L. López-Conesa

Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering

We use Raman scattering to investigate the size distribution, built-in strains and the crystalline degree of Si-nanoclusters (Si-nc) in high-quality Si-rich oxynitride/SiO2 multilayered samples obtained by plasma enhanced chemical vapor deposition and subsequent annealing at 1150 °C. An initial structural characterization of the samples was performed by means of energy-filtered transmission electron microscopy (EFTEM) and X-ray diffraction (XRD) to obtain information about the cluster size and the presence of significant amounts of crystalline phase. The contributions to the Raman spectra from crystalline and amorphous Si were analyzed by using a phonon confinement model that includes the Si-nc size distribution, the influence of the matrix compressive stress on the clusters, and the presence of amorphous Si domains. Our lineshape analysis confirms the existence of silicon precipitates in crystalline state, in good agreement with XRD results, and provides also information about the presence of a large com...

Absence of quantum confinement effects in the photoluminescence of Si3N4–embedded Si nanocrystals

Superlattices of Si-rich silicon nitride and Si3N4 are prepared by plasma-enhanced chemical vapor deposition and, subsequently, annealed at 1150 °C to form size-controlled Si nanocrystals (Si NCs) embedded in amorphous Si3N4. Despite well defined structural properties, photoluminescence spectroscopy (PL) reveals inconsistencies with the typically applied model of quantum confined excitons in nitride-embedded Si NCs. Time-resolved PL measurements demonstrate 105 times faster time-constants than typical for the indirect band structure of Si NCs. Furthermore, a pure Si3N4 reference sample exhibits a similar PL peak as the Si NC samples. The origin of this luminescence is discussed in detail on the basis of radiative defects and Si3N4 band tail states in combination with optical absorption measurements. The apparent absence of PL from the Si NCs is explained conclusively using electron spin resonance data from the Si/Si3N4 interface defect literature. In addition, the role of Si3N4 valence band tail states as...

Structural and optical properties of size controlled Si nanocrystals in Si3N4 matrix: The nature of photoluminescence peak shift

Superlattices of Si3N4 and Si-rich silicon nitride thin layers with varying thickness were prepared by plasma enhanced chemical vapor deposition. After high temperature annealing, Si nanocrystals w ...

Carrier transport and electroluminescence efficiency of erbium-doped silicon nanocrystal superlattices

A detailed study of transport phenomena and electroluminescence of erbium-doped silicon-rich oxide/silicon oxide superlattices is presented. Extended states conduction is thermally activated from Poole-Frenkel traps located at silicon nanocrystals or its interface. These traps provide bulk limited conduction at low and medium electric fields. In contrast, under high electric fields, conduction is governed by trap-assisted tunneling of electrons from the electrode to the active layer conduction band. Superlattice electroluminescence efficiency at 1.5 μm and injected electron energy distribution in the conduction band are evaluated and compared to a silicon dioxide and a silicon-rich oxide single layer. This work sheds light on the implementation of alternative electroluminescent device architectures with strong emphasis in the hot electron engineering.

Annealing temperature and barrier thickness effect on the structural and optical properties of silicon nanocrystals/SiO2 superlattices

The effect of the annealing temperature and the SiO2 barrier thickness of silicon nanocrystal (NC)/SiO2 superlattices (SLs) on their structural and optical properties is investigated. Energy-filtered transmission electron microscopy (TEM) revealed that the SL structure is maintained for annealing temperatures up to 1150 °C, with no variation on the nanostructure morphology for different SiO2 barrier thicknesses. Nevertheless, annealing temperatures as high as 1250 °C promote diffusion of Si atoms into the SiO2 barrier layers, which produces larger Si NCs and the loss of the NC size control expected from the SL approach. Complementary Raman scattering measurements corroborated these results for all the SiO2 and Si-rich oxynitride layer thicknesses. In addition, we observed an increasing crystalline fraction up to 1250 °C, which is related to a decreasing contribution of the suboxide transition layer between Si NCs and the SiO2 matrix due to the formation of larger NCs. Finally, photoluminescence measuremen...

Silicon nanocrystals in SiNx/SiO2 hetero-superlattices: The loss of size control after thermal annealing

Superlattices containing 3 nm thick silicon rich silicon nitride sublayers and 3 nm and 10 nm thick SiO2 barriers were prepared by plasma enhanced chemical vapor deposition. Despite the as-prepared samples represented a well-kept multilayer structure with smooth interfaces, the high temperature annealing resulted in the total destruction of multilayer structure in the samples containing 3 nm SiO2 barriers. Energy-filtered transmission electron microscopy images of these samples indicated a silicon nanoclusters formation with sizes of 2.5–12.5 nm, which were randomly distributed within the structure. Although in the sample with 10 nm SiO2 barriers some fragments of the multilayer structure could be still observed after thermal annealing, nevertheless, the formation of large nanocrystals with diameters up to 10 nm was confirmed by dark field transmission electron microscopy. Thus, in contrast to the previously published results, the expected size control of silicon nanocrystals was lost. According to the FTIR results, the thermal annealing of SiNx/SiO2 superlattices led to the formation of silicon nanocrystals in mostly oxynitride matrix. Annealed samples demonstrated a photoluminescence peak at 885 nm related to the luminescence of silicon nanocrystals, as confirmed by time-resolved photoluminescence measurements. The loss of nanocrystals size control is discussed in terms of the migration of oxygen atoms from the SiO2 barriers into the silicon rich silicon nitride sublayers. A thermodynamic mechanism responsible for this process is proposed. According to this mechanism, the driving force for the oxygen migration is the gain in the configuration entropy related to the relative arrangements of oxygen and nitrogen atoms.

Insight into the Compositional and Structural Nano Features of AlN/GaN DBRs by EELS-HAADF

III-V nitride (AlGa)N distributed Bragg reflector devices are characterized by combined high-angle annular dark-field (HAADF) and electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope. Besides the complete structural characterization of the AlN and GaN layers, the formation of AlGaN transient layers is revealed using Vegard law on profiles of the position of the bulk plasmon peak maximum. This result is confirmed by comparison of experimental and simulated HAADF intensities. In addition, we present an advantageous method for the characterization of nano-feature structures using low-loss EELS spectrum image (EEL-SI) analysis. Information from the materials in the sample is extracted from these EEL-SI at high spatial resolution.The log-ratio formula is used to calculate the relative thickness, related to the electron inelastic mean free path. Fitting of the bulk plasmon is performed using a damped plasmon model (DPM) equation. The maximum of this peak is related to the chemical composition variation using the previous Vegard law analysis. In addition, within the context of the DPM, information regarding the structural properties of the material can be obtained from the lifetime of the oscillation. Three anomalous segregation regions are characterized, revealing formation of metallic Al islands.

Absorption and emission of silicon nanocrystals embedded in SiC: Eliminating Fabry-Pérot interference

Silicon nanocrystals embedded in SiC are studied by spectrophotometry and photoluminescence (PL) spectroscopy. Absorptivities are found to be affected by residual Fabry-Perot interference arising from measurements of reflection and transmission at locations of different film thickness. Multiple computational and experimental methods to avoid these errors in thin film measurements, in general, are discussed. Corrected absorptivity depends on the quantity of Si embedded in the SiC but is independent of the Si crystallinity, indicating a relaxation of the k-conservation criterion for optical transitions in the nanocrystals. Tauc gaps of 1.8–2.0 and 2.12 eV are determined for Si nanoclusters and SiC, respectively. PL spectra exhibit a red-shift of ∼100 nm per nm nominal Si nanocluster diameter, which is in agreement with quantum confinement but revealed to be an artifact entirely due to Fabry-Perot interference. Several simple experimental methods to diagnose or avoid interference in PL measurements are devel...

Structural and optical properties of Al-Tb/SiO2 multilayers fabricated by electron beam evaporation

Light emitting Al-Tb/SiO2 nanomultilayers (NMLs) for optoelectronic applications have been produced and characterized. The active layers were deposited by electron beam evaporation onto crystalline silicon substrates, by alternatively evaporating nanometric layers of Al, Tb, and SiO2. After deposition, all samples were submitted to an annealing treatment for 1 h in N2 atmosphere at different temperatures, ranging from 700 to 1100 °C. Transmission electron microscopy confirmed the NML structure quality, and by complementing the measurements with electron energy-loss spectroscopy, the chemical composition of the multilayers was determined at the nanoscopic level. The average composition was also measured by X-ray photoelectron spectroscopy (XPS), revealing that samples containing Al are highly oxidized. Photoluminescence experiments exhibit narrow emission lines ascribed to Tb3+ ions in all samples (both as-deposited and annealed ones), together with a broadband related to SiO2 defects. The Tb-related emiss...

Atomistic modelling and high resolution electron microscopy simulations of CeO2 nanoparticles

In cerium oxide nanoparticles, the facets exposed control their reactivity and catalytic behavior and hence their performance in applications such as three-way catalysis, gas sensors, or solid fuel cells. Thus, the precise characterization of the cerium oxide facets exposed is crucial. In the present work, the geometry of branched cerium oxide nanoparticles, obtained by means of ligand-controlled overgrowth, is determined through the comparison between High Resolution Transmission Electron Microscopy (HRTEM) experimental and simulated images. Two possible 3D structures, corresponding to octapod and tetrapod geometries, were suggested from a preliminary examination of the experimental HRTEM images. A comparative analysis of the gray scale intensity profiles of the simulated and experimental HRTEM images was then performed. This method proved capable of discriminating between the two proposed geometries, showing CeO2 nanoparticles to have an octapod geometry. The obtained results were further confirmed by comparing High Angular Dark Field experimental and simulated images of the nanoparticles. This method can be suitable whenever 3D-Tomographic reconstruction is not feasible in the TEM, for instance, in the case of highly beam sensitive materials.In cerium oxide nanoparticles, the facets exposed control their reactivity and catalytic behavior and hence their performance in applications such as three-way catalysis, gas sensors, or solid fuel cells. Thus, the precise characterization of the cerium oxide facets exposed is crucial. In the present work, the geometry of branched cerium oxide nanoparticles, obtained by means of ligand-controlled overgrowth, is determined through the comparison between High Resolution Transmission Electron Microscopy (HRTEM) experimental and simulated images. Two possible 3D structures, corresponding to octapod and tetrapod geometries, were suggested from a preliminary examination of the experimental HRTEM images. A comparative analysis of the gray scale intensity profiles of the simulated and experimental HRTEM images was then performed. This method proved capable of discriminating between the two proposed geometries, showing CeO2 nanoparticles to have an octapod geometry. The obtained results were further confirmed by c...