Mark Shappirio

The Geometric Factor of Electrostatic Plasma Analyzers: A Case Study from the Fast Plasma Investigation for the Magnetospheric Multiscale mission

We report our findings comparing the geometric factor (GF) as determined from simulations and laboratory measurements of the new Dual Electron Spectrometer (DES) being developed at NASA Goddard Space Flight Center as part of the Fast Plasma Investigation on NASAs Magnetospheric Multiscale mission. Particle simulations are increasingly playing an essential role in the design and calibration of electrostatic analyzers, facilitating the identification and mitigation of the many sources of systematic error present in laboratory calibration. While equations for laboratory measurement of the GF have been described in the literature, these are not directly applicable to simulation since the two are carried out under substantially different assumptions and conditions, making direct comparison very challenging. Starting from first principles, we derive generalized expressions for the determination of the GF in simulation and laboratory, and discuss how we have estimated errors in both cases. Finally, we apply these equations to the new DES instrument and show that the results agree within errors. Thus we show that the techniques presented here will produce consistent results between laboratory and simulation, and present the first description of the performance of the new DES instrument in the literature.

Microfabricated silicon leak for sampling planetary atmospheres with a mass spectrometer.

A microfabricated silicon mass spectrometer inlet leak has been designed, fabricated, and tested. This leak achieves a much lower conductance in a smaller volume than is possible with commonly available metal or glass capillary tubing. It will also be shown that it is possible to integrate significant additional functionality, such as inlet heaters and valves, into a silicon microleak with very little additional mass. The fabricated leak is compatible with high temperature (up to 500 degrees C) and high pressure (up to 100 bars) conditions, as would be encountered on a Venus atmospheric probe. These leaks behave in reasonable agreement with their theoretically calculated conductance, although this differs between devices and from the predicted value by as much as a factor of 2. This variation is believed to be the result of nonuniformity in the silicon etching process which is characterized in this work. Future versions of this device can compensate for characterized process variations in order to produce devices in closer agreement with designed conductance values. The integration of an inlet heater into the leak device has also been demonstrated in this work.

Scattering of neutral hydrogen at energies less than 1 keV from tungsten and diamondlike carbon surfaces

Neutral atom to negative ion conversion efficiencies were studied for polished tungsten and diamondlike carbon surfaces using a beam of incident hydrogen atoms. Neutral atoms at energies below 1 keV were scattered from the surfaces using incident angles between 6° and 20° measured from the surface plane. The angular and energy distributions of negative ions backscattering from the surfaces were measured and used to calculate the fraction of the incident beam that was converted to negative ions. The highest number and the lowest overall energy loss of backscattered ions were both observed near the specular reflection angle of the incident beam for the two surface materials studied. The total conversion efficiency was calculated to be near 2% for the tungsten and diamondlike carbon surfaces. Measurements taken while the surfaces were heated show a significant reduction in conversion efficiency, which is credited to the removal of adsorbates from the top layers of the surfaces.