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Dive into the research topics where Rudolf Johannes Peter Gerardus Schampers is active.

Publication


Featured researches published by Rudolf Johannes Peter Gerardus Schampers.


Microscopy and Microanalysis | 2008

In-Situ Sample Preparation and Modeling of SEM-STEM Imaging

Richard J. Young; A Buxbaum; Brennan Peterson; Rudolf Johannes Peter Gerardus Schampers

Scanning transmission electron microscopy with scanning electron microscopes (SEM-STEM) has become increasing used in both SEM and dual-beam focused ion beam (FIB)SEM systems. This paper describes modeling undertaken to simulate the contrast seen in such images. Such modeling provides the ability to help understand and optimize imaging conditions and also support improved sample preparation techniques.


Archive | 2009

Measurement and endpointing of sample thickness

Richard J. Young; Brennan Peterson; Rudolf Johannes Peter Gerardus Schampers; Michael Moriarty


Archive | 2007

Method for Separating a Minute Sample from a Work Piece

Rudolf Johannes Peter Gerardus Schampers; Theodorus Adrianus Petrus Verkleij; Hendrik Siewerd Venema


Archive | 2014

Sample preparation stage

Johannes Antonius Hendricus Wilhelmus Gerardus Persoon; Andreas Theodorus Engelen; Mathijs Petrus Wilhelmus van den Boogaard; Rudolf Johannes Peter Gerardus Schampers; Michael Frederick Hayles


Archive | 2013

Forming a vitrified sample for electron microscopy

Johannes Jacobus Lambertus Mulders; Rudolf Johannes Peter Gerardus Schampers; Petrus Hubertus Franciscus Trompenaars


Microscopy and Microanalysis | 2011

A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications

Richard J. Young; Chad Rue; Steven Randolph; Clive D. Chandler; G Franz; Rudolf Johannes Peter Gerardus Schampers; A Klumpp; L Kwakman


Microscopy and Microanalysis | 2010

High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source

Sean Kellogg; Rudolf Johannes Peter Gerardus Schampers; Shouyin Zhang; Anthony Graupera; Tom Miller; Wd Laur; A Dirriwachter


Microscopy and Microanalysis | 2009

Backside TEM Sample Preparation With The Multi-Loader Flip-Stage

A Buxbaum; Rudolf Johannes Peter Gerardus Schampers; J-J Bolt


Archive | 2014

METHOD OF WELDING A FROZEN AQUEOUS SAMPLE TO A MICROPROBE

Rudolf Johannes Peter Gerardus Schampers; Johannes Antonius Hendricus Wilhelmus Gerardus Persoon; Andreas Theodorus Engelen


Archive | 2013

Forming an electron microscope sample from high-pressure frozen material

Rudolf Johannes Peter Gerardus Schampers; Michael Frederick Hayles; Dirk Arie Mattheus de Winter; Christianus Thomas Wilhelmus Maria Schneijdenberg

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