Is this you? Create Your Porfile
Avatar

Nagai Takamitsu

Toshiba

Network

Latest external collaboration on country level. Dive into details by clicking on the dots.

Explore More

Hotspot

Dive into the research topics where Nagai Takamitsu is active.

Explore More

Publication

Featured researches published by Nagai Takamitsu.

Archive | 2000

METHOD AND SYSTEM FOR BOARD INSPECTING

Nagahama Ichirota; Yamazaki Yuichiro; Nagai Takamitsu; Miyoshi Motosuke

Archive | 1994

ELECTROSTATIC LENS AND MANUFACTURE THEREOF

Nagai Takamitsu; Yamazaki Yuichiro; Miyoshi Motosuke

Archive | 2006

Method and system for inspecting substrate

Nagai Takamitsu; Nagahama Ichirota; Yamazaki Yuichiro; Miyoshi Motosuke

Archive | 2004

SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

Nagahama Ichirota; Yamazaki Yuichiro; Nagai Takamitsu; Miyoshi Motosuke

Archive | 2006

Inspecting device using an electron ebam and method for making semiconductor devices with such inspection device

Nakasuji Mamoru; Noji Nobuharu; Satake Tohru; Hatakeyama Masahiro; Kimba Toshifumi; Sobukawa Hirosi; Yoshikawa Shoji; Murakami Takeshi; Watanabe Kenji; Karimata Tsutomu; Oowada Shin; Saito Mutsumi; Yamazaki Yuichiro; Nagai Takamitsu; Nagahama Ichirota

Archive | 2000

BOARD INSPECTION APPARATUS AND BOARD INSPECTION SYSTEM PROVIDED WITH THE SAME AS WELL AS CONTROL METHOD FOR BOARD INSPECTION APPARATUS

Nagahama Ichirota; Yamazaki Yuichiro; Nagai Takamitsu; Miyoshi Motosuke

Archive | 1999

ELECTRON BEAM INSPECTION METHOD AND APPARATUS THEREFOR

Nagai Takamitsu; Yamazaki Yuichiro; Miyoshi Motosuke

Archive | 2002

SUBSTRATE-CHECK SYSTEM AND METHOD FOR CHECKING SUBSTRATE

Nagahama Ichirota; Yamazaki Yuichiro; Nagai Takamitsu; Miyoshi Motosuke

Archive | 2011

INSPECTION DEVICE BY ELECTRON BEAM, INSPECTION METHOD, AND DEVICE MANUFACTURING METHOD USING ITS INSPECTION DEVICE

Yamazaki Yuichiro; Watanabe Kenji; Sofugawa Takuji; Nomichi Shinji; Satake Toru; Yoshikawa Seiji; Karimata Tsutomu; Nakasuji Mamoru; Hatakeyama Masaki; Murakami Takeshi; Nagahama Ichirota; Nagai Takamitsu; Sugihara Kazuyoshi

Archive | 2007

IMAGING DEVICE, DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD AND ELECTRON BEAM INSPECTION DEVICE

Nakasuji Mamoru; Nomichi Shinji; Satake Toru; Hatakeyama Masaki; Kaneuma Toshifumi; Sofugawa Takuji; Yoshikawa Seiji; Murakami Takeshi; Watanabe Kenji; Karimata Tsutomu; Owada Shin; Nishifuji Mutsumi; Yamazaki Yuichiro; Nagai Takamitsu; Nagahama Ichirota

Explore More

Collaboration

Dive into the Nagai Takamitsu's collaboration.

Top Co-Authors
Avatar

Yamazaki Yuichiro

Toshiba

View shared research outputs
Top Co-Authors
Avatar

Miyoshi Motosuke

Toshiba

View shared research outputs
Top Co-Authors
Avatar

Sugihara Kazuyoshi

Toshiba

View shared research outputs
Explore More
Researchain Logo
Decentralizing Knowledge