Martin Versen | Researchain

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Publication

Featured researches published by Martin Versen.

Archive | 2005

Serial presence detect functionality on memory component

Klaus Nierle; Martin Versen

Archive | 2002

Method for the defect analysis of memory modules

Frank Adler; Martin Versen

Archive | 2006

Method for testing an integrated semiconductor memory

Martin Versen

Archive | 2006

Test mode for IPP current measurement for wordline defect detection

Michael A. Kilian; Martin Versen; Grant Mcneil; Zach Johnson; Changduk Kim

Archive | 2005

Integrated semiconductor memory with redundant memory cells

Martin Versen; Martin Perner

Archive | 2005

Redundant wordline deactivation scheme

Martin Versen; Peter Thwaite

Archive | 2004

Method for testing the serviceability of bit lines in a DRAM memory device

Martin Versen; Klaus Nierle

Archive | 2005

Voltage monitoring test mode and test adapter

Martin Versen; Daewon Lee

Archive | 2006

Verfahren zum Testen der Betriebsbrauchbarkeit von Bitleitungen in einer DRAM-Speichervorrichtung

Klaus Nierle; Martin Versen

Archive | 2005

Test mode method and apparatus for internal memory timing signals

Martin Versen; Klaus Nierle; Oliver Kiehl; Ernst Stahl

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Collaboration

Dive into the Martin Versen's collaboration.

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Manfred Moser

Infineon Technologies

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Erwin Thalmann

Infineon Technologies

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Frank Adler

Infineon Technologies

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Klaus Nierle

Infineon Technologies

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Thomas Neyer

Infineon Technologies

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Martin Perner

Infineon Technologies

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Jörg Dr. Kliewer

Infineon Technologies

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Oliver Kiehl

Infineon Technologies

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Peter Beer

Infineon Technologies

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Thomas Huber

Infineon Technologies

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