Mohamed Mergoum

Mixed Model Association Mapping for Fusarium Head Blight Resistance in Tunisian-Derived Durum Wheat Populations

Sources of resistance to Fusarium head blight (FHB) in wheat are mostly restricted to Chinese hexaploid genotypes. The effort to incorporate the resistance from hexaploid wheat or wild relatives to cultivated durum wheat (Triticum turgidum L. var. durum Desf.) have not been successful in providing resistance to the level of the donor parents. In this study, we used 171 BC1F6 and 169 BC1F7 lines derived from crossing of four Tunisian tetraploid sources of resistance (Tun7, Tun18, Tun34, Tun36) with durum cultivars ‘Ben,’ ‘Maier,’ ‘Lebsock,’ and ‘Mountrail’ for association studies. The Tun18 and Tun7 FHB resistances were found to be comparable to the best hexaploid wheat sources. A new significant QTL for FHB resistance was identified on the long arm of chromosome 5B (Qfhs.ndsu-5BL) with both association and classical QTL mapping analysis. Linkage disequilibrium (LD) blocks extending up to 40 cM were evident in these populations. The linear mixed model considering the structure (Q or P) and the kinship matrix (KT) estimated by restricted maximum likelihood (REML) was identified as the best for association studies in a mixture of wheat populations from a breeding program. The results of association mapping analysis also demonstrated a region on the short arm of chromosome 3B as potentially linked to FHB resistance. This region is in proximity of major FHB resistance gene fhb1 reported in hexaploid wheat. A possibility of having susceptibility or suppressor of resistance gene(s) on durum wheat chromosome 2A was further confirmed in this material, explaining the problem in developing resistant genotypes without counter selection against this region.

Identification and Molecular Mapping of a Gene Conferring Resistance to Pyrenophora tritici-repentis Race 3 in Tetraploid Wheat

ABSTRACT Race 3 of the fungus Pyrenophora tritici-repentis, causal agent of tan spot, induces differential symptoms in tetraploid and hexaploid wheat, causing necrosis and chlorosis, respectively. This study was conducted to examine the genetic control of resistance to necrosis induced by P. tritici-repentis race 3 and to map resistance genes identified in tetraploid wheat (Triticum turgidum). A mapping population of recombinant inbred lines (RILs) was developed from a cross between the resistant genotype T. tur-gidum no. 283 (PI 352519) and the susceptible durum cv. Coulter. Based on the reactions of the Langdon-T. dicoccoides (LDN[DIC]) disomic substitution lines, chromosomal location of the resistance genes was determined and further molecular mapping of the resistance genes for race 3 was conducted in 80 RILs of the cross T. turgidum no. 283/Coulter. Plants were inoculated at the two-leaf stage and disease reaction was assessed 8 days after inoculation based on lesion type. Disease reaction of the LDN(DIC) lines and molecular mapping on the T. turgidum no. 283/Coulter population indicated that the gene, designated tsn2, conditioning resistance to race 3 is located on the long arm of chromosome 3B. Genetic analysis of the F(2) generation and of the F(4:5) and F(6:7) families indicated that a single recessive gene controlled resistance to necrosis induced by race 3 in the cross studied.

Identification of novel genomic regions associated with resistance to Pyrenophora tritici-repentis races 1 and 5 in spring wheat landraces using association analysis

Tan spot, caused by Pyrenophora tritici-repentis, is a major foliar disease of wheat worldwide. Host plant resistance is the best strategy to manage this disease. Traditionally, bi-parental mapping populations have been used to identify and map quantitative trait loci (QTL) affecting tan spot resistance in wheat. The association mapping (AM) could be an alternative approach to identify QTL based on linkage disequilibrium (LD) within a diverse germplasm set. In this study, we assessed resistance to P. tritici-repentis races 1 and 5 in 567 spring wheat landraces from the USDA-ARS National Small Grains Collection (NSGC). Using 832 diversity array technology (DArT) markers, QTL for resistance to P. tritici-repentis races 1 and 5 were identified. A linear model with principal components suggests that at least seven and three DArT markers were significantly associated with resistance to P. tritici-repentis races 1 and 5, respectively. The DArT markers associated with resistance to race 1 were detected on chromosomes 1D, 2A, 2B, 2D, 4A, 5B, and 7D and explained 1.3–3.1% of the phenotypic variance, while markers associated with resistance to race 5 were distributed on 2D, 6A and 7D, and explained 2.2–5.9% of the phenotypic variance. Some of the genomic regions identified in this study correspond to previously identified loci responsible for resistance to P. tritici-repentis, offering validation for our AM approach. Other regions identified were novel and could possess genes useful for resistance breeding. Some DArT markers associated with resistance to race 1 also were localized in the same regions of wheat chromosomes where QTL for resistance to yellow rust, leaf rust and powdery mildew, have been mapped previously. This study demonstrates that AM can be a useful approach to identify and map novel genomic regions involved in resistance to P. tritici-repentis.

Genetics of wheat–Pyrenophora tritici-repentis interactions

Tan spot, caused by an ascomycete fungus Pyrenophora tritici-repentis, is one of the most devastating foliar diseases of wheat. This fungus induces two distinct symptoms, tan necrosis and extensive chlorosis, on susceptible wheat cultivars. Besides causing average yield losses of 5–10%, tan spot also causes significant losses in grain quality by grain shriveling, red smudge, and black point. Conservation agriculture in combination with wheat monoculture involving cultivation of susceptible cultivars has resulted in frequent onset of tan spot epidemics worldwide. Development of new resistant wheat cultivars, in conjunction with crop rotation, will provide an effective, economical, and environmentally safe means of controlling tan spot. Presently, eight races of P. tritici-repentis have been identified worldwide based on the ability to induce necrosis and chlorosis symptoms on a set of differential wheat cultivars. P. tritici-repentis is a homothallic fungus having both sexual and asexual reproduction resulting in high genetic diversity worldwide. Both quantitative and qualitative mode of inheritance for resistance to tan spot of wheat has been reported. The tan spot fungus produces multiple host-specific toxins and host resistance is highly correlated to insensitivity to toxins. Genetic studies have further confirmed that wheat–P. tritici-repentis follows the toxin model of gene-for-gene hypothesis although other mechanism of host–pathogen interaction may exist and exploitation of all resistance phenomenon is to be adopted to develop durable resistant cultivars.

Genetic Analysis of Resistance to Pyrenophora tritici-repentis Races 1 and 5 in Tetraploid and Hexaploid Wheat

Tan spot of wheat, caused by the fungus Pyrenophora tritici-repentis, is a destructive disease worldwide that can lead to serious losses in quality and quantity of wheat grain production. Resistance to multiple races of P. tritici-repentis was identified in a wide range of genetically diverse genotypes, including three different species Triticum aestivum (AABBDD), T. spelta (AABBDD), and T. turgidum (AABB). The major objectives of this study were to determine the genetic control of resistance to P. tritici-repentis races 1 and 5 in 12 newly identified sources of resistance. The parents, F(1), F(2), and F(2:3) or F(2:5) families of each cross were analyzed for the allelism tests and/or inheritance studies. Plants were inoculated at the two-leaf stage under controlled environmental conditions and disease reaction was assessed based on lesion-type rating scale. A single recessive gene controlled resistance to necrosis caused by P. tritici-repentis race 1 in both tetraploid and hexaploid resistant genotypes. The lack of segregation in the inter- and intra-specific crosses between the resistant tetraploid and hexaploid genotypes indicated that they possess the same genes for resistance to tan necrosis and chlorosis induced by P. tritici-repentis race 1. A single dominant gene for chlorosis in hexaploid wheat and a single recessive gene for necrosis in tetraploid wheat, controlled resistance to P. tritici-repentis race 5.

Effect of pre-harvest sprouting on physicochemical changes of proteins in wheat.

BACKGROUND High moisture before harvest can cause sprouting of the wheat kernel, which is termed pre-harvest sprouting (PHS). The aim of this study was to examine the variation in physicochemical properties of proteins in PHS-damaged (sprouted) hard red and white spring wheat genotypes. Specifically, protein content, enzyme activity and degradation of proteins were evaluated in sound and PHS-damaged wheat. RESULTS Protein contents of sprouted wheat samples were lower than that of non-sprouted samples; however, their differences were not significantly (P > 0.05) correlated with sprouting score. Sodium dodecyl sulfate (SDS) buffer extractable proteins (EXP) and unextractable proteins (UNP) were analyzed by high-performance size exclusion chromatography. PHS damage elevated endoprotease activity and consequently increased the degradation of polymeric UNP and free asparagine concentration in wheat samples. Free asparagine is known to be a precursor for formation of carcinogenic acrylamide during high heat treatment, such as baking bread. Free asparagine content had significant correlations (P < 0.01) with sprouting score, endoprotease activity and protein degradation. CONCLUSIONS Genotypes with higher endoprotease activity tend to exhibit a larger degree of degradation of UNP and higher free asparagine concentration in sprouted wheat samples.

Triticale: A “New” Crop with Old Challenges

Triticale (X Triticosecale), a Man-made cereal grass crop obtained from hybridization of wheat (Triticum spp) with rye (Secale cereale). The hope was that triticale would combine the high yield potential and good grain quality of wheat, and the resistance/tolerance to the biotic and abiotic stresses of rye. Triticale grains can be used for human food and livestock feed. Since the last century, triticale has received significant attention as a potential energy crop. Today, research is currently being conducted includes the use of this crop biomass in bio-energy production. The aim of a triticale breeding programs mainly focuses on the improvement of economic traits such as grain yield, biomass, nutritional factors, plant height, as well as traits such as early maturity and high grain volume weight. Intense breeding and selection have made very rapid genetic improvements in triticale seed quality. The agronomic advantages and improved end-use properties of the triticale grains over wheat achieved by research and development efforts make triticale an attractive option for increasing global food production particularly, for marginal and stress-prone growing conditions. Details of the different breeding approaches utilized to enhance modern triticale cultivars for various uses are discussed in this chapter.

Evaluation of elite wheat germ plasm for resistance to tan spot

Tan spot, caused by Pyrenophora tritici-repentis, is a serious foliar disease of wheat (Triticum aestivum) in North America. Control of tan spot through management practices and fungicide application is possible; however, the use of resistant varieties is the most effective and economical means of controlling tan spot. This study was conducted to determine the disease reaction of 126 elite hard red spring, white, and durum wheat varieties and advanced breeding lines collected from the northern Great Plains of the United States and Canada to individual races/toxins of P. tritici-repentis. Seedling evaluation of the 126 genotypes was done under controlled environmental conditions with virulent races 2, 3, and 5 of P. tritici-repentis and toxins Ptr ToxA and Ptr ToxB. Based on disease reactions, two resistant varieties and two advanced breeding lines adapted to the northern Great Plains were found to be resistant to all the races and insensitive to the toxins tested. Additionally, six genetically diverse lines/varieties were identified to be resistant to tan spot; however, these sources may not be well adapted to the northern Great Plains. These results suggest that the wheat germ plasm contains a broad genetic base for resistance to the most prevalent races of P. tritici-repentis in North America, and the resistant sources identified in this study may be utilized in wheat breeding programs to develop tan spot resistant varieties.

Resistance to multiple leaf spot diseases in wheat

Tan spot (TS), Stagonospora nodorum blotch (SNB), and Septoria tritici blotch (STB) are three major leaf spot diseases of wheat worldwide. Host plant resistance (HPR) is one of the main components in the management of these diseases in wheat. The objective of this study was to identify new sources of resistance to TS (races 1 and 5), SNB, and STB. A total of 164 wheat genotypes developed by the International Maize and Wheat Improvement Center (CIMMYT), Mexico were individually evaluated for TS, SNB and STB in spring and fall of 2006 in the greenhouse. Two experiments were conducted in a randomized complete block design with three replicates. Each replicate consisted of 164 wheat genotypes planted in cones with three seedlings/genotype in each cone and disease reaction was assessed for each race or pathogen at the two- to three-leaf stage. Based on the disease reactions, three wheat genotypes were resistant to both TS and SNB, while 13 genotypes were resistant to TS and STB. Similarly, 13 genotypes were resistant to both SNB and STB. In addition, four wheat genotypes were highly resistant to TS, SNB, and STB. These results suggest that the resistant genotypes identified in this study possess high levels of resistance to multiple leaf spot diseases and could be valuable sources for wheat improvement programs.

Reaction of Elite Wheat Genotypes from the Northern Great Plains of North America to Septoria Diseases

Stagonospora nodorum blotch (SNB), caused by Phaeosphaeria nodorum, and Septoria tritici blotch (STB), caused by Mycosphaerella graminicola, are the main pathogens of the Septoria disease complex of wheat (Triticum aestivum) in North America. This study was conducted to determine the disease reaction of 126 elite hard red spring, white, and durum wheat cultivars and advanced breeding lines collected from the northern Great Plains of the United States and Canada to SNB and STB. Seedlings of the 126 wheat genotypes were evaluated for resistance to SNB and STB under controlled environmental conditions. Moreover, these 126 wheat genotypes also were infiltrated with culture filtrate of P. nodorum isolate Sn2000. Based on disease reactions, three cultivars (McNeal, Dapps, and Oklee) and 12 advanced breeding lines (CA-901-580W, 97SO254-8-1, MN03291, MN03308, WA007925, MT0245, ND756, ND801, ND803, ND808, ND809, and ND811) adapted to the northern Great Plains were found to be resistant to both Septoria diseases and insensitive to the culture filtrate. Additionally, eight genetically diverse lines and cultivars, including two tetraploid wheat genotypes, were identified to be resistant to both Septoria diseases. These results suggest that the wheat genotypes contain a broad genetic base for resistance to the Septoria diseases in the northern Great Plains of the United States and Canada, and the resistant sources identified in this study may be utilized in wheat-breeding programs.