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european microwave conference | 2005

220 GHz wafer probe membrane tips and waveguide-to-coax transitions

Richard L. Campbell; Mike Andrews; T. Lesher; C. Wai

We have developed two different styles of thin-film membrane tips for wafer probing to 220 GHz, and a membrane waveguide-to-coax transition. The new tips and waveguide-to-coax transitions are used in a family of ground-signal-ground wafer probes that offer improved measurement repeatability and calibration in the WR-10 through WR-5 waveguide bands. The new membrane waveguide-to-coax transition has been simulated using HFSS and built and measured in the lab. We have obtained good agreement between the measurements and simulations, and the new transition offers improved repeatability in measurements and calibration over our previous waveguide probe transition. Measured S21, S11 and crosstalk results for the new membrane waveguide-to-coax transition are also presented.


Archive | 2007

Probe for combined signals

Leonard Hayden; Scott Rumbaugh; Mike Andrews


Archive | 2003

Probe for testing a device under test

K. Reed Gleason; Tim Lesher; Mike Andrews; John Martin


Archive | 2007

Shielded probe for testing a device under test

K. Reed Gleason; Tim Lesher; Mike Andrews; John Martin


Archive | 2007

Differential signal probe with integral balun

Richard L. Campbell; Eric W. Strid; Mike Andrews


Archive | 2006

Shielded probe for high-frequency testing of a device under test

K. Reed Gleason; Tim Lesher; Eric W. Strid; Mike Andrews; John Martin; John Dunklee; Leonard Hayden; Amr M. E. Safwat


Archive | 2007

Shielded probe with low contact resistance for testing a device under test

K. Reed Gleason; Tim Lesher; Eric W. Strid; Mike Andrews; John Martin; John Dunklee; Leonard Hayden; Amr M. E. Safwat


Archive | 2007

Method of assembling a wafer probe

Leonard Hayden; John Martin; Mike Andrews


Archive | 2002

Waveguide adapter for probe assembly having a detachable bias tee

Mike Andrews; Leonard Hayden; John Martin


Archive | 2007

Sonde différentielle À symétriseur intégré

Richard L. Campbell; Eric W. Strid; Mike Andrews

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