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Dive into the research topics where Lambert Stals is active.

Publication


Featured researches published by Lambert Stals.


Mikrochimica acta. Supplementum | 1996

QUANTITATIVE ANALYSIS OF THE COMPOUND LAYER OF PLASMA NITRIDED PURE IRON

J. D’Haen; Marc D’Olieslaeger; Luc De Schepper; Lambert Stals

Pure iron is plasma nitrided in a low pressure triode ion plating equipment. During this process a compound layer, containing different Fe-N phases depending on the plasma process parameters used, is formed at the surface.


Archive | 1998

Method and apparatus for local temperature sensing for use in performing high resolution in-situ parameter measurements

Lambert Stals; Luc De Schepper; Jean Roggen; Ward De Ceuninck


Archive | 1996

Method for local temperature sensing for use in performing high resolution in-situ parameter measurements

Lambert Stals; Luc De Schepper; Jean Roggen; Ward De Ceuninck


ESREF '93: European symposium on reliability of electron devices, failure physics and analysis | 1994

The use of early resistance and early TCR changes to predict the reliability of on-chip interconnects

D'Haeger; Herwig Stulens; Ward De Ceuninck; Luc De Schepper; L. Tielemans; G. Gallopyn; P Depauw; Lambert Stals


VOM-Info | 2002

Recente ontwikkelingen in de synthese van deklagen uit de dampfase en uit vloeibare elektrolyten

Jean-Pierre Celis; Jan Fransaer; Marc De Bonte; E. Wieers; M. Van Stappen; Lambert Stals; W Lauwerens


Archive | 2001

Synthesis and characterisation of undoped and P-doped CVD diamond films for optical and electronic applications

Kristien Meykens; Milos Nesladek; Ken Haenen; Lambert Stals


Archive | 2001

Synthesis and characterisation of CVD diamond films

Kristien Meykens; Milos Nesladek; Ken Haenen; Lambert Stals


Archive | 1999

Optical spectroscopic study of n-type diamond

Milos Nesladek; Kristien Meykens; Ken Haenen; Lambert Stals; Satoshi Koizumi; Tokuyuki Teraji


Archive | 1998

New approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffraction

Bart Meert; C. Quaeyhaegens; G. Knuyt; Herman Janssen; Lambert Stals


Archive | 1997

Critical issues in hard PVD and PA-CVD coatings

Lambert Stals; Milos Nesladek; C. Quaeyhaegens

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Jean Roggen

Katholieke Universiteit Leuven

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Ceuninck Ward De

Katholieke Universiteit Leuven

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Schepper Luc De

Katholieke Universiteit Leuven

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Jan Fransaer

Katholieke Universiteit Leuven

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Jean-Pierre Celis

Catholic University of Leuven

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