M. E. Morgada

Extreme ultraviolet single-crystal diamond detectors by chemical vapor deposition

High-quality single-crystal diamond films, homoepitaxially grown by microwave chemical vapor deposition, have been used to produce diamond-based photodetectors. Such devices were tested over a very wide spectral range, from the extreme ultraviolet (UV) (20 nm) up to the near IR region (2400 nm). An optical parametric oscillator tunable laser was used to investigate the 210–2400 nm spectral range in pulse mode. In this region, the spectral response shows a UV to visible contrast of about 6 orders of magnitude. A time response shorter than 5 ns, i.e., the laser pulse duration, was observed. By integrating the pulse shape, a minor slow component was evidenced, which can be explained in terms of trapping–detrapping effects. Extreme UV gas sources and a toroidal grating vacuum monochromator were used to measure the device response down to 20 nm in continuous mode. In particular, the extreme UV He spectrum was measured and the He II m, 30.4 nmand He I 58.4 nm emission lines were clearly detected. The measured t...

Synthesis and characterization of a single-crystal chemical-vapor-deposition diamond particle detector

The growth conditions and the detection properties of a homoepitaxial diamond film, deposited in Roma “Tor Vergata” University Laboratories by microwave chemical vapor deposition on a high-pressure high-temperature single-crystal substrate are reported. An energy resolution as low as 1.1% was achieved when irradiating the device with 5.5 MeV Am241 α-particles. The dependence of the charge collection efficiency and the energy resolution on the applied voltage are reported as well. A clear saturation plateau was observed in both curves. Preliminary results with 14.8 MeV neutron irradiation are reported, showing a well separated C12(n,α0)Be9 reaction peak.

Trapping-detrapping defects in single crystal diamond films grown by chemical vapor deposition

High-quality single-crystal diamond films were homoepitaxially grown by chemical vapor deposition onto low cost high-pressure high-temperature diamond substrates. The transport properties of the obtained samples were studied by photoresponse characterization. Fast ultraviolet (5 ns) laser pulses at 215 nm were used as a probe. The time evolution of the photoinduced current was observed to closely reproduce the laser pulse shape, thus indicating a time response lower than the adopted laser pulse duration. Very stable and reproducible response was measured, so that neither priming nor memory effects are observed. However, a minor slow component shows up in the charge-integrated sample response, whose temperature dependence was investigated in a −25–+50°C range. A systematic speed up of this slow component of the sample signal is observed, indicating the presence of shallow centers producing trapping-detrapping effects. The experimental results are discussed in the framework of a trapping-detrapping model af...

Distribution of electrically active defects in chemical vapor deposition diamond: Model and measurement

Defects limiting the movement of charge carriers in polycrystalline chemical vapor deposition (CVD) diamond films are located within the grains or in grain boundaries. Their geometrical distribution in the sample is different and is usually unknown. We present here a method to quantitatively evaluate the concentration and distribution of in-grain and grain-boundary located active carrier traps. Since the impact of these two kinds of defects on the performance of CVD diamond based devices is different, it is possible to obtain the defect distribution by measuring the response of diamond alpha particle detectors as a function of film thickness. The Hecht theory, describing the efficiency of a semiconductor particle detector, has been modified to take into account the polycrystalline nature of CVD diamond. This extended Hecht model was then used to fit experimental data and extract quantitative information about the defect distribution.

Thermal detrapping analysis of pumping-related defects in diamond

A method is presented to selectively characterize the traps involved in the pumping procedure of diamond films. The pumping process strongly reduces the concentration of active carrier trapping centers, leading to an enhancement of electronic properties of such material, and is obtained by irradiating the diamond films with ionizing radiation. Since the improved transport properties lead to an increased efficiency when diamond films are used as radiation detectors, valuable information on this process can be obtained by analyzing the response of diamond based particle detectors. For this purpose a high-quality diamond film was grown by microwave chemical vapor deposition and a particle detector was realized. Its response to a 5.5-MeV 241Am α-particles was measured after successive annealing steps performed at different temperatures in the 180–228 °C range. Before each annealing curve at a given temperature, the detector was driven to the pumped state through β-particle irradiation. The efficiency versus a...