Marlin E. Kraft

NIST Measurement Service for DC Standard Resistors

At the National Institute of Standards and Technology (NIST), the U.S. representation of the ohm is based on the quantum Hall effect, and it is maintained and disseminated at various resistance levels by working reference groups of standards. This document describes the measurement systems and procedures used to calibrate standard resistors and current shunts of nominal decade values in the resistance range from 10 Ω to 10 Ω. Resistance scaling techniques used to assign values to the working standards are discussed. Also included is an assessment of the calibration uncertainties at each resistance level.

Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study

The transportation effect and other important characteristics of 100 Ω standard resistors of a new construction have been studied. For the transportation effect, four resistors have been transported by air between three national metrology institutes (NMIs): 1) the Korea Research Institute of Standards and Science; 2) the National Institute of Standards and Technology in the USA; and 3) the National Metrology Institute of Japan. Two of the resistors have been transported in hand-carried luggage and the other two by normal air freight. Resistance values as well as other characteristics have been carefully evaluated before and after the transportation to the NMIs. The measurements were done by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μQ/Q. Other characteristics, the drift rate: about 0.05 (μQ/Q)/year or less, temperature coefficient: about 0.02 (μQ/Q)/°C or less, and power coefficient: negligible, have also been reported. It is demonstrated that this excellent performance is suitable for utilization in NMIs and international comparisons.

Quantum Hall resistance traceability for the NIST-4 watt balance

Scaling from the quantum Hall resistance to 100 Ω standard resistors used by the NIST-4 watt balance involves multiple resistance standards and bridges to provide the lowest possible uncertainty. Described here is the infrastructure and procedures developed to support these measurements at better than 20 × 10-9 standard uncertainty levels.

Evaluation of low-ohmic resistance measurement capabilities between VSL and NIST

The low-ohmic resistance measurement capabilities of the Van Swinden Laboratorium (VSL) and the National Institute of Standards and Technology (NIST) were compared using a set of resistors with values 100 mΩ, 10 mΩ, 1 mΩ, and 100 μΩ respectively. The measurement data of both laboratories generally agree well within the combined measurement uncertainties, ranging from 0.54 μΩ/Ω at 100 mΩ to 4.3 μΩ/Ω at 100 μΩ (k = 2). Careful transport of the resistors was crucial for achieving this result.

Towards epitaxial graphene p-n junctions as electrically programmable quantum resistance standards

We report the fabrication and measurement of top gated epitaxial graphene p-n junctions where exfoliated hexagonal boron nitride (h-BN) is used as the gate dielectric. The four-terminal longitudinal resistance across a single junction is well quantized at the von Klitzing constant

A 100 TΩ guarded Hamon transfer standard

{{\boldsymbol{R}}}_{{\boldsymbol{K}}}

Third generation of adapted wheatstone bridge for high resistance measurements at NIST

RK with a relative uncertainty of 10−7. After the exploration of numerous parameter spaces, we summarize the conditions upon which these devices could function as potential resistance standards. Furthermore, we offer designs of programmable electrical resistance standards over six orders of magnitude by using external gating.

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior

This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.