Maeng-Joon Jung

Structural refinement of SnO2 thin film prepared by plasma-enhanced chemical vapor deposition

Abstract The structural refinement of SnO 2 thin film prepared by PECVD was performed by the Rietveld method using X-ray diffraction data. The agreement between calculated and observed patterns was not satisfactory, which was attributed to the preferred orientation effect. The effect of preferred orientation was corrected by three kinds of approaches: a March–Dollase function, a pole density distribution using an inverse pole figure and a generalized spherical harmonic function. Of these methods, the approach using the generalized spherical harmonic function was the most effective than the other two approaches. The final residual weighted R -factor, R wp , was converged 7.92%. The lattice parameters were a = b =4.7357(2) and c =3.1937(2). Other structural parameters were well in accordance with those of SnO 2 powder.

Rietveld refinement of highly textured copper sheet using pole density distribution

Abstract The Rietveld refinement for the highly textured copper (Cu) sheet, which was prepared by a cold rolling process, was carried out by both the X-ray diffraction data of the normal direction in the sample orientation and the pole figure data of three reflections: (111), (200) and (220). The agreement between calculated and observed patterns was not satisfactory due to the textured effect of the copper sheet. The Rietveld refinement for the copper sheet could be done successfully by applying the pole density of each reflection obtained from the corresponding inverse pole figure to the X-ray diffraction data for the normal direction. The final R -weighted pattern, R wp , was 12.99% and the goodness-of-fit indicator, S , was 3.68. This approach, based on the pole density distribution of each reflection, may be an alternative technique to do the Rietveld refinement for strongly textured polycrystalline samples where simple or semiempirical functions do not sufficiently describe the textured effect.

Rietveld refinement of aluminum sheet using inverse pole figure

Abstract The Rietveld refinement on the aluminum sheet prepared by a cold rolling process was studied using both the X-ray diffraction data of the normal direction in the sample orientation and the pole figure data of three reflections: (111), (200), and (220). The agreement between calculated and observed patterns was not satisfactory due to the preferred orientation effect of the aluminum sheet. The Rietveld refinement on the aluminum sheet could be successfully preformed by applying the pole density of each reflection obtained from the corresponding inverse pole figure to the X-ray diffraction data. The final R -weighted pattern, R wp , was 7.18%, and the goodness-of-fit indicator, S , was 1.41.