Manfred Moser

Method and apparatus for testing an SDRAM memory used as the main memory in a personal computer

Test apparatus with memory data converter for redundant bit and word lines

Test apparatus and method for testing circuit units to be tested

Method of checking electrical connections between a memory module and a semiconductor memory chip

Electronic component with several identical, parallel-connected electronic circuit units, e.g. integrated circuits

Repairing memory involves fault detection logic detecting faults during operation and permanently replacing faulty rows and/or columns with replacement rows and/or columns

Monitoring device for monitoring internal signals during initialization of an electronic circuit

Method for activating a plurality of word lines in a refresh cycle, and electronic memory device

Memory device with redundant memory management has a reserve memory cell field and a memory control unit that reallocates defective main memory cells to reserve memory cells

Semiconductor device with improved heat dissipation