M. Cabala

Interaction of Au with CeO2(111): A photoemission study

We have studied the adsorption of low dimensional gold on ceria, produced by evaporation onto the surface. The interaction of gold with CeO(2)(111) layers was investigated with x-ray photoemission spectroscopy, ultraviolet photoemission spectroscopy, and resonant photoelectron spectroscopy (RPES). Gold was deposited in steps onto a 1.5 nm thick CeO(2)(111) layer epitaxially grown on a Cu(111) substrate. The RPES showed a partial Ce(4+)-->Ce(3+) reduction, observed as a resonant enhancement of the 4f level of the Ce(3+) species. This can be explained by possible creation of a new Au(+) ionic state. The observed effects are stronger for Au deposition at room temperature than at 250 degrees C. The obtained results are in agreement with already published density functional theory calculations reporting weakening of bond between the oxygen and the Ce atoms in ceria caused by the presence of gold.

Au+ and Au3+ ions in CeO2 rf-sputtered thin films

The interaction of gold with CeO2 layers was investigated using photoelectron spectroscopy. 65 nm thick Au doped CeO2 layers were deposited by rf-magnetron sputtering on a Si(0 0 1) substrate by using a composite CeO2–Au target. The laboratory XPS and synchrotron radiation soft x-ray and hard x-ray photoemission spectra showed the formation of stoichiometric Ce4+ (CeO2) and the appearance of new Au+,3+ states with ionized Au species in excess of 50% of the total Au amount. Depth resolved measurements, by varying the emission angle or photon energy, indicated the formation of an Au0 overlayer and deeper Au+,3+ species. The formation of Au+,3+ ions was found to be strongly dependent on the cerium oxide stoichiometry. The amount of ionized Au can be reversibly decreased and increased by surface reduction (removal of O by sputtering) and subsequent surface re-oxidation.

The growth of Au/Pd on alumina/Cu-Al system

We have studied thin layered Au/Pd/alumina/Cu-Al system by means of synchrotron radiation photoelectron spectroscopy (SRPES), X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED). Ordered 0.8 nm thick alumina film was prepared by the controlled oxidation of the single-crystalline Cu-9at.%Al(111) support. The Pd and Au layers were prepared afterwards by a step-by-step deposition at room temperature. LEED measurement itself did not confirm epitaxial growth of the metal overlayers. They exhibited a pseudo layer-by-layer growth mode confirmed by work function measurements and the Monte Carlo simulation of the copper XPS peaks attenuation.