Michael J. Vasile

Development of the micromilling process for high-aspect-ratio microstructures

At the macroscale, the milling process is very ver- satile and capable of creating three-dimensional features and structures. Adaptation of this process at the microscale could lead to the rapid and direct fabrication of micromolds and masks to aid in the development of microcomponents. This task has been undertaken, and results of the process indicate it can become an increasingly useful method. The micromilling process is characterized by milling tools that are currently in the range from 22-100 pm in diameter and made by the focused-ion beam machining process. The tools are used in a specially designed, high-precision milling machine. Results are comparable to other processes currently used to fabricate mold and mask features. The micromilling process can create trench-like features with nearly vertical sidewalls and good smoothness. External corners are sharp and stepped features can be machined simply by programming those shapes. The process is direct, alnd therefore dimensional errors do not accumulate as can occur with serial fabrication processes. (159)

Micromilling of metal alloys with focused ion beam-fabricated tools

Abstract This work combines focused ion beam sputtering and ultra-precision machining as a first step in fabricating metal alloy microcomponents. Micro-end mills having ∼25 μm diameters are made by sputtering cobalt M42 high-speed steel and C2 micrograin tungsten carbide tool blanks. A 20 keV focused gallium ion beam is used to define a number of cutting edges and tool end clearance. Cutting edge radii of curvature are less than or equal to 0.1 μm. Micro-end mill tools having 2, 4 and 5 cutting edges successfully machine millimeter long trenches in 6061-T4 aluminum, brass, 4340 steel and polymethyl methacrylate. Machined trench widths are approximately equal to the tool diameters, and surface roughnesses (Ra) at the bottom of micromachined features are ∼200 nm. Microtools are robust and operate for more than 6 h without fracture. Results from ultra-precision machining aluminum alloy at feed rates as high as 50 mm/minute and an axial depth of 1.0 μm are included.

Focused ion beam milling of diamond : effects of H2O on yield, surface morphology and microstructure.

The effects of H2O vapor introduced during focused ion beam (FIB) milling of diamond(100) are examined. In particular, we determine the yield, surface morphology, and microstructural damage that results from FIB sputtering and H2O-assisted FIB milling processes. Experiments involving 20 keV Ga+ bombardment to doses ∼1018 ions/cm2 are conducted at a number of fixed ion incidence angles, θ. For each θ selected, H2O-assisted ion milling shows an increased material removal rate compared with FIB sputtering (no gas assist). The amount by which the yield is enhanced depends on the angle of incidence with the largest difference occurring at θ=75°. Experiments that vary pixel dwell time from 3 μs to 20 ms while maintaining a fixed H2O gas pressure demonstrate the additional effect of beam scan rate on yield for gas-assisted processes. Different surface morphologies develop during ion bombardment depending on the angle of ion incidence and the presence/absence of H2O. In general, a single mode of ripples having a ...

Focused ion beam milling: Depth control for three-dimensional microfabrication

Ion milling with a focused ion beam (FIB) is a potential method for making micromolds, which will then be the primary elements in the mass production of micro- or mini-objects by embossing or injection molding. The challenge lies in controlling the ion milling to produce cavities with predefined, arbitrary geometric cross-sections. This work involves programming variations as a function of position into the algorithm that generates the dwell times in the pixel address scheme of a FIB. These variations are done according to whether an axis of symmetry or a plane of symmetry determines the final geometry, and the result is 26 new cross-sectional shapes, such as hemispherical pits, parabolic pits, hemispherical domes, etc. The ion milling control programs were used to generate parabolic cross-section trenches, sinusoidal trenches, sinusoidal cross-section rings on an annulus, and hemispherical domes. We observed reasonable agreement between the shapes ion milled in Si(100) and the expected geometry. The dwel...

Microgrooving and microthreading tools for fabricating curvilinear features

This paper presents techniques for fabricating microscopic, curvilinear features in a variety of workpiece materials. Micro-grooving and micro-threading tools having cutting widths as small as 13 {micro}m are made by focused ion beam sputtering and used for ultra-precision machining. Tool fabrication involves directing a 20 keV gallium beam at polished cylindrical punches made of cobalt M42 high-speed steel or C2 tungsten carbide to create a number of critically aligned facets. Sputtering produces rake facets of desired angle and cutting edges having radii of curvature equal to 0.4 {micro}m. Clearance for minimizing frictional drag of a tool results from a particular ion beam/target geometry that accounts for the sputter yield dependence on incidence angle. It is believed that geometrically specific cutting tools of this dimension have not been made previously. Numerically controlled, ultra-precision machining with micro-grooving tools results in a close match between tool width and feature size. Microtools are used to machine 13 {micro}m wide, 4 {micro}m deep, helical grooves in polymethyl methacrylate and 6061 Al cylindrical workplaces. Micro-grooving tools are also used to fabricate sinusoidal cross-section features in planar metal samples.

Micrometer-scale machining: tool fabrication and initial results

Conventional milling techniques scaled to ultrasmall dimensions have been used to machine polymethyl methacrylate (PMMA) with micrometer-sized milling tools. The object of this work is to achieve machining of a common material over dimensions exceeding 1 mm while holding submicrometer tolerances and micrometer size features. Fabricating the milling tools themselves was also an object of the study. A tool geometry for nominal 25 micrometer diameter cutting tools was found that cuts PMMA with submicrometer tolerances over trench lengths of 2 mm. The tool shape is a simple planar facet cut by focused ion beam milling on ground and polished 25 micrometer diameter steel tool blanks. Pairs of trenches 24 micrometers wide, 26 micrometers deep, 2.3 mm long, with a 14 micrometer separation were milled under various machining conditions. The results indicate that the limits of the machining process in terms of speed, pattern complexity, and tolerances have not been approached. This is the first demonstration of a generic method for microtool making by focused ion beam machining combined with ultraprecision numerically controlled milling. The method is shown to be capable of producing structures and geometries that are considered inaccessible by conventional materials removal techniques, and generally regarded as applications for deep X-ray lithography.

Microfabrication techniques using focused ion beams and emergent applications

The application of focused ion beam (FIB) machining in several technologies aimed at microstructure fabrication is presented. These emergent applications include the production of micromilling tools for machining of metals and the production of microsurgical tools. An example of the use of microsurgical manipulators in a circulatory system measurement is presented. The steps needed to transform the laboratory fabrication of these tools and manipulators into a routine FIB production process are discussed. The ion milling of three-dimensional cavities by the exact solution of a mathematical model of the FIB deflection is demonstrated. A good agreement between the model calculation and the ion beam control has been obtained for parabolic and cosine cross-section features with planes of symmetry.

Depth control of focused ion-beam milling from a numerical model of the sputter process

A mathematical model of focused ion-beam milling is used to generate dwell times for the vector scanned pixel address scheme of a focused ion-beam deflection system. The model incorporates the absolute sputter yield of the solid as a function of the angle of incidence, and the relationship between the ion-beam current distribution and the pixel size of the deflection pattern. The object of this work is to be able to call for an arbitrary geometric shape to be ion milled and then have the numerical model compute the pixel dwell times for the deflection system such that the final cavity is sputtered. Experimental verification of the procedure was accomplished with parabolic troughs, hemispherical troughs, and cosine troughs. The term “trough” means a plane of symmetry in the ion-milled cavity. These same geometric shapes were also ion milled using a rotational axis of symmetry, yielding sinusoidal ring patterns, parabolic dishes, and hemispherical dishes. The absolute maximum depth for each of the cavities ...

Micromilling development and applications for microfabrication

Abstract In conventional machining, milling is the most versatile of the cutting processes. Micromechanical milling has also been shown to be a very versatile and repid method for the removal of material and the creation of microstructures. These microstructures range form direct fabrication of molds in polymethyl methacrylate (PMMA) to direct fabrication of x-ray lithography masks using a machinable carrier and one of several metallic absorbers, or various combinations of absorbers to better suit the machining environment. The micromilling tools are commercially available in diameters larger than 50 micrometers and custom-fabricated tools 22 micrometers in diameter are made at the Institute for Micromanufacturing (IfM). The custom-fabricated tools are made using the focused ion beam process and the resulting microstructures are machined on a very high precision, custom-built milling machine. The focused ion beam process has also been used to fabricate very small probe tips for biomedical use and microscalpels with extremely sharp cutting edges. These devices are currently under study and development for research applications.

Focused ion beam technology applied to microstructure fabrication

Focused ion beams (FIBs) have found a place in several research thrusts for the manufacture of mini or micro mechanical objects. This article reports the use of FIB in three distinct applications in microfabrication: prototype structures, micron-sized machine tools and microsurgical manipulators, and ion milling of three dimensional features. Examples of each of these applications are given with the FIB component identified as the enabling or critical component in the technology. The possibility of using FIB milling as part of a production method for micron-sized machine tools is discussed, and the mass production consequences of molds fabricated by three dimensional ion beam milling is also considered. The mathematical procedure and programming steps needed to accurately control FIB three dimensional milling are outlined.Focused ion beams (FIBs) have found a place in several research thrusts for the manufacture of mini or micro mechanical objects. This article reports the use of FIB in three distinct applications in microfabrication: prototype structures, micron-sized machine tools and microsurgical manipulators, and ion milling of three dimensional features. Examples of each of these applications are given with the FIB component identified as the enabling or critical component in the technology. The possibility of using FIB milling as part of a production method for micron-sized machine tools is discussed, and the mass production consequences of molds fabricated by three dimensional ion beam milling is also considered. The mathematical procedure and programming steps needed to accurately control FIB three dimensional milling are outlined.