Marcus A. Belcher
National Institute of Aerospace
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Featured researches published by Marcus A. Belcher.
Langmuir | 2010
Christopher J. Wohl; Marcus A. Belcher; Lillian Chen; John W. Connell
Low surface energy copoly(imide siloxane)s were generated via condensation polymerization reactions. The generated materials were characterized spectroscopically, thermally, mechanically, and via contact angle goniometry. The decrease in tensile modulus and opaque appearance of copoly(imide siloxane) films indicated phase segregation in the bulk. Preferential surface partitioning of the siloxane moieties was verified by X-ray photoelectron spectroscopy (XPS) and increased advancing water contact angle values (theta(A)). Pristine copoly(imide siloxane) surfaces typically exhibited theta(A) values of 111 degrees and sliding angles from 27 degrees to >60 degrees. The surface properties of these copoly(imide siloxane) films were further altered using laser ablation patterning (frequency-tripled Nd:YAG laser, 355 nm). Laser-etched square pillar arrays (25 microm pillars with 25 microm interspaces) changed theta(A) by up to 64 degrees. Theta(A) values approaching 175 degrees and sliding angles from 1 degree to 15 degrees were observed. ATR-IR spectroscopy and XPS indicated polymer chain scission reactions occurred as a result of laser ablation. Initial particle adhesion studies revealed that the copoly(imide siloxane)s outperformed the corresponding homopolyimides and that laser ablation patterning further enhanced this result.
High Performance Polymers | 2012
Christopher J. Wohl; Brad M. Atkins; Marcus A. Belcher; John W. Connell
Novel copoly(imide siloxane)s were synthesized from commercially available aminopropyl terminated siloxane oligomers, aromatic dianhydrides, and diamines. This synthetic approach produced copolymers with well-defined siloxane blocks linked with imide units in a random fashion. The copoly(amide acid)s were characterized by solution viscosity and subsequently used to cast thin films followed by thermal imidization in an inert atmosphere. Thin films were characterized using contact angle goniometry, attenuated total reflection Fourier transform infrared spectroscopy, confocal and optical microscopy, and tensile testing. Adhesion of micron-sized particles was determined quantitatively using a sonication device. The polydimethylsiloxane moieties lowered the copolymer surface energy due to migration of siloxane moieties to the film’s surface, resulting in a notable reduction in particle adhesion. A further reduction in particle adhesion was achieved by introducing topographical features on a scale of several to tens of microns by a laser ablation technique.
3rd AIAA Atmospheric Space Environments Conference | 2011
Christopher J. Wohl; John W. Connell; Yi Lin; Marcus A. Belcher; Frank Palmieri
Particulate contamination is of concern in a variety of environments. This issue is especially important in confined spaces with highly controlled atmospheres such as space exploration vehicles involved in extraterrestrial surface missions. Lunar dust was a significant challenge for the Apollo astronauts and will be of greater concern for longer duration, future missions. Passive mitigation strategies, those not requiring external energy, may decrease some of these concerns, and have been investigated in this work. A myriad of approaches to modify the surface chemistry and topography of a variety of substrates was investigated. These involved generation of novel materials, photolithographic techniques, and other template approaches. Additionally, single particle and multiple particle methods to quantitatively evaluate the particle-substrate adhesion interactions were developed.
Applied Surface Science | 2009
Christopher J. Wohl; Marcus A. Belcher; Sayata Ghose; John W. Connell
International Journal of Adhesion and Adhesives | 2016
Frank Palmieri; Marcus A. Belcher; Christopher J. Wohl; Kay Y. Blohowiak; John W. Connell
Archive | 2010
Christopher J. Wohl; Marcus A. Belcher; John W. Connell; John W. Hopkins
International Journal of Adhesion and Adhesives | 2012
G.A. Knight; T.H. Hou; Marcus A. Belcher; F.L. Palmieri; Christopher J. Wohl; John W. Connell
Proceedings of the Institution of Civil Engineers - Engineering and Computational Mechanics | 2011
Marcus A. Belcher; Christopher J. Wohl; John W. Hopkins; John W. Connell
Archive | 2013
Peter J. Van Voast; Kay Y. Blohowiak; John Christopher Osborne; Marcus A. Belcher
Archive | 2010
Marcus A. Belcher; C. J. Wohl; J. W. Hopkins; J. W. Connell