M. W. Wang

Schottky‐based band lineups for refractory semiconductors

An overview is presented of band alignments for small-lattice parameter, refractory semiconductors. The band alignments are estimated empirically through the use of available Schottky barrier height data, and are compared to theoretically predicted values. Results for tetrahedrally bonded semiconductors with lattice constant values in the range from C through ZnSe are presented. Based on the estimated band alignments and the recently demonstrated p-type dopability of GaN, we propose three novel heterojunction schemes which seek to address inherent difficulties in doping or electrical contact to wide-gap semiconductors such as ZnO, ZnSe, and ZnS.

n-CdSe/p-ZnTe based wide band-gap light emitters: Numerical simulation and design

The only II‐VI/II‐VI wide band‐gap heterojunction to provide both good lattice match and p‐ and n‐type dopability is CdSe/ZnTe. We have carried out numerical simulations of several light emitter designs incorporating CdSe, ZnTe, and Mg alloys. In the simulations, Poisson’s equation is solved in conjunction with the hole and electron current and continuity equations. Radiative and nonradiative recombination in bulk material and at interfaces are included in the model. Simulation results show that an n‐CdSe/p‐ZnTe heterostructure is unfavorable for efficient wide band‐gap light emission due to recombination in the CdSe and at the CdSe/ZnTe interface. An n‐CdSe/Mg_(x)Cd_(1−x)Se/p‐ZnTe heterostructure significantly reduces interfacial recombination and facilitates electron injection into the p‐ZnTe layer. The addition of a Mg_(y)Zn_(1−y)Te electron confining layer further improves the efficiency of light emission. Finally, an n‐CdSe/Mg_(x)Cd_(1−x)Se/Mg_(y)Zn_(1−y)Te/p‐ZnTe design allows tunability of the wavelength of light emission from green into the blue wavelength regime.

Study of interface asymmetry in InAs–GaSb heterojunctions

We present reflection high energy electron diffraction, secondary ion mass spectroscopy, scanning tunneling microscopy and x‐ray photoelectron spectroscopy studies of the abruptness of InAs–GaSb interfaces. We find that the interface abruptness depends on growth order: InAs grown on GaSb is extended, while GaSb grown on InAs is more abrupt. We first present observations of the interfacial asymmetry, including measurements of band alignments as a function of growth order. We then examine more detailed studies of the InAs–GaSb interface to determine the mechanisms causing the extended interface. Our results show that Sb incorporation into the InAs overlayer and As exchange for Sb in the GaSb underlayer are the most likely causes of the interfacial asymmetry.

Proposal and verification of a new visible light emitter based on wide band gap II‐VI semiconductors

We propose a new device structure for obtaining visible light emission from wide band gap semiconductors. This heterojunction structure avoids ohmic contacting problems by using only the doping types which tend to occur naturally in II-VI semiconductors, while using a novel injection scheme to obtain efficient minority carrier injection into the wider band gap semiconductor. To verify this proposal we have fabricated green light emitting structures using n-CdSe and p-ZnTe regions separated by a graded MgxCd1-xSe injection region. Room temperature electroluminescence spectra from these devices demonstrate the effectiveness of the injection scheme, while the current-voltage characteristics show the merits of avoiding difficult ohmic contacts. We further show how the structure can be extended to blue wavelengths and beyond by opening up the band gap of the ZnTe recombination region with a MgyZn1-yTe alloy.

Scanning tunneling microscopy of InAs/GaSb superlattices: Subbands, interface roughness, and interface asymmetry

Scanning tunneling microscopy and spectroscopy is used to characterize InAs/GaSb superlattices, grown by molecular‐beam epitaxy. Roughness at the interfaces between InAs and GaSb layers is directly observed in the images, and a quantitative spectrum of this roughness is obtained. Electron subbands in the InAs layers are resolved in spectroscopy. Asymmetry between the interfaces of InAs grown on GaSb compared with GaSb grown on InAs is seen in voltage‐dependent imaging. Detailed spectroscopic study of the interfaces reveals some subtle differences between the two in terms of their valence‐band onsets and conduction‐band state density. These differences are interpreted in a model in which the GaSb on InAs interface has an abrupt InSb‐like structure, but at the InAs on GaSb interface some Sb grading occurs into the InAs overlayer.

X‐ray photoelectron spectroscopy investigation of the mixed anion GaSb/InAs heterointerface

X‐ray photoelectron spectroscopy has been used to measure levels of anion cross‐incorporation and to study interface formation for the mixed anion GaSb/InAs heterojunction. Anion cross‐incorporation was measured in 20 A thick GaSb layers grown on InAs, and 20 A thick InAs layers grown on GaSb for cracked and uncracked sources. It was found that significantly less anion cross‐incorporation occurs in structures grown with cracked sources. Interface formation was investigated by studying Sb soaks of InAs surfaces and As soaks of GaSb surfaces as a function of cracker power and soak time. Exchange of the group V surface atoms was found to be an increasing function of both cracker power and soak time. We find that further optimization of current growth parameters may be possible by modifying the soak time used at interfaces.

X-ray photoelectron spectroscopy measurement of valence-band offsets for Mg-based semiconductor compounds

We have used x-ray photoelectron spectroscopy to measure the valence-band offsets for the lattice matched MgSe/Cd0.54Zn0.46Se and MgTe/Cd0.88Zn0.12Te heterojunctions grown by molecular beam epitaxy. By measuring core level to valence-band maxima and core level to core level binding energy separations, we obtain values of 0.56+/-0.07 eV and 0.43+/-0.11 eV for the valence-band offsets of MgSe/Cd0.54Zn0.46Se and MgTe/Cd0.88Zn0.12Te, respectively. Both of these values deviate from the common anion rule, as may be expected given the unoccupied cation d orbitals in Mg. Application of our results to the design of current II-VI wide band-gap light emitters is discussed.

Effect of interface composition and growth order on the mixed anion InAs/GaSb valence band offset

We have used x‐ray photoelectron spectroscopy (XPS) to measure the dependence of the InAs/GaSb valence band offset on both interface composition and growth order. Molecular beam epitaxy was used to grow InAs‐on‐GaSb and GaSb‐on‐InAs interfaces with both InSb‐like and GaAs‐like interface compositions. Analysis of XPS core level separations showed no dependence of the valence band offset on interface composition; however, a 90 meV increase in the valence band offset was observed for InAs grown on GaSb compared to GaSb grown on InAs. This difference is attributed to the extended nature of the InAs‐on‐GaSb interface. Results from analysis of an intentionally extended GaSb‐on‐InAs interface were consistent with this conclusion.

Reflection high energy electron diffraction observation of anion exchange reactions on InAs surfaces

We have used time‐resolved reflection high energy electron diffraction (RHEED) measurements to study anion exchange reactions in molecular beam epitaxy (MBE) grown III‐V semiconductors. In the experiment, InAs surfaces are exposed to Sbx fluxes and subsequent changes in the crystals RHEED patterns are examined. We find that when an InAs surface is initially exposed to an Sb flux the specular spot intensity first decreases, then recovers back toward its initial value. The shape of the intensity versus time curves is extremely reproducible if the absolute Sb flux and the Sb species are kept constant. The length of time required for the RHEED pattern to stabilize is much shorter for cracked Sb than for uncracked Sb. The RHEED dynamics are also faster if the total Sb flux increases. The behavior of the RHEED dynamics as a function of Sb flux and Sb species is consistent with the changes in the RHEED pattern being due to an Sb/As exchange reaction on the crystal’s surface. The RHEED data are compared to previo...

Reflection high energy electron diffraction observation of exchange reaction dynamics on InAs surfaces

We have used time‐resolved reflection high energy electron diffraction (RHEED) measurements to study the dynamics of a surface, anion exchange reaction. In the experiment, InAs surfaces are exposed to Sb_x fluxes and subsequent changes in the crystals’ RHEED patterns are examined. We find that when an InAs surface is initially exposed to an Sb flux the specular spot intensity first decreases, then recovers back toward its initial value. The shape of the intensity versus time curves is extremely reproducible if the absolute Sb flux and the Sb species are kept constant. The length of time required for the RHEED pattern to stabilize is much shorter for cracked Sb than for uncracked Sb. The RHEED dynamics are also faster if the total Sb flux increases. The behavior of the RHEED dynamics as a function of Sb flux and Sb species is consistent with the changes in the RHEED pattern being due to an Sb/As exchange reaction on the crystals’ surface. The RHEED data are compared to previously published x‐ray photoelectron spectroscopy (XPS) data which studied exchange reactions on InAs surfaces exposed to Sb fluxes. The XPS study confirmed that the incident Sb did indeed exchange with As in the epilayer and estimated the exposure time needed to complete the Sb/As exchange reaction. The time scales for exchange associated with the RHEED and XPS data are in good agreement, which further indicates that the observed RHEED dynamics are due to the Sb/As exchange reaction. Preliminary results from exposing GaSb surfaces to As fluxes show similar RHEED and XPS behavior. This suggests that RHEED could be generally applicable to the study of surface exchange reaction dynamics.