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Dive into the research topics where Luis A. Bonet is active.

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Featured researches published by Luis A. Bonet.


international test conference | 1990

Test features of the MC145472 ISDN U-transceivers

Luis A. Bonet; J. Ganger; Jim Girardeau; Carlos A. Greaves; Matthew A. Pendleton; David Yatim

The design of a single-chip implementation of a 2B1Q ISDN (integrated services digital network) U transceiver that meets the ANSI T1.601 standards has been completed. The MC145472 was designed with testability in mind and to be consistent with Motorolas design-for-manufacturability goals. The authors describe in detail the design-for-testability techniques specifically intended for the IC manufacturer production test and other ad hoc test/diagnostic structures for the customer to use in evaluating system performance. A global test strategy for testing the ISDN U transceiver is presented. The test features have been used extensively not only for testing the device in the production environment but also for conducting evaluations and design verification experiments during the chip debugging phase. The test features described are well integrated with the architecture of the chip, thus minimizing incremental cost.<<ETX>>


international test conference | 1988

Testability features of a 32 kbps ADPCM transcoder

Luis A. Bonet

Motorolas MC 145532 ADPCM (adaptive digital pulse-code-modulation) transcoder described is a 16-pin CMOS VLSI application specific digital signal processor (DSP) that implements in full-duplex mode the ANSI (T1.301-1987) standard algorithm for 32-kb/s ADPCM. The application is illustrated of structured test techniques, such as scan path and signature analysis, which are used to enhance the testability of this VLSI signal processor. To perform in real time the numerous computations required by the algorithm, the MC 145532 contains a DSP engine that executes microcode instructions at a 10 MHz rate. The MC145532 was built using 1.5- mu m CMOS technology that has double-level metal capability. The size is roughly 145*210 mils with a transistor count of approximately 50 k transistors.<<ETX>>


international conference on acoustics, speech, and signal processing | 1987

A split control store VLSI for 32 kbps ADPCM transcoding

Luis A. Bonet; Tim A. Williams

This paper describes the architecture used in a 16 pin CMOS VLSI Digital Signal Processor which was designed by the authors to perform both ANSI and CCITT versions of the ADPCM standard. The part is designed to run from a 20 MHz clock source with an instruction cycle time of 100 ns. This design is a good example of the power of application specific DSP designs to reduce the cost of implementing stable algorithms.


Archive | 1990

Data processor having split level control store

Luis A. Bonet; Tim A. Williams


Archive | 1993

Method and apparatus for noise burst detection in a signal processor

Jose G. Corleto; Luis A. Bonet; David Yatim


Archive | 1992

ADPCM transcoder with integral tone generation and method therefor

David Yatim; Luis A. Bonet; Jose G. Corleto; Michael D. Floyd


Archive | 1996

Method and apparatus for reducing power consumption in a communications system

Nicole D. Teitler; Luis A. Bonet


Archive | 1992

Mixed signal processing system and method for powering same

Luis A. Bonet; Alan L. Westwick; Mauricio A. Zavaleta; James Alan Tuvell; David E. Bush; Michael D. Floyd


Archive | 1994

ROM mapping and inversion apparatus and method

Steven E. Cozart; Luis A. Bonet


Archive | 1991

ADPCM decoder with an integral digital receive gain and method therefor

Jose G. Corleto; Luis A. Bonet; David Yatim

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