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Dive into the research topics where Michael Frederick Hayles is active.

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Featured researches published by Michael Frederick Hayles.


Journal of Structural Biology | 2010

The making of frozen-hydrated, vitreous lamellas from cells for cryo-electron microscopy

Michael Frederick Hayles; D. A. Matthijs de Winter; Chris T.W.M. Schneijdenberg; Johannes D. Meeldijk; Uwe Luecken; Hans Persoon; Jeroen de Water; Frank de Jong; Bruno M. Humbel; Arie J. Verkleij

There has been a long standing desire to produce thick (up to 500 nm) cryo-sections of fully hydrated cells and tissue for high-resolution analysis in their natural state by cryo-transmission electron microscopy. Here, we present a method that can successfully produce sections (lamellas in FIB-SEM terminology) of fully hydrated, unstained cells from high-pressure frozen samples by focused ion beam (FIB) milling. The samples are therefore placed in thin copper tubes and vitrified by high-pressure freezing. For transfer, handling and subsequent milling, the tubes are placed in a novel connective device (ferrule) that protects the sample from devitrification and contamination and passes through all operation steps. A piezo driven sample positioning stage (cryo-nano-bench, CNB) with three degrees of freedom was additionally developed to enable accurate milling of frozen-hydrated lamellas. With the CNB, high-pressure frozen samples can be milled to produce either thin lamellas (<100 nm), for direct imaging by high-resolution cryo-TEM or thicker lamellas (300-500 nm) for cryo-electron tomography. The sample remains vitreous throughout the process by using the presented tools and methods. The results are an important step towards investigating larger cells and even tissue in there natural state which in the end will enable us to gain better insights into cellular processes.


Journal of Microscopy | 2011

Cryogenic EBSD on ice: preserving a stable surface in a low pressure SEM

Ilka Weikusat; D.A.M. de Winter; G. M. Pennock; Michael Frederick Hayles; Chris T.W.M. Schneijdenberg; Martyn R. Drury

Naturally deformed ice contains subgrains with characteristic geometries that have recently been identified in etched surfaces using high‐resolution light microscopy (LM). The probable slip systems responsible for these subgrain boundary types can be determined using electron backscattered diffraction (EBSD), providing the etch features imaged with reflected LM can be retained during EBSD data acquisition in a scanning electron microscope (SEM). Retention of the etch features requires that the ice surface is stable. Depending on the pressure and temperature, sublimation of ice can occur. The equilibrium temperature for a low pressure SEM operating at 1 × 10−6 hPa is about −112°C and operating at higher temperatures causes sublimation. Although charging of uncoated ice samples is reduced by sublimation, important information contained in the etch features are removed as the surface sublimes. We developed a method for collecting EBSD data on stable ice surfaces in a low pressure SEM. We found that operating at temperatures of <–112°C reduced sublimation so that the original etch surface features were retained. Charging, which occurred at low pressures (<1.5 × 10−6 to 2.8 × 10−5 hPa) was reduced by defocusing the beam. At very low pressures (<1.5 × 10−6 hPa) the spatial resolution with a defocused beam at 10 kV was about 3 μm in the x‐direction at −150°C and 0.5 μm at −120°C, because at higher temperature charging was less and only a small defocus was needed to compensate it. Angular resolution was better than 0.7° after orientation averaging. Excellent agreement was obtained between LM etch features and EBSD mapped microstructures. First results are shown, which indicate subgrain boundary types comprised of basal (tilt and twist) and nonbasal dislocations (tilt boundaries).


Journal of Structural Biology | 2013

In-situ integrity control of frozen-hydrated, vitreous lamellas prepared by the cryo-focused ion beam-scanning electron microscope

D. A. Matthijs de Winter; Rob J. Mesman; Michael Frederick Hayles; Chris T.W.M. Schneijdenberg; Cliff Mathisen; Jan Andries Post

Recently a number of new approaches have been presented with the intention to produce electron beam transparent cryo-sections (lamellas in FIB-SEM terminology) from hydrated vitreously frozen cryo samples with a Focused Ion Beam (FIB) system, suitable for cryo-Transmission Electron Microscopy (cryo-TEM). As the workflow is still challenging and time consuming, it is important to be able to determine the integrity and suitability (cells vs. no cells; vitreous vs. crystalline) of the lamellas. Here we present an in situ method that tests both conditions by using the cryo-Scanning Electron Microscope (cryo-SEM) in transmission mode (TSEM; Transmission Scanning Electron Microscope) once the FIB-made lamella is ready. Cryo-TSEM imaging of unstained cells yields strong contrast, enabling direct imaging of material present in the lamellas. In addition, orientation contrast is shown to be suitable for distinguishing crystalline lamellas from vitreous lamellas. Tilting the stage a few degrees results in changes of contrast between ice grains as a function of the tilt angle, whereas the contrast of areas with vitreous ice remains unchanged as a function of the tilt angle. This orientation contrast has subsequently been validated by cryo-Electron BackScattered Diffraction (EBSD) in transmission mode. Integration of the presented method is discussed and the role it can play in future developments for a new and innovative all-in-one cryo-FIB-SEM life sciences instrument.


Archive | 2008

Method for attaching a sample to a manipulator

Michael Frederick Hayles; Uwe Luecken


Archive | 2008

Method for attaching a sample to a manipulator by melting and then freezing part of said sample

Michael Frederick Hayles; Uwe Luecken


Archive | 2007

Method for separating a lamella for TEM inspection from a core sample

Michael Frederick Hayles; Uwe Luecken


Archive | 2003

Method of obtaining a particle-optical image of a sample in a particle-optical device

Remco Theodorus Johannes Petrus Geurts; Michael Frederick Hayles


Archive | 1999

SEM for transmission operation with a location-sensitive detector

Michael Frederick Hayles; Gerardus Nicolaas Anne van Veen


Archive | 2014

Sample preparation stage

Johannes Antonius Hendricus Wilhelmus Gerardus Persoon; Andreas Theodorus Engelen; Mathijs Petrus Wilhelmus van den Boogaard; Rudolf Johannes Peter Gerardus Schampers; Michael Frederick Hayles


Archive | 2008

Method for attaching sample to manipulator

Michael Frederick Hayles; Uwe Luecken; リュッケン ウヴェ; フレデリック ヘイレス マイケル

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Ilka Weikusat

Alfred Wegener Institute for Polar and Marine Research

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