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Dive into the research topics where Michihira Iida is active.

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Featured researches published by Michihira Iida.


asia-pacific symposium on electromagnetic compatibility | 2012

Split width effect of ground patterns on FM-band cross-talks between two parallel signal traces of printed circuit boards

Michihira Iida; Tsuyoshi Maeno; Jianqing Wang; Osamu Fujiwara

Electromagnetic disturbances in vehicle-mounted radios are mainly caused by conducted noise currents flowing through wiring-harnesses from vehicle-mounted printed circuit boards (PCBs) with common slitted ground patterns. To investigate suppression of these kinds of noise currents, previous measurements from simple two-layer PCBs with two parallel signal traces with slitted and non-slitted ground patterns, and revealed that making slits with open ends on the ground patterns in parallel with the traces can reduce the conducted noise currents. It was also discovered that the noise currents from PCBs can be suppressed even if the size of the return ground is small. Furthermore, we performed finite-difference time-domain (FDTD) simulations, using eight simple two-layer PCB models in which the ground patterns were split into two parts with different widths and one PCB model with a plane ground pattern, and found that cross-talk decreases with widening the width of the ground pattern and has the smallest values at a specific width. In the present study, to confirm the above findings experimentally, we made actual PCB samples according to exactly the same specification as the models used in the FDTD simulation, and measured the cross-talk between the two parallel signal traces with respect to the different widths of ground patterns. The results approximately agreed with the simulation.


Ieej Transactions on Electronics, Information and Systems | 2011

Size Effect of Ground Patterns on FM-Band Cross-Talks between Two Parallel Signal Traces of Printed Circuit Boards for Vehicles

Michihira Iida; Tsuyoshi Maeno; Jianqing Wang; Osamu Fujiwara


Ieej Transactions on Fundamentals and Materials | 2009

Reduction Characteristics of FM-Band Cross-Talks between Two Parallel Signal Traces on Printed Circuit Boards for Vehicles

Tsuyoshi Maeno; Hiroya Ueyama; Michihira Iida; Osamu Fujiwara


Ieej Transactions on Fundamentals and Materials | 2011

Effect of Ground Patterns Size on FM-Band Cross-Talks between Two Parallel Signal Traces of Printed Circuit Boards for Vehicles

Michihira Iida; Tsuyoshi Maeno; Osamu Fujiwara


Ieej Transactions on Electronics, Information and Systems | 2012

Space Dependence of Divided Ground Patterns on FM-Band Cross-Talk Characteristics between Two Parallel Signal Traces on Printed Circuit Boards for Vehicles

Michihira Iida; Tsuyoshi Maeno; Jianqing Wang; Osamu Fujiwara


Ieej Transactions on Fundamentals and Materials | 2018

A Factor and Prediction Method of the Influence Caused by Absorber-lined Shielded Enclosure on Magnetic Field Measurement

Kazuma Kawai; Seiji Nagakusa; Kazutaka Murasato; Michihira Iida; Katsumi Nakamura


IEEE Transactions on Electromagnetic Compatibility | 2018

Noncontact Measurement Method for High-Frequency Impedance of Load at the End of Wire Harness

Tomohiro Yoshikawa; Jianqing Wang; Yasunori Oguri; Makoto Tanaka; Michihira Iida


international symposium on electromagnetic compatibility | 2017

Usability of absorber-lined shielded environment for low-frequency magnetic field measurement

Kazuma Kawai; Seiji Nagakusa; Kazutaka Murasato; Takashi Naoi; Michihira Iida; Katsumi Nakamura


international symposium on electromagnetic compatibility | 2017

Non-contact measuring method for high-frequency impedance of load at the end of wire harness

Tomohiro Yoshikawa; Jianqing Wang; Yasunori Oguri; Makoto Tanaka; Michihira Iida


SAE International journal of engines | 2017

Non-Contact Measurement Method for High Frequency Impedance of Load at the End of Wire Harness

Makoto Tanaka; Yasunori Oguri; Michihira Iida; Chihiro Yoshikawa; Jianging Wang

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Osamu Fujiwara

Nagoya Institute of Technology

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Jianqing Wang

Nagoya Institute of Technology

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Tomohiro Yoshikawa

Nagoya Institute of Technology

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