumrain; A. G. Passerini; N. Patnekar; Edward A. Evans; L. Fraiwan; Okechukwu C. Ugweje; Richard Nemer
In this study, experimental results on the signal quality of a multimedia imaging detector, operating on gaseous solid state ionization principles, with specific emphasis on single X-ray exposure dual-energy radiography, are presented. The results of this study indicate that the multimedia detector technology exhibits excellent signal characteristics suitable for a large number of imaging applications.
IEEE Transactions on Instrumentation and Measurement | 2005
George C. Giakos; N. Patnekar; S. Sumrain; L. Fraiwan; V. Kumar
The detection characteristics of an indoor-optical communication system, which utilizes infrared radiation as carrier, has been explored and enhanced for telemedicine and wireless local area network applications. The novelty of the presented technique consists of the fact that multipath dispersion can be reduced under controlled polarization link setup. The design of such a network is based on the specifications set by the IEEE 802.11 standard.
IEEE Transactions on Instrumentation and Measurement | 2008
George C. Giakos; S. Sukumar; K. Valluru; P. Bathini; S. Atreya Paturi; K. Ambadipudi; D. Wagenar; V. Adya; M. Reddy; L. Fraiwan; Daniel B. Sheffer
The novelty of this paper is indicated by a series of experimental measurements aimed at enhancing the detectability of targets immersed in scattered solutions. The experimental results clearly show that polarimetric images of superior quality can be obtained by doping the background surrounding the target with polar or high-dielectric molecules, yielding an enhanced contrast and specificity of the target. In addition, it is observed that degree of linear polarization (DOLP) images exhibit superior image characteristics with respect to total intensity (S0) images with the increase in the concentration of the optical scattering agents.
Proceedings of the 2006 IEEE International Workshop on Imagining Systems and Techniques (IST 2006) | 2006
George C. Giakos; S. Sukumar; P. Bathini; S.A. Paturi; K. Ambadipudi; D. Wagenar; V. Adya; M. Reddy; S. Sumrain; L. Fraiwan; Daniel B. Sheffer
The novelty of this study consists in a series of experimental observations, indicating an improvement of the detectability of targets immersed in scattered solutions, by obtaining enhanced DOLP backscattered images over non-polarized backscattered images, with increasing the concentration of the scattering agent, therefore, the opacity of the medium.
IEEE Transactions on Instrumentation and Measurement | 2006
George C. Giakos; A. Medithe; S. Sumrain; S. Sukumar; L. Fraiwan; A. Orozco
The purpose of this paper is to present novel optical imaging techniques, based on all active optical polarimetric principles, for efficient detection, inspection, and monitoring of semiconductor components, microelectronic components, and spacecraft structures. The experimental results of this paper indicate that the polarimetric imaging techniques are highly efficient in detecting defects on the semiconductor structures when compared to nonpolarimetric techniques
instrumentation and measurement technology conference | 2002
George C. Giakos; N. Patnekar; L. Fraiwan; J. Carletta; S. Sumrain; J. Rogers; C. Gangloff; B. Igleheart; J. Zhao; F. Krach
This paper is aimed to enhance the signal detection parameters necessary for designing an optical wireless local access network (WLAN), based on wavelet transform analysis. The design of such a network is based on the specifications set by the IEEE 802.11 standard. A short-range IR communication technique that is cost effective and requires less power considerations is presented. Signals detected under line-of-sight geometry are shown.
instrumentation and measurement technology conference | 2002
George C. Giakos; L. Fraiwan; N. Patnekar; S. Sumrain; J. Carletta; F. Krach
The design of an optical polarimetric imaging system, aimed to detect cracks or structural defects on the surface of rotating aircraft engine shafts, is presented. The experimental results clearly indicate that high signal-to-noise ratio signals can be obtained, without further data processing.
Proceedings of the 2006 IEEE International Workshop on Imagining Systems and Techniques (IST 2006) | 2006
George C. Giakos; L. Fraiwan; S. Sumrain; S. Sukumar; P. Bathini; D. Wagenar; S.A. Paturi; V. Adya; M. Reddy; K. Ambadipudi; K. Valluru; Daniel B. Sheffer
The novelty of this study consists on the design and exploration of the performance of an efficient active sensoroptical polarimetric system aimed to perform real-time detection and 1-d imaging of surface defects. The design of such imaging sensor system would be, among other factors, of paramount significance for remote robotic rover inspections, and repairs of spacecraft structures including thermal protection systems for surface damage. Experimental results indicate an enhancement of the backscattered imaging signal parameters.
instrumentation and measurement technology conference | 2005
George C. Giakos; A. Medithe; S. Sumrain; S. Sukumar; L. Fraiwan; A. Orozco
The purpose of this study is to present novel optical imaging techniques, based on all active Muller matrix optical polarimetric principles, for efficient detection, inspection and monitoring of semiconductor and microelectronic components, and spacecraft structure. The experimental results of this study indicate that the polarimetric imaging techniques are highly efficient in detecting defects on semiconductor structures when compared to nonpolarimetric techniques